IP Library Granted Patent US 9,334,578
Granted Patent B2
US 9,334,578 · App. 12/273,289 · Granted May 10, 2016

Electroplating apparatus and method with uniformity improvement

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Quick Facts
Patent No.
US 9,334,578
App. No.
12/273,289
Granted
May 10, 2016
Kind
B2
Abstract

An electroplating system is provided. The electroplating system includes a divided electrode that is arranged to simultaneously provide a plurality of line currents for an electroplating process. The system includes a current control component that is coupled to the divided electrode. The current control component is configured to determine the magnitude of each of the line currents. The current control component is also configured to regulate individual line currents based, at least in part, on the determined magnitude of each of the line currents.

Claims (28)

1. An electroplating system, comprising:

a divided electrode that includes a conductive disc that is divided into a plurality of separate electrode elements, each electrode element having a plurality of electrode fingers, wherein the divided electrode is arranged to substantially simultaneously provide a plurality of line currents for an electroplating process via the plurality of separate electrode elements;

a power supply; and

a current control component arranged between the divided electrode and the power supply, wherein the current control component comprises:

a plurality of current control elements coupled to the divided electrode, wherein each of the plurality of current control elements is configured to sense a magnitude of a corresponding one of the plurality of line currents and generate a corresponding sensing signal, and

a controller circuit coupled to the plurality of current control elements, the controller circuit includes a processor that is configured to receive the corresponding sensing signal and generate a corresponding feedback signal to each of the plurality of current control elements.

2. The electroplating system of claim 1 , wherein the current control component is configured to independently increase or decrease at least one of the line currents of the plurality of line currents relative to another one of the line currents of the plurality of line currents.

3. The electroplating system of claim 1 , wherein the current control component is configured to identify one of the line currents of the plurality of line currents and to set each line current of the portion of the plurality of line currents to the current value associated with the identified line current.

4. The electroplating system of claim 1 , wherein each of the plurality of current control elements includes an ammeter and a variable resistor.

5. The electroplating system of claim 4 , wherein

the ammeter is configured to sense the magnitude of the corresponding one of the plurality of line currents and generate the corresponding sensing signal, and

the variable resistor is configured to receive the corresponding feedback signal and regulate the corresponding one of the plurality of line currents.

6. The electroplating system of claim 4 , wherein the ammeter and the variable resistor of the each of the plurality of current control elements are located outside of a processing chamber of the electroplating system.

7. The electroplating system of claim 1 , further comprising a processing chamber that is configured to contain an electroplating solution such that the current control component is electrically coupled to the electroplating solution via the divided electrode.

8. The electroplating system of claim 1 , wherein the divided electrode includes a cathode, and wherein the electroplating system further comprises:

a processing chamber; and

an anode arranged within the chamber to receive an electroplating current that is based, at least in part, on the plurality of line currents.

9. The electroplating system of claim 1 , wherein the controller circuit is configured to operate over a computer network.

10. The electroplating system of claim 1 , wherein the processor is further configured to generate a control signal to the power supply for controlling a voltage of the power supply between the current control component and the power supply.

11. An electroplating apparatus, comprising:

a processing chamber;

an electrode arranged within the processing chamber, wherein the electrode includes a plurality of electrode elements, each electrode element having a plurality of electrode fingers, that is configured to substantially simultaneously provide a plurality of line currents for an electroplating process;

a power supply;

a plurality of ammeters coupled to the plurality of electrode elements wherein each of the plurality of ammeters is configured to sense a magnitude of a corresponding one of the plurality of line currents and generate a corresponding sensing signal;

a plurality of variable resistors coupled between the plurality of ammeters and power supply; and

a controller circuit coupled to the plurality of ammeters and the plurality of variable resistors, the controller circuit includes a processor configured to receive the corresponding sensing signal and generate a corresponding feedback signal to each of the plurality of variable resistors.

12. The electroplating apparatus of claim 11 , wherein the plurality of ammeters and the plurality of variable resistors are located outside of the processing chamber.

13. The electroplating apparatus of claim 11 , wherein the processor is further configured to generate a control signal to the power supply for controlling a voltage of the power supply between the plurality of variable resistors and the power supply.

Assignments (8)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2022
From: CYPRESS SEMICONDUCTOR CORPORATION
To: INFINEON TECHNOLOGIES LLC
Reel/Frame 059721/0467 →
RELEASE OF SECURITY INTEREST Recorded Mar 16, 2022
From: MUFG UNION BANK, N.A.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 059410/0438 →
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Oct 28, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MUFG UNION BANK, N.A.
Reel/Frame 050896/0366 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 8, 2015
From: SPANSION LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 035856/0527 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
SECURITY AGREEMENT Recorded Aug 23, 2012
From: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
To: BARCLAYS BANK PLC
Reel/Frame 028837/0076 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2008
From: TAKEGUCHI, NAOKI
To: SPANSION LLC
Reel/Frame 021873/0026 →