IP Library › Assignment 024342/0790
Patent Assignment
Reel/Frame 024342/0790

Assignment of Assignor's Interest

Recorded: 2010-05-06 Pages: 6
Assignor
MULTIBEAM SYSTEMS, INC.
Executed: 2010-04-28
Assignee
MULTIBEAM CORPORATION
1900 WYATT DRIVE, SUITE 15, SANTA CLARA, CALIFORNIA, 95054
Covered Properties (20)
Charged Particle Optics with Azimuthally-Varying Third-Order Aberrations for Generation of Shaped Beams
Variable-Ratio Double-Deflection Beam Blanker
Multi-Beam Multi-Column Electron Beam Inspection System
Patent: 6,977,375 →
Application: 09/789,180 →
Publication: US 2002/0015143
Platform Positioning System
Patent: 6,872,958 →
Application: 10/059,048 →
Publication: US 2002/0127050
Image Processing System for Multi-Beam Inspection
Patent: 6,738,506 →
Application: 10/125,054 →
Publication: US 2002/0167487
Detector Optics for Electron Beam Inspection System
Patent: 6,777,675 →
Application: 10/126,943 →
Publication: US 2002/0153483
Multi-Beam Multi-Column Electron Beam Inspection System
Patent: 6,734,428 →
Application: 10/222,759 →
Publication: US 2003/0066963
Flat Panel Display Substrate Testing System
Patent: 7,941,237 →
Application: 10/589,097 →
Publication: US 2008/0232939
Multi-Beam Multi-Column Electron Beam Inspection System
Patent: 6,844,550 →
Application: 10/630,619 →
Detector Optics for Charged Particle Beam Inspection System
Patent: 7,122,795 →
Application: 10/833,949 →
Publication: US 2005/0001165
Multi-Column Charged Particle Optics Assembly
Patent: 6,943,351 →
Application: 10/842,849 →
Publication: US 2005/0001178
Optics for Generation of High Current Density Patterned Charged Particle Beams
Patent: 7,462,848 →
Application: 10/962,049 →
Publication: US 2006/0145097
Dual Detector Optics for Simultaneous Collection of Secondary and Backscattered Electrons
Patent: 7,227,142 →
Application: 11/093,000 →
Publication: US 2006/0054817
Apparatus and Method for Inspection and Testing of Flat Panel Display Substrates
Patent: 7,435,956 →
Application: 11/225,376 →
Publication: US 2006/0145087
Detector Optics for Multiple Electron Beam Test System
Patent: 7,456,402 →
Application: 11/355,256 →
Publication: US 2006/0169899
Charged Particle Optics with Azimuthally-Varying Third-Order Aberrations for Generation of Shaped Beams
Patent: 8,242,457 →
Application: 12/050,035 →
Publication: US 2008/0224063
Variable-Ratio Double-Deflection Beam Blanker
Patent: 7,928,404 →
Application: 12/120,174 →
Publication: US 2009/0206272
Charged Particle Beam Deflection Method with Separate Stage Tracking and Stage Positional Error Signals
Patent: 8,384,048 →
Application: 12/146,331 →
Publication: US 2008/0315112
Electron Beam Lithography Apparatus and Design Method of Patterned Beam-Defining Aperture
Application: 12/209,882 →
Publication: US 2009/0008579
Optics for Generation of High Current Density Patterned Charged Particle Beams
Patent: 7,786,454 →
Application: 12/210,103 →
Publication: US 2009/0057577
Related Assignments (25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 30, 2001
From: YIN, EDWARD M.; BRODIE, ALAN D.; PARKER, NORMAN WILLIAM; TSAI, FRANK CHING-FENG
To: ION DIAGNOSTICS, INC.
Reel/Frame 012367/0357 →
Assignment of Assignor's Interest Oct 30, 2001
From: ION DIAGNOSTIC, INC.
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 012367/0328 →
Assignment of Assignor's Interest May 21, 2002
From: ANDEEN, GERRY B.; LEE, MARTIN E.; PARKER, N. WILLIAM; MILLER, S. DANIEL
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 012927/0704 →
Assignment of Assignor's Interest Jun 20, 2002
From: PARKER, N. WILLIAM; YIN, EDWARD N.; TSAI, FRANK CHING-FENG
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 013028/0956 →
Assignment of Assignor's Interest Jul 18, 2002
From: MILLER, S. DANIEL; PARKER, N. WILLIAM; HOBMANN, STEVEN B.
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 013119/0095 →
Assignment of Assignor's Interest Dec 13, 2002
From: PARKER, N. WILLIAM; MILLER, S. DANIEL
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 013582/0538 →
Assignment of Assignor's Interest May 7, 2004
From: MOTOROLA, INC
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 015360/0718 →
Assignment of Assignor's Interest Sep 7, 2004
From: PARKER, N. WILLIAM
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 015775/0408 →
Assignment of Assignor's Interest Sep 9, 2004
From: PARKER, N. WILLLIAM; MILLER, S. DANIEL; GALANDE, VICTOR A.
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 015787/0279 →
Assignment of Assignor's Interest Dec 7, 2004
From: PARKER, N. WILLIAM
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 016058/0817 →
Assignment of Assignor's Interest Jun 9, 2005
From: PARKER, N. WILLIAM
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 016319/0312 →
Assignment of Assignor's Interest Nov 16, 2005
From: PARKER, N. WILLIAM
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 017026/0965 →
Assignment of Assignor's Interest Mar 27, 2006
From: PARKER, N. WILLIAM; MILLER, S. DANIEL
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 017385/0421 →
Security Agreement Feb 2, 2007
From: FREESCALE SEMICONDUCTOR, INC.; FREESCALE ACQUISITION CORPORATION; FREESCALE ACQUISITION HOLDINGS CORP.; FREESCALE HOLDINGS (BERMUDA) III, LTD.
To: CITIBANK, N.A. AS COLLATERAL AGENT
Reel/Frame 018855/0129 →
Assignment of Assignor's Interest Nov 9, 2007
From: PARKER, N. WILLIAM; MILLER, S. DANIEL; TIRUNEVELI, S. RAVI
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 020106/0602 →
Assignment of Assignor's Interest Apr 17, 2008
From: PARKER, N. WILLIAM
To: MULTIBEAM
Reel/Frame 020830/0057 →
Assignment of Assignor's Interest Jul 17, 2008
From: PARKER, N. WILLIAM
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 021256/0177 →
Assignment of Assignor's Interest Aug 12, 2008
From: WIESNER, JOHN C.
To: MULTIBEAM SYSTEMS, INC.
Reel/Frame 021378/0820 →
Assignment of One-Half Interest Aug 15, 2008
From: MULTIBEAM SYSTEMS, INC.
To: TOKYO ELECTRON LIMITED ('TEL")
Reel/Frame 021398/0135 →
Assignment of Assignor's Interest Sep 22, 2008
From: TAKEYA, KOJI; FUSE, TAKASHI; KOTSUGI, TADASHI; PARKER, N. WILLIAM
To: TOKYO ELECTRON; MULTIBEAM SYSTEMS, INC.
Reel/Frame 021571/0967 →
Assignment of Assignor's Interest Oct 7, 2008
From: TAKEYA, KOJI; FUSE, TAKASHI; KOTSUGI, TADASHI; PARKER, N. WILLIAM
To: TOKYO ELECTRON LIMITED; MULTRIBEAM SYSTEMS, INC.
Reel/Frame 021645/0834 →
Security Agreement May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
Patent Release Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
Patent Release Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
Patent Release Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →