IP Library Granted Patent US 7,817,476
Granted Patent B2
US 7,817,476 · App. 12/342,679 · Granted Oct 19, 2010

Non-volatile memory and method with shared processing for an aggregate of read/write circuits

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Quick Facts
Patent No.
US 7,817,476
App. No.
12/342,679
Granted
Oct 19, 2010
Kind
B2
Abstract

A non-volatile memory device capable of reading and writing a large number of memory cells with multiple read/write circuits in parallel has an architecture that reduces redundancy in the multiple read/write circuits to a minimum. The multiple read/write circuits are organized into a bank of similar stacks of components. Redundant circuits such as a processor for processing data among stacks each associated with multiple memory cells are factored out. The processor is implemented with an input logic, a latch and an output logic. The input logic can transform the data received from either the sense amplifier or the data latches. The output logic further processes the transformed data to send to either the sense amplifier or the data latches or to a controller. This provides an infrastructure with maximum versatility and a minimum of components for sophisticated processing of the data sensed and the data to be input or output.

Claims (28)

1. A non-volatile memory device, comprising:

an array of memory cells;

a set of read/write circuit stacks for operating on a group of memory cells of said array in parallel;

each stack of read/write circuits operating on a subgroup of memory cells in parallel, comprising:

a subgroup of sense amplifiers and data latches cooperating with a processor;

said data latches latching input or output data of said subgroup of sense amplifiers;

each sense amplifier having at least one node with sense amplifier data;

said processor coupled to said at least one node with sense amplifier data and said data latches for processing data therebetween; and wherein said processor further comprising:

an input logic selectively coupled to either said at least one node with sense amplifier data or said data latches to retrieve data therefrom, and responsive to a first set of control signals to generate first resultant data; and

an output logic responsive to a second set of control signals and said first resultant data to generate second resultant data, said processor selectively coupled to either said at least one node with sense amplifier data or said data latches to store said second resultant data thereto.

2. A non-volatile memory device as in claim 1 , wherein said at least one node is a latch.

3. A non-volatile memory device as in claim 1 , further comprising:

at least one processor latch for latching said first resultant data.

4. A non-volatile memory device as in claim 1 , wherein said processor is shared by a plurality of read/write stacks.

5. A non-volatile memory device as in claim 1 , further comprising:

a controller for generating said first and second set of control signals.

6. A non-volatile memory device as in claim 1 , wherein said second resultant data from said processor is latched by said data latches.

7. A non-volatile memory device as in claim 1 , wherein said second resultant data from said processor is received by said at least one node with sense amplifier latch.

8. A non-volatile memory device as in claim 1 , wherein said processor retrieves data from said data latches.

9. A non-volatile memory device as in claim 1 , wherein said processor retrieves data from said at least one node with sense amplifier data.

10. A non-volatile memory device as in claim 1 , wherein said processor retrieves data from one portion of said data latches and stores said second resultant data to another portion of said data latches.

11. A non-volatile memory device as in claim 1 , wherein said processor outputs a status responsive to a predetermined data condition.

12. A non-volatile memory device as in claim 1 , wherein said output logic comprises:

at least one pull-up circuit controlled by PMOS transistors.

13. A non-volatile memory device as in claim 1 , wherein said output logic comprises:

at least one pull-down circuit controlled by NMOS transistors.

14. A non-volatile memory device as in claim 1 , wherein each memory cell stores one bit of data.

15. A non-volatile memory device as in claim 1 , wherein each memory cell stores more than one bit of data.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2024
From: SANDISK TECHNOLOGIES LLC
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 069796/0423 →
CHANGE OF NAME Recorded May 25, 2016
From: SANDISK TECHNOLOGIES INC
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 038809/0600 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2011
From: SANDISK CORPORATION
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 026339/0719 →