IP Library Granted Patent US 8,112,183
Granted Patent B2
US 8,112,183 · App. 12/260,211 · Granted Feb 7, 2012

Substrate processing apparatus and substrate processing method

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Quick Facts
Patent No.
US 8,112,183
App. No.
12/260,211
Granted
Feb 7, 2012
Kind
B2
Abstract

A substrate processing apparatus detects malfunction of mechanisms in MFC. An inert gas supply line, a first shut-off valve shutting off the inert gas supply, a process gas supply line, and a second shut-off valve shutting off the process gas supply are installed upstream of the MFC. A gas supply pipe connected to a process chamber, a third shut-off valve shutting off gas supply to the gas supply pipe, an exhaust vent line which is exhaustible, and a fourth shut-off valve shutting off gas supply to the exhaust vent line are installed downstream of the MFC. A main control unit determines that the MFC is abnormal if a transition time exceeds a previously set time when the MFC transitions from a closed state to an opened state while the shut-off valves are in a closed state.

Claims (10)

1. A substrate processing apparatus capable of detecting a malfunction thereof, comprising:

a process chamber for processing a substrate;

a flow rate control unit for controlling a flow rate of a gas supplied into the process chamber;

opening-closing valves installed at an upstream side and a downstream side of the flow rate control unit; and

a determination unit for determining the flow rate control unit is malfunctioning when a transition time from a closed state of the flow rate control unit to an opened state of the flow rate control unit, with all of the opening-closing valves closed, exceeds a predefined time.

2. A method for detecting a malfunction of a substrate processing apparatus, the substrate processing apparatus comprising a process chamber, a flow rate control unit, and opening-closing valves installed at an upstream side and a downstream side of the flow rate control unit, the method comprising:

processing, by the process chamber, a substrate;

controlling the flow rate control unit to transition from a closed state to an opened state, with all of the opening-closing valves closed;

determining that the flow rate control unit is malfunctioning when a transition time from the closed state to the opened state exceeds a predefined time; and

determining that the flow rate control unit is functioning normally when the transition time is within the predefined time.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2018
From: HITACHI KOKUSAI ELECTRIC INC.
To: KOKUSAI ELECTRIC CORPORATION
Reel/Frame 048008/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 29, 2008
From: YAMADA, TOMOYUKI
To: HITACHI KOKUSAI ELECTRIC, INC.
Reel/Frame 021753/0874 →