Magnetic random access memory with selective toggle memory cells
View Patent ↗A toggle MTJ is disclosed that has a SAF free layer with two or more magnetic sub-layers having equal magnetic moments but different anisotropies which is achieved by selecting Ni ˜0.8 Fe ˜0.2 for one sub-layer and CoFeB or the like with a uni-axial anisotropy of 10 to 30 Oe for the higher anisotropy sub-layer. When a field is applied at <10° angle from the easy axis, magnetic vectors for the two sub-layers rotate to form different angles from the easy axis. A method is also described for selectively writing to bits along a word line that is orthogonal to bit line segments and avoids the need to “read first”. A bipolar word line pulse with two opposite pulses separated by a no pulse interval is applied in the absence of a bit line pulse to write a “0”. A bit line pulse opposite the second word line pulse writes a “1”.
1. A magnetic random access memory (MRAM) structure having a toggle MTJ cell wherein a synthetic anti-ferromagnetic (SAF) free layer formed adjacent to a tunnel barrier layer is comprised of a stack that has a first or lower magnetic sub-layer that is NiFe/Ru/NiFe contacting the tunnel barrier layer, a coupling layer on the first magnetic sub-layer, and a second or upper magnetic sub-layer on the coupling layer, said magnetic sub-layers have the same magnetic moment which results in a net magnetic moment for the SAF free layer of essentially zero, but the first magnetic sub-layer has a greater anisotropy than the second magnetic sub-layer.
2. The MRAM structure of claim 1 wherein the Ru layer has a thickness of about 8 Angstroms to enable very large anti-ferromagnetic coupling between the NiFe layers.
3. The MRAM structure of claim 1 wherein the first magnetic sub-layer has a uni-axial anisotropy between about 10 and 30 Oersted (Oe).
4. The MRAM structure of claim 1 wherein the second magnetic sub-layer is comprised of a soft magnetic material that is Ni ˜0.8 Fe ˜0.2 and has a uni-axial anisotropy of about 0 to 8 Oe.
5. A magnetic random access memory (MRAM) structure having a toggle MTJ cell wherein a synthetic anti-ferromagnetic (SAF) free layer formed adjacent to a tunnel barrier layer is comprised of a stack of layers comprising:
(a) a first magnetic sub-layer formed on the tunnel barrier layer;
(b) a first coupling layer on the first magnetic sub-layer;
(c) a second magnetic sub-layer formed on the first coupling layer;
(d) a second coupling layer on the second magnetic sub-layer;
(e) a third magnetic sub-layer formed on the second coupling layer;
(f) a third coupling layer on the third magnetic sub-layer; and
(g) a fourth magnetic sub-layer on the third coupling layer wherein said four magnetic sub-layers have equal magnetic moments and the first or fourth magnetic sub-layer has a larger anisotropy than the remaining magnetic sub-layers.
6. The MRAM structure of claim 5 wherein said remaining sub-layers are made of a soft magnetic material that has a uni-axial anisotropy between about 0 and 8 Oe.
7. The MRAM structure of claim 5 wherein the magnetic sub-layer with a larger anisotropy has a uni-axial anisotropy of about 10 to 30 Oe and is made of CoFeB or CoNiFe, or is a multilayer comprised of CoFeB/NiFe, CoNiFe/NiFe, or NiFe/Ru/NiFe, said Ru layer has a thickness of about 8 Angstroms to allow very large anti-ferromagnetic coupling between the NiFe layers.
8. The MRAM structure of claim 5 wherein each adjacent magnetic sub-layers are anti-ferromagnetic coupled, and the first and second magnetic sub-layers are strongly anti-parallel coupled.
9. The MRAM structure of claim 5 wherein the coupling layers are made of Ru, Rh, or Ir and have a thickness of about 8 Angstroms.
10. The MRAM structure of claim 5 wherein the magnetic sub-layers have a thickness between about 15 and 100 Angstroms.