Fiber-based optical alignment system
View Patent ↗A low-cost alignment system suitable for aligning a wafer to a test fixture includes a bundle of optical fibers wherein at least one fiber serves to deliver illumination to the alignment target from an end thereof, and a plurality of receiver fibers, each having ends with a known spatial relationship to the end of the illuminator fiber. The ends of the fiber bundle have a known spatial relationship to the fixture. In some embodiments, the fiber bundle is disposed within the fixture such that there is an unobscured optical path between the wafer and the receiving and illuminating ends of the fibers. In some embodiments, the fiber bundle is coupled to a light source and a light sensor mounted on the fixture. In some embodiments the alignment target is one or more bonding pads disposed on a wafer.
1. A method of aligning a fixture to a substrate, comprising:
a) providing at least one illumination fiber coupled at a first end thereof to a light source, and a plurality of receiver fibers, each receiver fiber coupled, at a respective first end thereof, to a corresponding detector;
b) illuminating at least a first portion of a substrate surface with light from a second end of the at least one illumination fiber;
c) receiving light reflected from the first portion of the substrate surface at the respective second ends of the receiver fibers, and receiving, at the detectors, a light signal from each of a plurality of receiver fibers;
d) determining an amplitude of the light signal from each of the plurality of receiver fibers;
e) changing, if the determination of (d) is that the amplitude of the light signal from each of the plurality of receiver fibers is substantially equal and above a predetermined threshold, the x-y-theta position of the at least one illumination fiber and the plurality of receiver fibers, relative to the substrate, by a predetermined amount;
f) illuminating at least a portion of a second portion of the substrate surface with light from the second end of the at least one illumination fiber;
g) receiving light reflected from the second portion of the substrate surface at the respective second ends of the receiver fibers, and receiving, at the detectors, a light signal from each of a plurality of receiver fibers;
h) determining an amplitude of the light signal from each of the plurality of receiver fibers; and
i) changing, if the determination of (h) is that the amplitude of the light signal from each of the plurality of receiver fibers is not substantially equal, the x-y-theta position of the at least one illumination fiber and the plurality of receiver fibers, relative to the substrate, back to its position prior to the change of step (e);
wherein the substrate includes a field area and at least one target structure.
2. The method of claim 1 wherein the light source and detectors are disposed on a wafer translator; and the substrate is a semiconductor wafer.
3. The method of claim 2 , wherein the field area has a higher reflectivity than the at least one target structure.
4. The method of claim 2 , wherein the at least one target structure has a higher reflectivity than the field area.
5. A method of aligning a fixture to a substrate, comprising:
a) providing at least one illumination fiber coupled at a first end thereof to a light source, and a plurality of receiver fibers, each receiver fiber coupled, at a respective first end thereof, to a corresponding detector;
b) illuminating at least a first portion of a substrate surface with light from a second end of the at least one illumination fiber;
c) receiving light reflected from the first portion of the substrate surface at the respective second ends of the receiver fibers, and receiving, at the detectors, a light signal from each of a plurality of receiver fibers;
d) determining an amplitude of the light signal from each of the plurality of receiver fibers; and
e) generating, if the determination of (d) is that the amplitude of the reflected light returned by the receiver fibers is below a predetermined range, a signal indicating that insufficient reflected light is available to reliably perform an alignment operation.
6. The method of claim 5 , wherein the substrate includes a field area and at least one target structure, and the field area has a higher reflectivity than the at least one target structure.
7. The method of claim 5 , wherein the substrate includes a field area and at least one target structure, and the at least one target structure has a higher reflectivity than the field area.