IP Library Granted Patent US 7,876,607
Granted Patent B2
US 7,876,607 · App. 12/333,530 · Granted Jan 25, 2011

Reading threshold switching memory cells

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,876,607
App. No.
12/333,530
Granted
Jan 25, 2011
Kind
B2
Abstract

Using the voltage across a threshold switching cell to sense the state of the cell, rather than sensing current through the cell, may result in a faster read. In some embodiments, current consumption during reading of conductive states may be reduced by using a capacitor coupled across the cell.

Claims (30)

1. A method comprising:

reading the state of a phase change threshold switching memory cell using a capacitor coupled in parallel with the cell; and

charging said capacitor to a voltage intermediate between two cell states to be distinguished upon reading the cell.

2. The method of claim 1 including determining the charge on the capacitor after coupling said cell across said capacitor.

3. The method of claim 2 including coupling a node of said capacitor to a voltage comparator and comparing a voltage on the node to a reference voltage.

4. The method of claim 3 including making said comparison after a time period has elapsed since coupling said capacitor to said cell.

5. The method of claim 1 including distinguishing between set and reset phase change memory states.

6. The method of claim 1 including distinguishing between levels of a multilevel cell.

7. The method of claim 1 including using parasitic capacitance as said capacitor.

8. A threshold switching memory comprising:

a phase change memory cell;

a capacitor selectively connectable across said cell;

a comparator to compare a voltage across said capacitor to a reference voltage to determine the state of said cell; and

a charging circuit to charge said capacitor to a level intermediate between two cell states to be distinguished upon reading the cell.

9. The memory of claim 8 , said comparator to compare a voltage on said capacitor to a reference voltage after coupling said cell across said capacitor.

10. The memory of claim 9 , said comparator to allow a time period to elapse after connecting said capacitor across said cell before comparing said voltage across said capacitor to said reference voltage.

11. The memory of claim 8 including a comparator to compare a reference voltage intermediate between the states to be distinguished upon reading the cell to a voltage on said capacitor.

12. The memory of claim 8 , said control to distinguish between levels of a multilevel cell.

13. The memory of claim 8 , said control to distinguish between set and reset phase change memory states.

14. The memory of claim 8 wherein said capacitor is parasitic capacitance from the memory itself.

15. The memory of claim 8 , said control to latch the value of the comparison between the voltage on the capacitor and the reference voltage.

16. A memory comprising:

a phase change memory cell;

a switch;

a controller to control said switch;

a capacitor selectively connectable by said switch across said memory cell; and

a charging circuit to charge said capacitor to a level intermediate between two cell states to be distinguished upon reading a cell.

17. The memory of claim 16 including a comparator to compare a voltage across said capacitor to a reference voltage.

18. The memory of claim 16 wherein said capacitor is parasitic capacitance from the memory itself.

19. The memory of claim 8 including a control to control the state of a first switch to couple said capacitor to said cell and a second switch to couple a voltage source to said capacitor.

Assignments (10)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027126/0176 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 18, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027075/0682 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2010
From: TANG, STEPHEN
To: NUMONYX B.V.
Reel/Frame 025504/0163 →