IP Library Granted Patent US 7,978,496
Granted Patent B2
US 7,978,496 · App. 12/314,903 · Granted Jul 12, 2011

Method of programming a nonvolatile memory device containing a carbon storage material

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Quick Facts
Patent No.
US 7,978,496
App. No.
12/314,903
Granted
Jul 12, 2011
Kind
B2
Abstract

A nonvolatile memory cell includes a steering element located in series with a storage element, where the storage element comprises a carbon material. A method of programming the cell includes applying a reset pulse to change a resistivity state of the carbon material from a first state to a second state which is higher than the first state, and applying a set pulse to change a resistivity state of the carbon material from the second state to a third state which is lower than the second state. A fall time of the reset pulse is shorter than a fall time of the set pulse.

Claims (54)

1. A method of programming a nonvolatile memory cell comprising a steering element located in series with a storage element, wherein the storage element comprises a carbon material, the method comprising:

applying a reset pulse to change a resistivity state of the carbon material from a first state to a second state which is higher than the first state; and

applying a set pulse to change a resistivity state of the carbon material from the second state to a third state which is lower than the second state,

wherein a fall time of the reset pulse is shorter than a fall time of the set pulse, and

wherein the steering element comprises a diode or a transistor and the carbon material comprises a carbon flake resistivity switching material.

2. The method of claim 1 , wherein the fall time of the reset pulse is at least ten times shorter than the fall time of the set pulse.

3. The method of claim 2 , further comprising:

applying a second reset pulse to change a resistivity state of the carbon material; and

applying a second set pulse to change a resistivity state of the carbon material.

4. The method of claim 1 , wherein the fall time of the reset pulse is less than 10 nanoseconds long and the fall time of the set pulse is between 1 and 200 microseconds long.

5. The method of claim 1 , wherein the fall time of the reset pulse is 3 to 5 nanoseconds long and the fall time of the set pulse is between 10 and 100 microseconds long.

6. The method of claim 1 , wherein:

the reset pulse and set pulse comprise forward bias pulses; and

the reset pulse has a larger amplitude than the set pulse.

7. The method of claim 6 , wherein a duration of the reset pulse is at least ten times shorter than a duration of the set pulse.

8. The method of claim 7 , wherein reset pulse has a duration of 20 to 300 nanoseconds and the set pulse has a duration of 2 to 500 microseconds.

9. The method of claim 1 , wherein memory cell comprises a portion of a monolithic three dimensional array of nonvolatile memory cells.

10. The method of claim 1 , wherein the steering element comprises the diode and the carbon material comprises sheets or pieces of polycrystalline carbon comprising a hexagonal unit cell structure but lacking well defined and orderly A-B graphene sheet stacking of hexagonal graphite.

11. The method of claim 10 , wherein the carbon material comprises the polycrystalline carbon having a first Raman spectrum peak between 1300 and 1350 cm −1 and a second Raman spectrum peak between 1600 and 1650 cm −1 .

12. A method of programming a nonvolatile memory cell comprising a steering element located in series with a storage element, wherein the storage element comprises a carbon material, the method comprising:

applying a reset pulse to the carbon material in a lower resistivity polycrystalline state to at least partially convert the carbon material to a higher resistivity amorphous state and to quench the carbon material into the higher resistivity amorphous state; and

applying a set pulse to the carbon material to at least partially convert the carbon material from the higher resistivity amorphous state to the lower resistivity polycrystalline state,

wherein a fall time of the reset pulse is shorter than a fall time of the set pulse, and

wherein:

the fall time of the reset pulse is 3 to 5 nanoseconds long;

the fall time of the set pulse is between 10 and 100 microseconds long;

the reset pulse and set pulse comprise forward bias pulses;

the reset pulse has a larger amplitude than the set pulse;

a duration of the reset pulse is at least ten times shorter than a duration of the set pulse;

the steering element comprises a diode; and

the polycrystalline carbon material comprises a carbon flake resistivity switching material.

13. The method of claim 12 , wherein:

the carbon material is at least partially melted during the reset pulse and the carbon material is cooled to the amorphous state during a fall time of the reset pulse; and

the carbon material is at least partially melted during the set pulse and is cooled to the polycrystalline state at a slower rate than during the reset pulse.

14. A method of programming a nonvolatile memory cell comprising a steering element located in series with a storage element, wherein the storage element comprises a carbon flake material, the method comprising:

applying a reset pulse to the carbon flake material such that carbon flakes separate from each other to increase a resistivity of the carbon flake material from a first state to a second state; and

applying a set pulse to the carbon material such that the carbon flakes contact each other more than in the second state to decrease a resistivity of the carbon flake material from the second state to a third state.

15. The method of claim 14 , wherein:

a fall time of the reset pulse is shorter than a fall time of the set pulse;

during the shorter reset pulse fall time, the carbon flakes are not in a potential energy minimum state as a function of interflake distance and are locked into the second resistivity state;

during the longer set pulse fall time, the carbon flakes are in a potential energy minimum state as a function of interflake distance and are locked into the third resistivity state.

16. The method of claim 15 , wherein the carbon flakes are bound to each other after the set pulse.

17. The method of claim 14 , wherein:

the fall time of the reset pulse is 3 to 5 nanoseconds long;

the fall time of the set pulse is between 10 and 100 microseconds long;

the reset pulse and set pulse comprise forward bias pulses;

the reset pulse has a larger amplitude than the set pulse;

a duration of the reset pulse is at least ten times shorter than a duration of the set pulse;

the steering element comprises a diode; and

the polycrystalline carbon material comprises a polycrystalline carbon flake resistivity switching material.

18. A method of programming a nonvolatile memory cell comprising a steering element located in series with a storage element, wherein the storage element comprises a non-monolithic carbon material, the method comprising:

applying a reset pulse to change a resistivity state of the carbon material from a first state to a second state which is higher than the first state; and

applying a set pulse to change a resistivity state of the carbon material from the second state to a third state which is lower than the second state, wherein a fall time of both of the reset pulse and the set pulse is 15 ns or less, a rise time of both of the reset pulse and the set pulse is 15 ns or less and a pulse duration of both of the reset pulse and the set pulse is 40 ns or less,

wherein the non-monolithic carbon material comprises carbon nanotubes and the steering element comprises a diode.

Assignments (4)
CHANGE OF NAME Recorded May 25, 2016
From: SANDISK TECHNOLOGIES INC
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 038809/0600 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT LISTED PATENT NUMBER 8853569 TO THE CORRECT PATENT NUMBER 8883569 PREVIOUSLY RECORDED ON REEL 038300 FRAME 0665. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 25, 2016
From: SANDISK 3D LLC
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038520/0552 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2016
From: SANDISK 3D LLC.
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038300/0665 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2008
From: KUMAR, TANMAY; CHEN, XIYING
To: SANDISK 3D LLC
Reel/Frame 022057/0053 →