IP Library Granted Patent US 8,760,133
Granted Patent B2
US 8,760,133 · App. 12/255,356 · Granted Jun 24, 2014

Linear drop-out regulator circuit

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Quick Facts
Patent No.
US 8,760,133
App. No.
12/255,356
Granted
Jun 24, 2014
Kind
B2
Abstract

According to one aspect of the embodiment, a linear regulator circuit includes an output transistor outputting an output current based on a input voltage, an error amplifier outputting a control signal based on an electric potential difference between an output voltage based on the output current and a reference voltage, a buffer circuit coupled between the error amplifier and the output transistor, and a drive capability adjustment circuit adjusting a load drive capability of the buffer circuit in synchronization with the output current.

Claims (45)

1. An apparatus comprising:

an error amplifier circuit;

a first buffer circuit connected to an output terminal of the error amplifier circuit;

a second buffer circuit connected to an output terminal of the first buffer circuit, wherein an output terminal of the second buffer circuit comprises an internal node;

a drive capability adjustment circuit including a first transistor coupled between a voltage input node and the internal node; and

a series circuit, including a second transistor and a capacitor, wherein

a control terminal of the second transistor is connected to the internal node,

a first terminal of the capacitor is connected to the output terminal of the first buffer circuit and

a second terminal of the capacitor is connected to another terminal of the second transistor.

2. The apparatus according to claim 1 , wherein the first transistor is a MOS transistor with a gate terminal and a drain terminal connected to the output terminal of the second buffer circuit.

3. The apparatus according to claim 2 , wherein the gate terminal of the MOS transistor and a gate terminal of an output MOS transistor are connected to the output terminal of the second buffer circuit.

4. The apparatus according to claim 1 , wherein the first transistor is a MOS transistor with a source terminal connected to the voltage input node and a gate terminal and a drain terminal connected to the output terminal of the second buffer circuit.

5. The apparatus according to claim 1 , wherein the first transistor is a variable resistor configured to adjust a current supplied to the second buffer circuit based on a change in an output current.

6. The apparatus according to claim 1 , wherein the first transistor is a P-channel MOS transistor.

7. The apparatus according to claim 1 , wherein the second transistor is a MOS transistor with a gate terminal connected to the output terminal of the second buffer circuit.

8. The apparatus according to claim 1 , wherein the first transistor is a MOS transistor with a source terminal connected to the voltage input node.

9. The apparatus according to claim 1 , wherein the first buffer circuit includes an input terminal connected to the output terminal of the error amplifier circuit.

10. The apparatus according to claim 1 , wherein the error amplifier circuit is configured to output a control signal based on an electric potential difference between an output voltage and a reference voltage.

11. The apparatus according to claim 1 , further comprising:

an output transistor configured to output a current based on an input voltage applied at a control terminal of the output transistor.

12. The apparatus according to claim 1 , wherein the series circuit is configured to reduce a peak of a Power Supply Rejection Ratio (PSRR) characteristic of the apparatus.

13. A system comprising:

an error amplifier circuit;

a first buffer circuit connected to an output terminal of the error amplifier circuit;

a second buffer circuit connected to an output terminal of the first buffer circuit, wherein an output terminal of the second buffer circuit comprises an internal node;

a drive capability adjustment circuit including a first transistor coupled between a voltage input node and an internal node;

a series circuit, including a second transistor and a capacitor, wherein

a control terminal of the second transistor is connected to the internal node,

a first terminal of the capacitor is connected to the output terminal of the first buffer circuit and

a second terminal of the capacitor is connected to another terminal of the second transistor; and

a feedback circuit coupled to an input of the error amplifier circuit.

14. The semiconductor device according to claim 13 , wherein the first transistor is a P-channel MOS transistor.

15. The apparatus according to claim 13 , wherein the second transistor is a P-channel MOS (PMOS) transistor, wherein a source terminal of the PMOS transistor is connected to the voltage input node.

16. The semiconductor device according to claim 13 , wherein the first transistor is a MOS transistor with a source terminal connected to the voltage input node and a gate terminal and a drain terminal connected to the output terminal of the second buffer circuit.

17. A method comprising:

outputting, with an error amplifier circuit, a control signal based on an electric potential difference between an output voltage based on an output current and a reference voltage to a first buffer circuit connected to an output terminal of the error amplifier circuit; and

adjusting a load drive capability of a second buffer circuit, connected to an output terminal of the first buffer circuit, based on the output current with:

a first transistor coupled between a voltage input node and an output terminal of the second buffer circuit that comprises an internal node; and

a series circuit including a capacitor and a second transistor, wherein

a control terminal of the second transistor is connected to the internal node,

a first terminal of the capacitor is connected to the output terminal of the first buffer circuit and

a second terminal of the capacitor is connected to another terminal of the second transistor.

18. The method according to claim 17 , wherein the first transistor is a MOS transistor with a source terminal connected to the voltage input node and a gate terminal and a drain terminal connected to the output terminal of the second buffer circuit.

19. The method according to claim 17 , wherein the first transistor is a variable resistor configured to adjust a current supplied to the second buffer circuit based on a change in an output current.

20. The method according to claim 17 , wherein the second transistor is a P-channel MOS (PMOS) transistor, wherein a source terminal of the PMOS transistor is connected to the voltage input node.

Assignments (8)
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
RELEASE OF SECURITY INTEREST Recorded Dec 22, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 041175/0939 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2016
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MONTEREY RESEARCH, LLC
Reel/Frame 040908/0960 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 27, 2016
From: SPANSION LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 040165/0001 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2013
From: FUJITSU SEMICONDUCTOR LIMITED
To: SPANSION LLC
Reel/Frame 031205/0461 →
CHANGE OF NAME Recorded Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024748/0328 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2008
From: HASEGAWA, MORIHITO; ITO, HIDENOBU; HUI, KWOK FAI; YUNG, YAT FONG
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021720/0818 →