Debris protection system having a magnetic field for an EUV light source

1. A device comprising:

a vessel;

a near normal incidence EUV reflective optic defining an axis and disposed in said vessel, said optic having a focal point on said axis and near an irradiation region in said vessel;

a trap disposed in the vessel, said trap having a plurality of spaced apart vanes, each of the vanes having a surface extending in the direction of said axis and radially; and

a source of a magnetic field disposed in said vessel for deflecting debris in said vessel to protect said optic, said magnetic field being substantially axially symmetric about said axis, said source positioned to interpose the optic between the source and the irradiation region and

a magnetic field shaping element disposed in said vessel and configured to curve said magnetic field to make said magnetic field proximate said surface of each of the vanes along the surface and approximately normal to the direction of ion paths from said irradiation region.

2. A device as recited in claim 1 wherein said magnetic field source comprises a widening spiral coil substantially conforming to the shape of the reflective optic and a current source passing electrical current through the coil.

3. A device as recited in claim 2 wherein said magnetic field source further comprises a return yoke.

4. A device as recited in claim 1 wherein said near normal incidence EUV reflective optic has a reflective surface shaped as a portion of a prolate spheroid.

5. A device as recited in claim 1 further comprising a flowing buffer gas at a gas number density, n, between the plasma and optic, the gas number density, n, being sufficient to combine with the trap and magnetic field to protect said optic from substantially all plasma emitted ions.

6. A device comprising;

a vessel;

a near normal incidence EUV reflective optic, the optic symmetric about an axis, disposed in said vessel and producing a cone of reflected EUV light directed toward an intermediate region; and

magnetic field source means for deflecting debris in said vessel to protect said optic, said source means comprising a plurality of elongated magnets positioned adjacent to an irradiation site within said vessel and extending substantially normal to the axis, and a magnet positioned adjacent to the reflective optic.

7. A device as recited in claim 6 wherein said plurality of magnets comprises a first magnet having a first magnetization direction and a second magnet having a second magnetization direction, the first and second magnets aligned with the first magnetization direction substantially parallel to the second magnetization direction.

8. A device as recited in claim 7 wherein said first and second magnets are permanent magnets.

9. A device as recited in claim 7 wherein said first magnet is coupled to said second magnet by a yoke.

10. A device as recited in claim 7 wherein said magnet positioned adjacent to the reflective optic has a third magnetization direction and said third magnetization direction is substantially normal to said first magnetization direction.

11. A device as recited in claim 6 wherein said plurality of magnets comprises a first magnet having a first magnetization direction and a second magnet having a second magnetization direction, the first and second magnets aligned with the first magnetization direction substantially anti-parallel to the second magnetization direction.

12. A device as recited in claim 11 wherein said first and second magnets are permanent magnets with said first magnet coupled to said second magnet by a yoke.

13. A device as recited in claim 11 wherein said magnet positioned adjacent to the reflective optic has a third magnetization direction and said third magnetization direction is substantially normal to said first magnetization direction.

14. A device as recited in claim 6 further comprising a flowing buffer gas at a gas number density, n, between the plasma and optic, the gas number density, n, being sufficient to combine with the magnetic field to protect said optic from substantially all plasma emitted ions.

15. A device comprising:

a vessel;

a near normal incidence EUV reflective optic disposed in said vessel, said optic having a focal point substantially coinciding with an irradiation region within said vessel;

a gas flow system in fluid communication with said vessel and configured to introduce a buffer gas into and exhaust said buffer gas from said vessel, said gas flow system also configured to reduce initial energies of ions generated at said focal point by more than three-quarters to produce reduced energy ions by controlling flow of said buffer gas between said optic and said focal point; and

a source of a magnetic field disposed in said vessel for deflecting said reduced energy ions.

16. A device as recited in claim 15 wherein said gas comprises hydrogen at a number density equivalent to a pressure at room temperature greater than 0.1 Torr.

17. A device as recited in claim 15 wherein said gas flows at a gas flow rate greater than 100 sccm.

18. A device as recited in claim 6 wherein the near normal incidence EUV reflective optic has an optic surface and said magnet positioned adjacent to the reflective optic is shaped to conform to the optic's surface.

19. A device as recited in claim 6 wherein said magnet positioned adjacent to the reflective optic extends from an edge of said optic to an opposing edge of said optic.

20. A device as recited in claim 6 wherein said plurality of electromagnets comprises a first magnet having a first magnetization direction and a second magnet having a second magnetization direction, and wherein said plurality of elongated magnets extends substantially normal to said first and second magnetization directions.

21. A process comprising:

producing EUV light within a vessel by creating a plasma at a plasma site within said vessel, the plasma generating ions;

focusing said EUV light using a near normal incidence EUV reflective optic defining an axis and disposed in said vessel;

trapping said ions using a trap disposed in the vessel using a trap having a plurality of spaced apart vanes;

creating a magnetic field in said vessel, said magnetic field being substantially axially symmetric about said axis and being created by a source positioned to interpose the optic between the source and the plasma site; and

curving said magnetic field to make said magnetic field proximate said surface of each of the vanes along the surface approximately normal to the direction of ion paths from said plasma site to deflect debris in said vessel to protect said optic.

22. A device as recited in claim 19 wherein said magnet positioned adjacent to the reflective optic extends from an edge of said optic to an opposing edge of said optic and is further positioned adjacent to a central portion of the optic.

23. A device comprising:

a vessel;

a near normal incidence EUV reflective optic defining an axis and disposed in said vessel, said optic having a focal point on said axis and near an irradiation region in said vessel;

a trap disposed in the vessel, said trap having a plurality of spaced apart vanes, each of the vanes having a surface extending in the direction of said axis and radially; and

a source of a magnetic field disposed in said vessel for deflecting debris in said vessel to protect said optic, said magnetic field being substantially axially symmetric about said axis, said source positioned to interpose the optic between the source and the irradiation region and

means disposed in said vessel for shaping said magnetic field by curving said magnetic field and making said magnetic field proximate said surface of each of the vanes and along the surface approximately normal to the direction of ion paths from said irradiation region.