Device and method for testing a device
View Patent ↗A device that includes a core and a wrapper. The wrapper includes at least one shared wrapper cell that is shared by a group of core pins that belong to a single clock domain. A method for designing a wrapper. The method includes receiving design information representative of a design of a core, locating a group of mutually independent core pins that belong to a single clock domain; and designing a shared wrapped cell that is shared by the group of core pins.
1. A device that comprises:
a data processor core; and
a plurality of wrapper cells for providing test access to the data processor core, the plurality of wrapper cells including a first wrapper cell that is shared by a group of pins of the data processor core that belong to a single clock domain, wherein each of the plurality of wrapper cells consists of only one flip flop and other components that are not flip flops.
2. The device according to claim 1 wherein:
the first wrapper cell comprises a group of outputs, each output of the group of outputs coupled to a corresponding one pin of the group of pins; and
during a test mode each pin of the group of pins receives the same test signal.
3. The device according to claim 2 wherein a flip-flop at the first wrapper cell is coupled to the group of outputs during the test mode.
4. The device according to claim 2 wherein the first wrapper cell comprises a group of inputs, and an input selection circuit adapted to select one input of the group of inputs.
5. The device of claim 2 wherein an output of a flip-flop at the first wrapper cell is coupled to an input of a flip-flop at an adjacent wrapper cell.
6. The device according to claim 1 wherein an output of a flip-flop at the first wrapper cell is coupled to an input of a flip-flop at an adjacent wrapper cell.
7. The device according to claim 1 wherein the core pins that belong to the group of pins are logically independent.
8. The device according to claim 1 wherein the core pins that belong to the group of pins convey data signals during a non-test mode of the integrated circuit.
9. The device according to claim 1 wherein the plurality of wrapper cells comprises at least one wrapper cell that is associated with only one core pin.
10. The device according to claim 1 wherein the plurality of wrapper cells comprises a second wrapper cell, wherein the first shared wrapper cell has fewer output pins than the second wrapper cell.
11. A method comprising:
configuring an operational mode of a data processor core using automated test equipment; and
providing a test signal to a group of core pins that belong to a single clock domain using a first wrapper cell of a plurality of wrapper cells if the operational mode is a test mode, the plurality of wrapper cells to provide test access to the data processor core, wherein each of the plurality of wrapper cells consists of only one flip flop and other components that are not flip flops.
12. The method according to claim 11 further comprising providing, during the test mode, the same test signal to all of the core pins that belong to the group of core pins.
13. The method according to claim 12 wherein the providing comprises coupling an output of a flip-flop at the first wrapper cell to each core pin of the group of core pins.
14. The method according to claim 12 wherein the providing is preceded by selecting the test signal from a set of test signals, each test signal of the set of test signals received at a corresponding one input of the first wrapper cell.
15. The method according to claim 12 further comprising:
providing a launch vector to the plurality of wrapper cells, the launch vector shifted serially into a respective flip-flop at each of the plurality of wrapper cells, and transferring in parallel respective bits of the launch vector to corresponding core pins coupled to the serially coupled wrapper flip-flops; and
sampling a response of multiple components of the data processor core to the launch vector.
16. The method according to claim 12 further comprising defining a group of core pins that are logically independent.
17. A method for designing a test access wrapper at a data processor core, the method comprising:
receiving at a computer information representative of a design of the data processor core;
identifying at the computer a first group of core pins that are logically independent and that belong to a single clock domain; and
instantiating a first wrapper cell at the design that is shared by the first group of core pins, wherein the first wrapper cell consists of only one flip flop and other components that are not flip flops.
18. The method according to claim 17 further comprising receiving a group size, and wherein the identifying is responsive to the group size information.
19. The method according to claim 17 wherein the first wrapper cell transparently communicates information from a first input to a corresponding one output if the data processor core is configured to operate in a normal mode.
20. The method of claim 17 further comprising:
identifying at the computer a second group of core pins that are logically independent and that belong to a single clock domain; and
instantiating a second wrapper cell at the design that is shared by the second group of core pins, the second wrapper cell including a single flip-flop, wherein an output of the flip-flop at the first wrapper cell is connected to an input at the flip-flop at the second wrapper cell.