Polishing slurry for CMP, and polishing method
View Patent ↗Disclosed is a polishing slurry for CMP which makes it possible to polish a barrier layer, a wiring metal layer and an interlayer dielectric continuously, and restrain a phenomenon that the interlayer dielectric in a region near the wiring metal layer is excessively shaven off so that a depression is generated. A polishing slurry, for CMP, containing abrasive particles, an acid, a tolyltriazole compound represented by the following general formula (I), and water: wherein R 1 s each independently represent an alkylene group having 1 to 4 carbon atoms, and R 2 represents an alkylene group having 1 to 4 carbon atoms.
1. A polishing slurry for CMP, containing abrasive particles, an acid, a tolyltriazole compound represented by the following general formula (I), and water:
wherein R 1 s each independently represent an alkylene group having 1 to 4 carbon atoms, and R 2 represents an alkylene group having 1 to 4 carbon atoms,
wherein the difference (absolute value) between the zeta-potential of Cu in the polishing slurry for CMP except that no abrasive particles are contained therein, and that of TaN in the polishing slurry for CMP except that no abrasive particles are contained therein, is 20.0 mV or less, and
wherein the polishing slurry has a pH of 2 to 3.
2. The polishing slurry for CMP according to claim 1 , wherein R 2 in the general formula (I) is a methylene group.
3. The polishing slurry for CMP according to claim 1 , wherein R 1 s in the general formula (I) are each a methylene group or an ethylene group.
4. The polishing slurry for CMP according to claim 1 , wherein the tolyltriazole compound is 2,2′-((4-methyl-1H-benzotriazole-1-yl)methyl imino) bisethanol, 2,2′-((5-methyl-1H-benzotriazole-1-yl)methyl imino) bisethanol, or a mixture thereof.
5. The polishing slurry for CMP according to claim 1 , wherein the abrasive particles are colloidal silica.
6. The polishing slurry for CMP according to claim 1 , which contains an oxidizer for metal.
7. The polishing slurry for CMP according to claim 1 , wherein the polishing slurry is capable of polishing exposed portions of a barrier layer provided between an insulating layer and a metal wiring layer, and the polishing slurry, containing said tolyltriazole compound represented by the general formula (I), has a property that it can be used to polish said barrier layer while restraining formation of a depression in the insulating layer alongside the barrier layer.
8. The polishing slurry for CMP according to claim 1 , wherein said difference (absolute value) is in a range of 0.0 to 19.0 mV.
9. The polishing slurry for CMP according to claim 1 , wherein a zeta-potential of Cu in the polishing slurry is a negative value.
10. The polishing slurry for CMP according to claim 1 , wherein a zeta-potential of TaN in the polishing slurry is 19 mV or less.
11. The polishing slurry for CMP according to claim 1 , wherein the abrasive particles in the polishing slurry for CMP have a zeta-potential of approximately 0 mV.
12. The polishing slurry for CMP according to claim 1 , wherein the abrasive particles are made of silica, and have a zeta-potential of from −10 to 10 mV.
13. The polishing slurry for CMP according to claim 1 , wherein a blend amount of said tolyltriazole compound represented by the general formula (I) in the polishing slurry is 0.0001 to 0.05 mol per 100 g of the polishing slurry.
14. The polishing slurry for CMP according to claim 13 , wherein said blend amount is 0.0005 to 0.005 mol per 100 g of the polishing slurry.
15. A polishing method, comprising:
a first chemical mechanical polishing step of preparing a substrate having an interlayer dielectric having a surface composed of concave regions and convex regions, a barrier layer for covering the interlayer dielectric along the surface thereof, and a wiring metal layer which is filled into the concave regions to cover the barrier layer, and polishing the wiring metal layer to expose the barrier layer on the convex regions, and
a second chemical mechanical polishing step of polishing the barrier layer of the substrate exposed in the first chemical mechanical polishing step using a polishing slurry for CMP as recited in claim 1 , thereby exposing the interlayer dielectric on the convex regions.
16. The polishing method according to claim 15 , wherein the interlayer dielectric is a silicon-based coating film.
17. The polishing method according to claim 15 , wherein wiring metal is at least one selected from the group consisting of copper, copper alloy, oxides of copper, and oxides of copper alloy.
18. The polishing method according to claim 15 , wherein the barrier layer comprises a tantalum or a tantalum compound.