Granted Patent B2

US 7,787,319 · App. 12/218,895 · Granted Aug 31, 2010

Abstract

Claims (32)

1. An integrated circuit device comprising:

a memory cell array having a plurality of memory cells;

sense amplifier circuitry, coupled to the memory cell array, to sense a data state stored in a memory cell wherein the memory cell is one of the plurality of the memory cells in the memory cell array, the sense amplifier circuitry including:

first and second capacitors, each capacitor having first and second terminals;

a first input electrically coupled to (i) the memory cell to receive a signal which is representative of the data state stored in the memory cell and (ii) the first terminal of the first capacitor;

a second input electrically coupled to (i) a first predetermined voltage and (ii) the first terminal of the second capacitor;

a first current source having first and second terminals;

a first transistor having a gate, a first region and a second region, wherein:

the gate is electrically coupled to the second terminals of the first and second capacitors, and

the first region is electrically coupled to the first terminal of the first current source; and

wherein, during a sense phase of operation of the sense amplifier circuitry, the sense amplifier circuitry senses the data state stored in the memory cell based on the signal which is representative of the data state stored in the memory cell.

2. The integrated circuit device of claim 1 wherein the transistor is a p-channel type transistor or n-channel type transistor.

3. The integrated circuit device of claim 1 wherein a trip voltage of the sense amplifier circuitry is correlated to a ratio of the capacitances of the first and second capacitors.

4. The integrated circuit device of claim 1 wherein the sense amplifier circuitry further includes:

first selection circuit, disposed between the first input and the memory cell array, to electrically couple the memory cell to the first input during the sense phase of operation of the sense amplifier circuitry; and

second selection circuit, disposed between the second input and the first predetermined voltage, to responsively couple the first predetermined voltage to the second input during the sense phase of operation.

5. The integrated circuit device of claim 4 wherein the second selection circuit, during a precharge phase of operation of the sense amplifier circuitry, electrically couples a second predetermined voltage to the second input.

6. The integrated circuit device of claim 5 wherein a trip voltage of the sense amplifier circuitry is correlated to a ratio of the capacitances of the first and second capacitors multiplied by the amplitude of the second predetermined voltage.

7. The integrated circuit device of claim 5 wherein the first selection circuit, during the precharge phase of operation of the sense amplifier circuitry, electrically couples a third predetermined voltage to the first input.

8. The integrated circuit device of claim 1 wherein the sense amplifier circuitry further includes a feedback switch to electrically couple the gate of the first transistor to, or decouple the gate of the first transistor from the first region of the transistor wherein during the sense phase of operation, the feedback switch electrically decouples the gate of the first transistor from the first region of the first transistor.

9. The integrated circuit device of claim 8 wherein during a precharge phase of operation of the sense amplifier circuitry, the feedback switch electrically couples the gate of the first transistor from the first region of the first transistor.

10. The integrated circuit device of claim 1 wherein the sense amplifier circuitry further includes:

a second current source having first and second terminals;

a second transistor having a gate, a first region and a second region, wherein:

the gate of the second transistor is coupled to the first region of the first transistor, and

the first region of the second transistor is electrically coupled to the first terminal of the second current source; and

wherein, during a sense phase of operation of the sense amplifier circuitry, the sense amplifier circuitry outputs a signal which is representative of the data state stored in the memory cell using the signal which is representative of the data state stored in the memory cell.

11. The integrated circuit device of claim 1 wherein the sense amplifier circuitry further includes an enable transistor, coupled to the first and/or second inputs of the sense amplifier circuitry, to responsively enable the sense amplifier circuitry to, or disable the sense amplifier circuitry from sensing the data state stored in the memory cell.

12. The integrated circuit device of claim 1 wherein the enable transistor is capacitively coupled to the first and/or second inputs of the sense amplifier circuitry.

13. The integrated circuit device of claim 1 wherein the memory cell includes an electrically floating body transistor and wherein the data state of the memory cell is stored in a body region of the electrically floating body transistor.

14. The integrated circuit device of claim 13 wherein the memory cell includes an electrically floating body transistor and wherein the amplitude of the signal which is representative of the data state stored in the memory cell is responsive to the amount of current conducted by the electrically floating body transistor of the memory cell during the sense phase of operation of the sense amplifier circuitry.

15. The integrated circuit device of claim 1 wherein the sense amplifier circuitry further includes a bit line input coupler circuit, disposed between the first input and the memory cell array, to electrically and indirectly couple the memory cell to the first input during the sense phase of operation of the sense amplifier circuitry.

Assignments (9)