IP Library Granted Patent US 8,667,675
Granted Patent B2
US 8,667,675 · App. 12/190,551 · Granted Mar 11, 2014

Simultaneous and selective partitioning of via structures using plating resist

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Quick Facts
Patent No.
US 8,667,675
App. No.
12/190,551
Granted
Mar 11, 2014
Kind
B2
Abstract

Systems and methods for simultaneously partitioning a plurality of via structures into electrically isolated portions by using plating resist within a PCB stackup are disclosed. Such via structures are made by selectively depositing plating resist in one or more locations in a sub-composite structure. A plurality of sub-composite structures with plating resist deposited in varying locations are laminated to form a PCB stackup of a desired PCB design. Through-holes are drilled through the PCB stackup through conductive layers, dielectric layers and through the plating resist. Thus, the PCB panel has multiple through-holes that can then be plated simultaneously by placing the PCB panel into a seed bath, followed by immersion in an electroless copper bath. Such partitioned vias increase wiring density and limit stub formation in via structures. Such partitioned vias allow a plurality of electrical signals to traverse each electrically isolated portion without interference from each other.

Claims (39)

1. A method of partitioning via structures, the method comprising:

forming at least one sub-composite structure, the at least one sub-composite structure having a dielectric layer located between a first conductive layer and a second conductive layer;

forming at least one clearance within the dielectric layer and at least one of the first conductive layer and the second conductive layer of the at least one sub-composite structure;

depositing plating resist in said at least one clearance; and

drilling a through-hole through the at least one sub-composite structure passing through the plating resist; and

plating an interior surface of the through-hole with a conductive material in areas that are devoid of the plating resist to form a partitioned via structure.

2. The method of claim 1 , further comprising:

laminating said at least one sub-composite structure to a multilayer printed circuit board stackup.

3. The method of claim 1 , wherein said plating resist comprises an insulating hydrophobic resinous material that is resistant to a deposition of a catalytic species capable of catalyzing an electroless metal deposition and wherein said insulating hydrophobic resinous material is used alone or in a combined composition with other resinous materials in amounts sufficient to maintain hydrophobic properties in said combined composition.

4. The method of claim 1 , wherein said plating resist comprises a paste or viscous liquid.

5. The method of claim 2 , where said partitioned via structure is filled with a voltage switchable dielectric material which switches between an insulated material and a conductive material for providing programmable circuit routing for signaling in the multilayer printed circuit board when a voltage increases beyond a predetermined threshold.

6. The method of claim 2 , where the dielectric layer is one or more of: FR-4, epoxy glass, polyimide glass, ceramic hydrocarbon, polyimide film, resin impregnated woven glass, Teflon film, resin impregnated matte material, Kevlar, paper, resin dielectrics with dispersed nano-powders.

7. The method of claim 1 , further comprising using a computer program to determine locations for selectively depositing said plating resist, and for generating information for use by one or more of a printed circuit board design layout program and a computer aided manufacturing system for selectively depositing said plating resist and for routing circuit traces through said partitioned via structures.

8. The method of claim 1 , further comprising depositing said plating resist at locations for backdrilling in pre-existing printed circuit board designs that include backdrilling of via structures.

9. The method of claim 5 , further comprising depositing said plating resist at locations separating two or more separate printed circuit board subassemblies during sequential processing.

10. The method of claim 5 , wherein the voltage switchable dielectric material extends from a first segment to a second segment, the first segment electrically isolated from the second segment and the voltage switchable dielectric material.

11. The method of claim 1 , wherein the at least one clearance is formed by drilling a blind hole, wherein the blind hold starts at the first conductive layer, proceeds through the dielectric layer and terminates on the second conductive layer of the sub-composite structure.

12. A method of partitioning via structures, the method comprising:

forming at least one sub-composite structure, the at least one sub-composite structure having a dielectric layer located between a first conductive layer and a second conductive layer;

forming at least one clearance within the dielectric layer and at least one of the first conductive layer and the second conductive layer of the at least one sub-composite structure;

laminating the at least one sub-composite structure to a multilayer printed circuit board stackup;

depositing plating resist in the at least one clearance;

drilling a through-hole through the multilayer printed circuit board stackup passing through each area of the plating resist; and

processing the printed circuit board stackup for plating an interior surface of each through-hole with a conductive material in areas that are devoid of the plating resist to form corresponding partitioned via structures through the multilayer printed circuit board stackup;

where the partitioned via structure is filled with a voltage switchable dielectric material which switches between an insulated material and a conductive material for providing programmable circuit routing for signaling in the multilayer printed circuit board when a voltage increases beyond a predetermined threshold.

13. The method of claim 12 , wherein the voltage switchable dielectric material extends from a first segment to a second segment, the first segment electrically isolated from the second segment and the voltage switchable dielectric material.

14. A method of partitioning via structures, the method comprising:

forming at least one sub-composite structure, the at least one sub-composite structure having a dielectric layer located between a first conductive layer and a second conductive layer;

drilling at least one blind hole through the dielectric layer and at least the first conductive layer and the second conductive layer of the at least one sub-composite structure; and

selectively depositing plating resist in the at least one blind hole;

drilling a through-hole through the least one sub-composite structure passing through the plating resist;

plating an interior surface of the through-hole with a conductive material in areas that are devoid of the plating resist to form a partitioned via structure.

15. The method of claim 14 , further comprising:

laminating the at least one sub-composite structure to a multilayer printed circuit board stackup.

16. The method of claim 14 , wherein the partitioned via structure is filled with a voltage switchable dielectric material which switches between an insulated material and a conductive material for providing programmable circuit routing for signaling in the multilayer printed circuit board when a voltage increases beyond a predetermined threshold.

17. The method of claim 16 , wherein the voltage switchable dielectric material extends from a first segment to a second segment, the first segment electrically isolated from the second segment and the voltage switchable dielectric material.

18. The method of claim 1 , wherein the at least one clearance has a radius greater than the partitioned via structures.

19. The method of claim 1 , wherein the plating resist extends through the dielectric layer and at least one of the first conductive layer and the second conductive layer.

20. The method of claim 2 , wherein a width of the plating resist is greater than a width of the through-hole.

Assignments (4)
SECURITY INTEREST Recorded Oct 28, 2025
From: SANMINA CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 073363/0212 →
RELEASE OF SECURITY INTEREST Recorded Jun 5, 2019
From: U.S. BANK NATIONAL ASSOCIATION, SOLELY AS NOTES COLLATERAL AGENT
To: SANMINA CORPORATION; HADCO CORPORATION; HADCO SANTA CLARA; SCI TECHNOLOGY; SENSORWISE, INC.
Reel/Frame 049378/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2016
From: DUDNIKOV, GEORGE, JR.
To: SANMINA-SCI CORPORATION
Reel/Frame 038924/0761 →
SECURITY INTEREST Recorded Jun 5, 2014
From: SANMINA CORPORATION, AS GRANTOR; SANMINA CORPORATION, F/K/A SANMINA-SCI CORPORATION, AS GRANTOR; HADCO SANTA CLARA, INC., AS GRANTOR; SCI TECHNOLOGY, INC., AS GRANTOR
To: US BANK NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 033094/0826 →