IP Library Granted Patent US 7,971,169
Granted Patent B1
US 7,971,169 · App. 12/190,784 · Granted Jun 28, 2011

System and method for reducing the generation of inconsequential violations resulting from timing analyses

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Quick Facts
Patent No.
US 7,971,169
App. No.
12/190,784
Granted
Jun 28, 2011
Kind
B1
Abstract

A system for, and method of, reducing the generation of inconsequential violations resulting from timing analyses and an electronic design automation (EDA) tool incorporating the system or the method. In one embodiment, the system includes: (1) a timing violation identifier configured to identify at least some timing violations in a circuit based on a timing analysis, (2) an unsensitizable path identifier configured to identify at least some unsensitizable paths in the circuit and (3) a repair list generator coupled to the timing violation identifier and the unsensitizable path identifier and configured to generate a repair list based on both the at least some timing violations and the at least some unsensitizable paths.

Claims (44)

1. A system for reducing the generation of inconsequential violations resulting from timing analyses, comprising:

an unsensitizable path identifier configured to identify at least some unsensitizable paths in a circuit before other steps;

a parasitic parameter extraction tool configured to extract parasitic parameters in said circuit in a second step;

a timing violation identifier configured to identify at least some timing violations in said circuit based on a timing analysis in a third step, wherein said timing analysis uses said extracted parasitic parameters; and

a repair list generator coupled to said timing violation identifier and said unsensitizable path identifier and configured to generate a repair list based on both said at least some timing violations and said at least some unsensitizable paths.

2. The system as recited in claim 1 wherein said timing analysis includes at least one selected from the group consisting of:

a static timing analysis, and

a statistical timing analysis.

3. The system as recited in claim 1 wherein said unsensitizable path identifier is configured to identify said unsensitizable paths based on sensitizable paths identified in said circuit.

4. The system as recited in claim 1 wherein said repair list contains a reduced number of timing violations attributable to unsensitizable paths in said circuit.

5. The system as recited in claim 1 wherein a netlist describing said circuit is employed as a common source of information for both said timing analysis and an identification of sensitizable paths in said circuit.

6. The system as recited in claim 1 wherein said timing analysis is based on extracted parasitic parameters and said at least some unsensitizable paths are based on output from a logic simulator tool.

7. The system as recited in claim 1 wherein said circuit is an integrated circuit.

8. The system as recited in claim 1 wherein said timing violation identifier, said an unsensitizable path identifier and said repair list generator are embodied in program code stored on a non-transitory computer-readable medium.

9. A method of reducing the generation of inconsequential violations resulting from timing analyses, comprising:

identifying at least some unsensitizable paths in a circuit before other steps;

extracting parasitic parameters from said circuit in a second step;

identifying at least some timing violations in said circuit based on a timing analysis in a third step, wherein said timing analysis uses said extracted parasitic parameters; and

generating a repair list based on both said at least some timing violations and said at least some unsensitizable paths, wherein said steps are performed by a processor.

10. The method as recited in claim 9 wherein said timing analysis is carried out by carrying out at least one selected from the group consisting of:

a static timing analysis, and

a statistical timing analysis.

11. The method as recited in claim 9 wherein said identifying said at least some unsensitizable paths comprises identifying said unsensitizable paths based on sensitizable paths identified in said circuit.

12. The method as recited in claim 9 wherein said repair list contains a reduced number of timing violations attributable to unsensitizable paths in said circuit.

13. The method as recited in claim 9 further comprising employing a netlist describing said circuit as a common source of information for both said timing analysis and an identification of sensitizable paths in said circuit.

14. The method as recited in claim 9 further comprising:

basing said timing analysis on extracted parasitic parameters; and

basing said at least some unsensitizable paths on output from a logic simulator tool.

15. The method as recited in claim 9 wherein said circuit is an integrated circuit.

16. An electronic design automation tool, comprising:

a parasitic parameter extraction tool configured to extract parasitic parameters associated with a circuit;

a timing analysis tool configured to perform a timing analysis based on said parasitic parameters;

a logic simulator tool configured to simulate logic in said circuit;

and

a system for reducing the generation of inconsequential violations resulting from timing analyses, including:

an unsensitizable path identifier configured to identify at least some unsensitizable paths in a circuit based on said sensitizable paths before other steps,

a timing violation identifier configured to identify at least some timing violations in said circuit based on said timing analysis in a next step, wherein said timing analysis uses said extracted parasitic parameters, and

a repair list generator coupled to said timing violation identifier and said unsensitizable path identifier and configured to generate a repair list based on both said at least some timing violations and said at least some unsensitizable paths.

17. The tool as recited in claim 16 wherein said timing analysis tool is selected from the group consisting of:

a static timing analysis tool, and

a statistical timing analysis tool.

18. The tool as recited in claim 16 wherein said repair list contains a reduced number of timing violations attributable to unsensitizable paths in said circuit.

19. The tool as recited in claim 16 wherein a netlist describing said circuit is employed as a common source of information for both said parasitic parameter extraction tool and said logic simulator tool.

20. The tool as recited in claim 16 wherein said circuit is an integrated circuit.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 059720/0223 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044887/0109 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 13, 2008
From: TETELBAUM, ALEXANDER; CHAKRAVARTY, SREEJIT; CALLEGARI, NICHOLAS A.
To: LSI CORPORATION
Reel/Frame 021384/0817 →