Flux-closed STRAM with electronically reflective insulative spacer
Flux-closed spin-transfer torque memory having a specular insulative spacer is disclosed. A flux-closed spin-transfer torque memory unit includes a multilayer free magnetic element including a first free magnetic layer anti-ferromagnetically coupled to a second free magnetic layer through an electrically insulating and electronically reflective layer. An electrically insulating and non-magnetic tunneling barrier layer separates the free magnetic element from a reference magnetic layer.
1. A spin-transfer torque memory unit, comprising:
a flux-closed multilayer free magnetic element comprising a first free magnetic layer anti-ferromagnetically coupled to a second free magnetic layer through an electrically insulating and electronically reflective layer;
a reference magnetic layer; and
an electrically insulating and non-magnetic tunneling barrier layer separating the flux-closed multilayer free magnetic element from the reference magnetic layer.
2. A spin-transfer torque memory unit according to claim 1 , wherein the electrically insulating and electronically reflective layer has a non-uniform thickness.
3. A spin-transfer torque memory unit according to claim 1 , wherein the electrically insulating and electronically reflective layer has a thickness value in a range from 3 to 15 Angstroms.
4. A spin-transfer torque memory unit according to claim 1 , wherein the electrically insulating and electronically reflective layer comprises MgO, CuO, TiO, AlO, TaO, TaN, or SiN.
5. A spin-transfer torque memory unit according to claim 1 , wherein the electrically insulating and electronically reflective layer has an area resistance from 1 to 10 ohmsμm 2 .
6. A spin-transfer torque memory unit according to claim 1 , wherein the reference magnetic layer comprises a synthetic anti-ferromagnetic element.
7. A spin-transfer torque memory unit according to claim 1 , wherein the multilayer free magnetic element further comprises an electrically conductive non-ferromagnetic layer separating the electrically insulating and electronically reflective layer from one of the first free magnetic layer or the second free magnetic layer.
8. A spin-transfer torque memory unit according to claim 7 , wherein the multilayer free magnetic element further comprises a second electrically insulating and electronically reflective layer and the electrically conductive non-ferromagnetic layer separates the electrically insulating and electronically reflective layer from the second electrically insulating and electronically reflective layer.
9. A spin-transfer torque memory unit according to claim 7 , wherein the electrically conductive non-ferromagnetic layer has a thickness value in a range from 5 to 20 Angstroms.
10. A spin-transfer torque memory unit according to claim 7 , wherein the electrically conductive non-ferromagnetic layer comprises Ta, Cu, Ru, or Au.
11. A flux-closed spin-transfer torque memory unit, comprising:
a multilayer free magnetic element comprising a first free magnetic layer anti-ferromagnetically coupled to a second free magnetic layer through an electrically insulating and electronically reflective layer and a electrically conductive non-ferromagnetic layer;
a reference magnetic layer; and
an electrically insulating and non-magnetic tunneling barrier layer separating the free magnetic element from the reference magnetic layer.
12. A flux-closed spin-transfer torque memory unit according to claim 11 , wherein the electrically insulating and electronically reflective layers has a non-uniform thickness.
13. A flux-closed spin-transfer torque memory unit according to claim 11 , wherein the electrically insulating and electronically reflective layer has a thickness value in a range from 3 to 15 Angstroms.
14. A flux-closed spin-transfer torque memory unit according to claim 11 , wherein the electrically insulating and electronically reflective layer comprises MgO, CuO, TiO, AlO, TaO, TaN, or SiN.
15. A flux-closed spin-transfer torque memory unit according to claim 11 , wherein the electrically insulating and electronically reflective layer has an area resistance from 1 to 10 ohmsμm 2 .
16. A flux-closed spin-transfer torque memory unit according to claim 11 , wherein the reference magnetic layer comprises a synthetic anti-ferromagnetic element.
17. A flux-closed spin-transfer torque memory unit according to claim 11 , wherein the multilayer free magnetic element further comprises a second electrically insulating and electronically reflective layer and the electrically conductive non-ferromagnetic layer separates the electrically insulating and electronically reflective layer from the second electrically insulating and electronically reflective layer.
18. A flux-closed spin-transfer torque memory unit according to claim 11 , wherein the electrically conductive non-ferromagnetic layer has a thickness value in a range from 5 to 20 Angstroms.
19. A flux-closed spin-transfer torque memory unit according to claim 11 , wherein the electrically conductive non-ferromagnetic layer comprises Ta, Cu, Ru, or Au.
20. A flux-closed spin-transfer torque memory unit, comprising:
a multilayer free magnetic element comprising a first free magnetic layer anti-ferromagnetically coupled to a second free magnetic layer through an electrically insulating and electronically reflective layer, the electrically insulating and electronically reflective layer has a thickness value in a range from 3 to 15 Angstroms and comprises MgO, CuO, TiO, AlO, TaO, TaN, or SiN;
a reference magnetic layer comprising a synthetic anti-ferromagnetic element; and
an electrically insulating and non-magnetic tunneling barrier layer separating the free magnetic element from the reference magnetic layer.
21. An article, comprising:
a multilayer free magnetic element comprising a first free magnetic layer having a first magnetization orientation anti-ferromagnetically coupled to a second free magnetic layer having a second magnetization orientation being antiparallel with the first magnetization orientation through an electrically insulating and electronically reflective layer;
a reference magnetic layer; and
an electrically insulating and non-magnetic tunneling barrier layer separating the free magnetic element from the reference magnetic layer.
22. An article according to claim 21 , wherein the electrically insulating and electronically reflective layer has a non-uniform thickness.
23. An article according to claim 21 , wherein the electrically insulating and electronically reflective layer has a thickness value in a range from 3 to 15 Angstroms.
24. An article according to claim 21 , wherein the electrically insulating and electronically reflective layer comprises MgO, CuO, TiO, AlO, TaO, TaN, or SiN.
25. An article according to claim 21 , wherein the multilayer free magnetic element further comprises an electrically conductive non-ferromagnetic layer separating the electrically insulating and electronically reflective layer from one of the first free magnetic layer or the second free magnetic layer.
26. An article according to claim 25 , wherein the multilayer free magnetic element further comprises a second electrically insulating and electronically reflective layer and the electrically conductive non-ferromagnetic layer separates the electrically insulating and electronically reflective layer from the second electrically insulating and electronically reflective layer.