Low temperature deposition of phase change memory materials
View Patent ↗A system and method for forming a phase change memory material on a substrate, in which the substrate is contacted with precursors for a phase change memory chalcogenide alloy under conditions producing deposition of the chalcogenide alloy on the substrate, at temperature below 350° C. with the contacting being carried out via chemical vapor deposition or atomic layer deposition. Various tellurium, germanium and germanium-tellurium precursors are described, which are useful for forming GST phase change memory films on substrates.
1. A method of forming a GeSbTe semiconductor, comprising depositing a film of GeSbTe semiconductor material by CVD or ALD, and doping same with nitrogen, wherein said doping comprises at least one of (i) use of the vaporizable liquid, and (ii) pulsing of nitrogen dopant, optionally with purging between pulses.
2. The method of claim 1 , wherein said doping comprises use of a reactant gas.
3. The method of claim 2 , wherein said reactant gas comprises ammonia.
4. The method of claim 1 , wherein said doping comprises use of a vaporizable liquid.
5. The method of claim 4 , wherein said vaporizable liquid comprises an amine liquid.
6. The method of claim 2 , wherein the reactant gas is introduced as a co-reactant with precursors during formation of said film.
7. The method of claim 2 , wherein the reactant gas is introduced as a carrier gas for precursors during formation of said film.
8. The method of claim 1 , wherein the doping comprises pulsing of nitrogen dopant, optionally with purging between pulses.
9. The method of claim 1 , wherein the doping comprises incorporation of nitrogen from a nitrogen-containing precursor in the formation of the film.
10. A method of forming a GeSbTe film on a substrate, comprising use of a germanium complex comprising ligand selected from the group consisting of isopropyl, isobutyl, benzyl, allyl, alkylamino, nitriles, and isonitriles, in chemical vapor deposition or atomic layer deposition.
11. The method of claim 10 , wherein said chemical vapor deposition or atomic layer deposition is carried out at temperature below 350° C.
12. The method of claim 10 , wherein the germanium complex comprises isopropyl ligand.
13. The method of claim 10 , wherein the germanium complex comprises isobutyl ligand.
14. The method of claim 10 , wherein the germanium complex comprises benzyl ligand.
15. The method of claim 10 , wherein the germanium complex comprises allyl ligand.
16. The method of claim 10 , wherein the germanium complex comprises alkylamino ligand.
17. The method of claim 10 , wherein the germanium complex comprises nitrile ligand.
18. The method of claim 10 , wherein the germanium complex comprises isonitrile ligand.