Pattern inspection apparatus, pattern inspection method, and computer-readable recording medium storing a program
View Patent ↗A pattern inspection apparatus includes a magnification conversion unit to convert first sample optical image data to higher resolution second sample optical image data, a low-pass filter configured to filter first design image data which has a resolution N times that of the first sample optical image data, an optical filter which calculates third design image data by convolving the second design image data with an optical model function, a coefficient acquisition unit configured to acquire a coefficient of the predetermined optical model function using the second sample optical image data and the third design image data, an optical image acquisition unit configured to acquire actual optical image data of an inspection target workpiece, a reference image data generation unit configured to generate reference image data corresponding to the actual optical image data, and a comparison unit configured to compare the actual optical image data with the reference image data.
1. A pattern inspection method comprising:
inputting first sample optical image data, and converting the first sample optical image data to second sample optical image data which has a resolution N times that of the first sample optical image data, and which has a higher resolution than the first sample optical image data;
inputting first design image data which has a resolution N times that of the first sample optical image data, and which has a higher resolution than the first sample optical image data, and in which a gray level value corresponding to the first sample optical image data is defined, and calculating second design image data by convolving the first design image data with a predetermined low-pass filtering function;
calculating third design image data by convolving the second design image data with a predetermined optical model function;
acquiring a coefficient of the predetermined optical model function by performing a predetermined calculation by using the second sample optical image data and the third design image data;
acquiring actual optical image data of an inspection target workpiece on which a pattern is formed;
generating reference image data corresponding to the actual optical image data of the inspection target workpiece by using the coefficient; and
inputting the actual optical image data, and comparing the actual optical image data with the reference image data to output a comparison result.
2. A non-transitory tangible computer-readable recording medium storing a program to be executed by a computer, the program comprising:
reading first sample optical image data stored in a storage device, and converting the first sample optical image data to second sample optical image data which has a resolution N times that of the first sample optical image data, and which has a higher resolution than the first sample optical image data;
inputting first design image data which has a resolution N times that of the first sample optical image data, and which has a higher resolution than the first sample optical image data, and in which a gray level value corresponding to the first sample optical image data is defined, and calculating second design image data by convolving the first design image data with a predetermined low-pass filtering function;
calculating third design image data by convolving the second design image data with a predetermined optical model function;
acquiring a coefficient of the predetermined optical model function by performing a predetermined calculation by using the second sample optical image data and the third design image data;
generating reference image data corresponding to actual optical image data of an inspection target workpiece, on which a pattern is formed, by using the coefficient; and
inputting the actual optical image data, and comparing the actual optical image data with the reference image data to output a comparison result.