IP Library Granted Patent US 7,892,070
Granted Patent B2
US 7,892,070 · App. 12/243,543 · Granted Feb 22, 2011

Process of using a polishing apparatus including a platen window and a polishing pad

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Quick Facts
Patent No.
US 7,892,070
App. No.
12/243,543
Granted
Feb 22, 2011
Kind
B2
Abstract

A polishing pad can include a first layer and a second layer. The first layer can have a first polishing surface and a first opening. The second layer can have an attaching surface and a second opening substantially contiguous with the first opening. The polishing pad can further include, a pad window lying within the first opening. The pad window can include a second polishing surface. When the pad would be attached to a platen, the first and second polishing surfaces can lie along a same plane, and an opposing surface of the pad window can abut an exterior surface of a platen window. In another aspect, a polishing apparatus can include an exterior surface of a platen window abutting the polishing pad. In still another aspect, a process of polishing can include polishing a workpiece such that the pad window contacts the workpiece and the platen window simultaneously.

Claims (54)

1. A process of polishing comprising:

providing a polishing apparatus comprising:

a platen having a platen surface lying along a first plane;

a platen window having a window surface lying along a second plane different from the first plane; and

a polishing pad attached to the platen surface and including:

a first layer including a first polishing surface and a first opening, wherein the first opening extends through the first layer and has a first perimeter;

a second layer distinct from and adjacent to the first layer, wherein the second layer comprises a second opening extending through the second layer and having a second perimeter different from the first perimeter of the first opening; and

a pad window lying within the first opening of the first layer and the second opening of the second layer, and abutting the window surface of the platen window; wherein the platen window extends into the second opening but not into the first opening;

applying a fluid to the polishing pad;

placing a workpiece adjacent to the polishing pad;

compressing the polishing pad between the workpiece and the platen; and

polishing the workpiece such that the pad window contacts the workpiece.

2. The process of claim 1 , wherein providing the polishing apparatus comprises providing the polishing apparatus, wherein the window surface lies at an elevation between the platen surface and the first polishing surface.

3. The process of claim 1 , wherein providing the polishing apparatus comprises providing the polishing apparatus, wherein the second opening of the second layer is substantially contiguous with the first opening of the first layer.

4. The process of claim 1 , wherein providing the polishing apparatus comprises providing the polishing apparatus wherein:

the second layer of the polishing pad includes a pad attaching surface attached to the platen surface; and

the second layer of the polishing pad lies between the platen surface and the first layer of the polishing pad.

5. The process of claim 1 , wherein the second layer includes a different material as compared to the first layer.

6. The process of claim 1 , further comprising:

directing a radiation beam through a polishing surface of the pad window; and

detecting a predetermined wavelength or spectrum of radiation from the radiation beam.

7. The process of claim 1 , wherein the pad window comprises a rubber based material, a polyethylene, a polytetrafluoroethylene, a polypropylene, or any combination thereof.

8. The process of claim 6 , wherein the fluid is substantially opaque to the predetermined wavelength or spectrum of radiation.

9. The process of claim 6 , wherein directing the radiation beam further comprises directing the radiation beam such that the radiation beam enters a bottom surface of the platen window, wherein the bottom surface is spaced apart from the window surface and lies along a third plane that intersects the first and second planes.

10. A process of polishing comprising:

providing a polishing apparatus comprising:

a platen having a platen surface lying along a first plane;

a platen window having a window surface lying along a second plane that is substantially parallel to and different from the first plane; and

a polishing pad comprising:

a first layer including a first polishing surface and a first opening extending through the first layer, wherein the first polishing surface lies along a third plane that is substantially parallel to and different from the first and second planes, and wherein the second plane lies between the first and third planes;

a second layer distinct from and adjacent to the first layer, wherein:

the second layer has a pad attaching surface lying closer to the platen than to the first layer, and an opposing surface opposite the pad attaching surface and lying closer to the first layer than to the platen; and

a second opening extending through the second layer, the second opening is substantially contiguous with the first opening of the first layer; and

a pad window lying within the first and second openings, wherein the window surface lies at an elevation between the pad attaching and opposite surfaces of the second layer;

applying a fluid to the first polishing surface, wherein the polishing pad is attached to the platen;

placing a workpiece adjacent to the polishing pad;

compressing the polishing pad between the workpiece and the platen; and

polishing the workpiece such that the pad window contacts the workpiece.

11. The process of claim 10 , wherein providing the polishing apparatus comprises providing the polishing apparatus, wherein a portion of a side surface of the platen window lies at an elevation between the first and third planes.

12. The process of claim 11 , wherein providing the polishing apparatus comprises providing the polishing apparatus, wherein the portion of the side surface of the platen window lies at an elevation between the first and second planes.

13. The process of claim 10 , wherein the pad window comprises a rubber based material, a polyethylene, a polytetrafluoroethylene, a polypropylene, or any combination thereof.

14. The process of claim 10 , further comprising:

directing a radiation beam through a polishing surface of the pad window; and

detecting a predetermined wavelength or spectrum of radiation from the radiation beam.

15. The process of claim 14 , wherein:

the radiation beam enters a bottom surface of the platen window;

the bottom surface is spaced apart from the window surface and lies along a fourth plane that intersects the first, second, and third planes; and

the first, second, and third planes are substantially parallel to one another.

16. The process of claim 14 , wherein:

the radiation beam exits a bottom surface of the platen window before being detected;

the bottom surface is spaced apart from the window surface and lies along a fourth plane that intersects the first, second, and third planes; and

the first, second, and third planes are substantially parallel to one another.

17. The process of claim 10 , wherein providing the polishing apparatus comprises providing the polishing apparatus, wherein the second layer includes a different material as compared to the first layer.

18. The process of claim 10 , wherein the pad window has a composition that is capable of allowing transmission of a predetermined wavelength or spectrum of radiation.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2018
From: NXP USA, INC.
To: VLSI TECHNOLOGY LLC
Reel/Frame 045084/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0807 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Mar 15, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 024085/0001 →
SECURITY AGREEMENT Recorded Mar 12, 2009
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 022380/0409 →