IP Library Granted Patent US 7,940,059
Granted Patent B2
US 7,940,059 · App. 12/198,104 · Granted May 10, 2011

Method for testing H-bridge

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Quick Facts
Patent No.
US 7,940,059
App. No.
12/198,104
Granted
May 10, 2011
Kind
B2
Abstract

A method for measuring an on resistance in an H-bridge including first and second transistors connected to a first output terminal, third and fourth transistors connected to a second output terminal, and a measurement switch connected to the first and second output terminals. The first and third transistors are connected to a first power supply terminal. The second and fourth transistors are connected to a second power supply terminal. The method includes supplying the first transistor with measurement current during a first period, measuring a first voltage at the first power supply terminal via the third transistor using the second output terminal during the first period, measuring a second voltage at the first output terminal via the measurement switch using the second output terminal during the first period, and determining the on resistance of the first transistor based on the measurement current, first voltage, and second voltage.

Claims (28)

1. A method for measuring an on resistance in an H-bridge including first and second transistors connected to a first output terminal, third and fourth transistors connected to a second output terminal, and a measurement switch connected between the first and second output terminals, in which the first and third transistors are connected to a first power supply terminal, and the second and fourth transistors are connected to a second power supply terminal, the method comprising:

supplying the first transistor with measurement current during a first period;

measuring a first voltage at the first power supply terminal via the third transistor using the second output terminal during the first period;

measuring a second voltage at the first output terminal via the measurement switch using the second output terminal during the first period; and

determining the on resistance of the first transistor based on the measurement current, the first voltage, and the second voltage.

2. The method for measuring an on resistance in an H-bridge of claim 1 , further comprising:

connecting a voltmeter between the second output terminal and the second power supply terminal to measure the first voltage and second voltage with the voltmeter.

3. The method for measuring an on resistance in an H-bridge of claim 1 , further comprising:

supplying the second transistor with the measurement current during a second period;

measuring a third voltage at the first power supply terminal via the fourth transistor using the second output terminal during the second period;

measuring a fourth voltage at the first output terminal via the measurement switch using the second output terminal during the second period; and

determining the on resistance of the second transistor based on the measurement current, the third voltage, and the fourth voltage.

4. The method for measuring an on resistance in an H-bridge of claim 3 , further comprising:

connecting a voltmeter between the second output terminal and the second power supply terminal to measure the first voltage, second voltage, third voltage, and fourth voltage with the voltmeter.

5. The method for measuring an on resistance in an H-bridge of claim 1 , further comprising:

supplying the third transistor with the measurement current during a third period;

measuring a fifth voltage at the first power supply terminal via the first transistor using the first output terminal during the third period;

measuring a sixth voltage at the second output terminal via the measurement switch using the first output terminal during the third period; and

determining the on resistance of the third transistor based on the measurement current, the fifth voltage, and the sixth voltage.

6. The method for measuring an on resistance in an H-bridge of claim 5 , further comprising:

connecting a voltmeter between the first output terminal and the second power supply terminal to measure the fifth voltage and sixth voltage with the voltmeter.

7. The method for measuring an on resistance in an H-bridge of claim 1 , further comprising:

supplying the fourth transistor with the measurement current during a fourth period;

measuring a seventh voltage at the second power supply terminal via the second transistor using the first output terminal during the fourth period;

measuring an eighth voltage at the second output terminal via the measurement switch using the first output terminal during the fourth period; and

determining the on resistance of the fourth transistor based on the measurement current, the seventh voltage, and the eighth voltage.

8. The method for measuring an on resistance in an H-bridge of claim 7 , further comprising:

connecting a voltmeter between the first output terminal and the second power supply terminal to measure the seventh voltage and eighth voltage with the voltmeter.

Assignments (29)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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PATENT RELEASE Recorded Dec 21, 2015
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PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
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SECURITY AGREEMENT Recorded Dec 9, 2008
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CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY DATA PREVIOUSLY RECORDED ON REEL 021438 FRAME 0010. ASSIGNOR(S) HEREBY CONFIRMS THE NAME FROM FREESCALE SEMICONDUCTOR, INC. TO AKIHIRO TAKAHASHI AND HIDETAKA FUKAZAWA, EXECUTION DATE FROM 2008/08/25 TO 2008/08/21. Recorded Sep 24, 2008
From: TAKAHASHI, AKIHIRO; FUKAZAWA, HIDETAKA
To: FREESCALE SEMICONDUCTOR, INC.
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