IP Library Granted Patent US 8,116,618
Granted Patent B2
US 8,116,618 · App. 12/213,823 · Granted Feb 14, 2012

Heating apparatus, substrate processing apparatus, and method of manufacturing semiconductor devices

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Quick Facts
Patent No.
US 8,116,618
App. No.
12/213,823
Granted
Feb 14, 2012
Kind
B2
Abstract

A heating apparatus comprises a wall for surrounding and defining a heating space, a heating element mounted on the inner side of the wall, reflecting members for reflecting the heat emitted from the heating element. Also, a moving unit joined to one end of each of the reflecting members for moving the reflecting members. Moreover, pivotal members joined to the reflecting members beside more their respective other side than one side of the reflecting members for controlling as pivots the movement of the reflecting member driven by the moving unit.

Claims (55)

1. A heating apparatus comprising:

a wall for surrounding and defining a heating space;

a heating element mounted on the inner side of the wall;

reflecting members for reflecting the heat emitted from the heating element;

a moving unit joined to one end of each of the reflecting members for moving the reflecting members; and

pivotal members joined to the reflecting members for controlling as pivots the movement of the reflecting member driven by the moving unit, wherein

the reflecting members are arranged in an annular form while the moving unit is joined to the reflecting members at the center of the annular form, and the movement of the reflecting member by the function of the pivotal members as pivots can be controlled by the action of the moving unit.

2. A heating apparatus according to claim 1 , wherein

the reflecting members are arranged at intervals of a gap.

3. A heating apparatus according to claim 1 , wherein

the reflecting members are configured of a triangular shape of which the proximal end stays at the center of the annular form.

4. A heating apparatus according to claim 2 , wherein

the reflecting members are arranged substantially at equal intervals along the circumferential direction.

5. A heating apparatus according to claim 1 , wherein

the wall comprises at least a tubular side wall and a ceiling wall disposed at the upper end of the side wall and the heating element is held by the side wall while the moving unit is held by the ceiling wall.

6. A heating apparatus according to claim 5 , wherein

the ceiling wall has an opening provided therein to communicate with an exhaust opening for exhausting the heating space and a gap between the reflecting members is sized smaller than the diameter of the opening.

7. A heating apparatus comprising:

a wall for surrounding and defining a heating space;

a heating element mounted on the inner side of the wall;

reflecting members for reflecting the heat emitted from the heating element;

a moving unit joined to one end of each of the reflecting members for moving the reflecting members; and

pivotal members joined to the reflecting members for controlling as pivots the movement of the reflecting member driven by the moving unit, wherein

the reflecting members are arranged at intervals of a gap,

the reflecting members are arranged substantially at equal intervals along the circumferential direction,

the wall has an exhaust opening provided therein for exhausting the heating space and arranged to communicate with apertures provided along the circumferential direction about the center of the moving unit, the reflecting members are configured of a triangular shape as arranged in an annular form at intervals of the gap with their proximal ends disposed at the center of the annular form, and at least one of the gaps between the reflecting members is sized smaller than the diameter of the opening.

8. A heating apparatus according to claim 1 , further comprising:

a moving mechanism for driving the moving unit to move the reflecting members and change the angle of the reflecting surfaces of the reflecting members by acting the pivotal members as pivots to the heating element for controlling the reflection of the heat.

9. A heating apparatus according to claim 1 , wherein

the reflecting members are shaped into an arch to extend from the center of the heating space to the close-to-end of the heating space.

10. A heating apparatus according to claim 6 comprising:

a wall for surrounding and defining a heating space;

a heating element mounted on the inner side of the wall;

reflecting members for reflecting the heat emitted from the heating element;

a moving unit joined to one end of each of the reflecting members for moving the reflecting members; and

pivotal members joined to the reflecting members for controlling as pivots the movement of the reflecting member driven by the moving unit, wherein

the wall comprises at least a tubular side wall and a ceiling wall disposed at the upper end of the side wall and the heating element is held by the side wall while the moving unit is held by the ceiling wall and

the reflecting members extend from the axial center to the vertical end of the side wall, perpendicular to the circumferential direction, at which the heating element is held.

11. A heating apparatus comprising:

a wall for surrounding and defining a heating space;

a heating element mounted on the inner side of the wall;

reflecting members for reflecting the heat emitted from the heating element;

a moving unit joined to one end of each of the reflecting members for moving the reflecting members; and

pivotal members joined to the reflecting members for controlling as pivots the movement of the reflecting member driven by the moving unit, wherein

the wall comprises at least a tubular side wall and a ceiling wall disposed at the upper end of the side wall and the heating element is held by the side wall while the moving unit is held by the ceiling wall and

the reflecting members are bulged towards the ceiling wall side.

12. A substrate processing apparatus comprising:

a reactor container disposed in the heating space of the heating apparatus defined in claim 1 for processing a substrate internally

a control unit for, when a difference in the temperature or the layer thickness between the outer and a center edge of the substrate is greater than a reference value, driving the moving unit.

13. A substrate processing apparatus comprising:

a reactor container disposed in the heating space of the heating apparatus defined in claim 1 for processing a substrate internally

a control unit for calculating a difference in the temperature between the outer and the center edge of the substrate from the measurements of a first temperature detector for measuring the temperature at the outer edge of the substrate in the reactor container and a second temperature detector for measuring the temperature at the center of the substrate in the reactor container and, when the difference is greater than a reference value, driving the moving unit.

14. A substrate processing apparatus comprising:

a reactor container disposed in the heating space of the heating apparatus defined in claim 1 for processing a substrate internally, wherein

the reflecting members are configured of an arcuate shape enough to extend from the center to the outer edge of the substrate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2018
From: HITACHI KOKUSAI ELECTRIC INC.
To: KOKUSAI ELECTRIC CORPORATION
Reel/Frame 048008/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2008
From: HAYASHIDA, AKIRA; UENO, MASAAKI; SHIMADA, MASAKAZU; SUGISHITA, MASASHI; MIYATA, TOSHIMITSU; KITAMURA, KIMIO; TANAKA, KENJI; NISHIHARA, JYUNICHI
To: HITACHI KOKUSAI ELECTRIC INC.; TEITOKUSHA CO., LTD.
Reel/Frame 021592/0539 →