IP Library Granted Patent US 8,259,908
Granted Patent B2
US 8,259,908 · App. 12/263,628 · Granted Sep 4, 2012

Method and apparatus for metallic line testing of a subscriber line

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Quick Facts
Patent No.
US 8,259,908
App. No.
12/263,628
Granted
Sep 4, 2012
Kind
B2
Abstract

A method for performing metallic line testing on a communication system is provided. The communication system includes an isolation transformer disposed between a provider circuit operable to provide a digital subscriber line signal and a subscriber circuit. The isolation transformer has a center tap. A test signal is injected at the center tap. A response of the subscriber circuit to the test signal is sensed.

Claims (29)

1. An apparatus for performing metallic line testing on a communication system including an isolation transformer disposed between a provider circuit operable to provide a digital subscriber line signal and a subscriber circuit, the isolation transformer having a center tap, comprising:

a metallic line testing driver including at least one terminal for coupling to the center tap of the isolation transformer on a subscriber circuit side and being operable to inject a test signal into the center tap; and

a metallic line testing controller having at least one terminal for coupling to the subscriber circuit and being operable to sense a response of the subscriber circuit to the test signal.

2. The apparatus of claim 1 , wherein the test signal comprises a direct current signal.

3. The apparatus of claim 1 , wherein the metallic line testing controller is coupled to the metallic line testing driver and operable to configure the test signal.

4. The apparatus of claim 1 , wherein the isolation transformer includes a first coil coupled to a first line of the subscriber circuit, a second coil coupled to a second line of the subscriber circuit, and the at least one terminal of the metallic line testing driver comprises a first terminal for coupling to the first coil at the center tap and a second terminal for coupling to the second coil at the center tap.

5. The apparatus of claim 4 , wherein the at least one terminal of the metallic line testing controller comprises a first terminal for coupling to the first line and a second terminal for coupling to the second line.

6. The apparatus of claim 4 , wherein the isolation transformer comprises a capacitor coupled between the first and second coils, and the first and second terminals are coupled across the capacitor.

7. A communication system, comprising:

a provider circuit operable to provide a digital subscriber line signal;

a subscriber circuit;

an isolation transformer coupled between the provider circuit and the subscriber circuit and having a first coil coupled to a first line of the subscriber circuit, a second coil coupled to a second line of the subscriber circuit, and a center tap defined between the first and second coils;

a metallic line testing driver coupled to the center tap of the isolation transformer on a subscriber circuit side and being operable to inject a test signal into the subscriber circuit; and

a metallic line testing controller coupled to the first and second lines and being operable to sense a response of the subscriber circuit to the test signal.

8. The system of claim 7 , wherein the test signal comprises a direct current signal.

9. The system of claim 7 , wherein the metallic line testing controller is coupled to the metallic line testing driver and operable to configure the test signal.

10. The system of claim 7 , further comprising a first resistor coupled between the metallic line testing controller and the first line and a second resistor coupled between the metallic line testing controller and the second line.

11. The system of claim 7 , wherein the isolation transformer comprises a capacitor coupled between the first and second coils, and the metallic line testing driver includes first and second terminals coupled across the capacitor.

12. The system of claim 7 , wherein the metallic line testing driver includes first and second terminals coupled to the center tap and operable to provide the test signal, and the test signal comprises a differential signal.

13. The system of claim 7 , wherein the provider circuit is operable to maintain the digital subscriber line signal during a time period that the metallic line testing driver injects the test signal and the metallic line testing controller senses the response.

14. A method for performing metallic line testing on a communication system including an isolation transformer disposed between a provider circuit operable to provide a digital subscriber line signal and a subscriber circuit, the isolation transformer having a center tap, comprising:

injecting a test signal at the center tap of the isolation transformer on a subscriber circuit side; and

sensing a response of the subscriber circuit to the test signal.

15. The method of claim 14 , wherein the test signal comprises a direct current signal.

16. The method of claim 14 , wherein the isolation transformer comprises a first coil coupled to a first line of the subscriber circuit, a second coil coupled to a second line of the subscriber circuit, and the center tap is defined between the first and second coils, and wherein injecting the test signal comprises injecting the test signal between the first and second coils.

17. The method of claim 16 , wherein the test signal comprises a differential signal.

18. The method of claim 14 , wherein the isolation transformer comprises a first coil coupled to a first line of the subscriber circuit, a second coil coupled to a second line of the subscriber circuit, and a capacitor coupled between the first and second coils, and wherein injecting the test signal comprises injecting the test signal across the capacitor.

19. The method of claim 18 , wherein the test signal comprises a differential signal.

20. The method of claim 14 , further comprising maintaining the digital subscriber line signal during a time period that includes the injecting of the test signal and the sensing of the response.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.), INC.; MICROSEMI FREQUENCY AND TIME CORPORATION; MICROSEMI COMMUNICATIONS, INC.; MICROSEMI SOC CORP.; MICROSEMI CORP. - POWER PRODUCTS GROUP; MICROSEMI CORP. - RF INTEGRATED SOLUTIONS
Reel/Frame 046251/0391 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC. (F/K/A LEGERITY, INC., ZARLINK SEMICONDUCTOR (V.N.) INC., CENTELLAX, INC., AND ZARLINK SEMICONDUCTOR (U.S.) INC.); MICROSEMI FREQUENCY AND TIME CORPORATION (F/K/A SYMMETRICON, INC.); MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION); MICROSEMI SOC CORP. (F/K/A ACTEL CORPORATION); MICROSEMI CORP. - POWER PRODUCTS GROUP (F/K/A ADVANCED POWER TECHNOLOGY INC.); MICROSEMI CORP. - RF INTEGRATED SOLUTIONS (F/K/A AML COMMUNICATIONS, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037691/0697 →
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
NOTICE OF SUCCESSION OF AGENCY Recorded Apr 9, 2015
From: ROYAL BANK OF CANADA (AS SUCCESSOR TO MORGAN STANLEY & CO. LLC)
To: BANK OF AMERICA, N.A., AS SUCCESSOR AGENT
Reel/Frame 035657/0223 →
PATENT SECURITY AGREEMENT Recorded Nov 26, 2013
From: MICROSEMI SEMICONDUCTOR (U.S.) INC.
To: MORGAN STANLEY & CO. LLC
Reel/Frame 031729/0667 →
CHANGE OF NAME Recorded Aug 6, 2012
From: ZARLINK SEMICONDUCTOR (U.S.) INC.
To: MICROSEMI SEMICONDUCTOR (U.S.) INC.
Reel/Frame 028734/0408 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME OF ASSIGNEE PREVIOUSLY RECORDED ON REEL 021776 FRAME 0587. ASSIGNOR(S) HEREBY CONFIRMS THE NAME OF THE ASSIGNEE SHOULD BE ZARLINK SEMICONDUCTOR (U.S.) INC.. Recorded Nov 20, 2008
From: SADEGHI, SHAHIN
To: ZARLINK SEMICONDUCTOR (U.S.) INC.
Reel/Frame 021865/0163 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 3, 2008
From: SADEGHI, SHAHIN
To: ZARLINK SEMICONDUCTOR US, INC.
Reel/Frame 021776/0587 →