IP Library Granted Patent US 8,281,266
Granted Patent B2
US 8,281,266 · App. 12/365,010 · Granted Oct 2, 2012

Systematic, normalized metric for analyzing and comparing optimization techniques for integrated circuits employing voltage scaling and integrated circuits designed thereby

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Quick Facts
Patent No.
US 8,281,266
App. No.
12/365,010
Granted
Oct 2, 2012
Kind
B2
Abstract

Various embodiments of methods of designing an integrated circuit (IC). One embodiment of one such method includes: (1) generating a functional design for the IC, (2) determining performance objectives for the IC, (3) determining an optimization target voltage for the IC, (4) determining whether the IC needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the IC is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to synthesize a layout from the functional IC design that meets the performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof and (6) performing a timing signoff of the layout at the optimization target voltage.

Claims (53)

1. A method of designing an integrated circuit, comprising:

generating a functional design for said integrated circuit;

determining performance objectives for said integrated circuit;

determining an optimization target voltage for said integrated circuit;

determining whether said integrated circuit needs voltage scaling to achieve said performance objectives at said optimization target voltage and, if so, whether said integrated circuit is to employ static voltage scaling or adaptive voltage scaling;

using said optimization target voltage to synthesize a layout from said functional integrated circuit design that meets said performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof, wherein said using is performed by a processor, wherein said using includes employing said optimization target voltage to synthesize a netlist from said functional integrated circuit design that meets said performance objectives; and

performing a timing signoff of said layout at said optimization target voltage.

2. The method as recited in claim 1 wherein said using comprises

generating a layout of said integrated circuit from said netlist.

3. The method as recited in claim 1 wherein said performance objectives include one selected from the group consisting of:

a target power consumption,

a target area, and

a target speed.

4. The method as recited in claim 1 wherein said using comprises:

synthesizing a clock tree for said integrated circuit; and

determining a routing at said optimization target voltage.

5. The method as recited in claim 1 wherein said determining whether said integrated circuit needs said voltage scaling is carried out with respect to more than one fabrication technology, said performance/power quantifier being normalized across said more than one fabrication technology.

6. The method as recited in claim 1 wherein said adaptive voltage scaling is capable of being carried out without software control.

7. The method as recited in claim 1 wherein said using comprises decreasing an area of a safe zone associated with said integrated circuit.

8. An integrated circuit designed by the method as recited in claim 1 .

9. A method of designing an integrated circuit, comprising:

generating a functional design for said integrated circuit;

determining performance objectives for said integrated circuit, said performance objectives including one selected from the group consisting of:

a target power consumption,

a target area, and

a target speed;

determining an optimization target voltage for said integrated circuit;

determining whether said integrated circuit needs voltage scaling to achieve said performance objectives at said optimization target voltage and, if so, whether said integrated circuit is to employ static voltage scaling or adaptive voltage scaling;

using said optimization target voltage to synthesize a netlist from said functional integrated circuit design that meets said performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof, wherein said using is performed by a processor;

synthesizing a clock tree for said integrated circuit;

determining a routing at said optimization target voltage;

generating a layout of said integrated circuit from said netlist; and

performing a timing signoff of said layout at said optimization target voltage.

10. The method as recited in claim 9 wherein said determining whether said integrated circuit needs said voltage scaling is carried out with respect to more than one fabrication technology, said performance/power quantifier being normalized across said more than one fabrication technology.

11. The method as recited in claim 9 wherein said adaptive voltage scaling is capable of being carried out without software control.

12. The method as recited in claim 9 wherein said using comprises decreasing an area of a safe zone associated with said integrated circuit.

13. An integrated circuit designed by the method as recited in claim 9 .

14. A computer program product, comprising a non-transitory computer usable medium having a computer readable program code embodied therein, said computer readable program code adapted to be executed to implement a method of designing an integrated circuit, said method comprising: generating a functional design for said integrated circuit;

determining performance objectives for said integrated circuit;

determining an optimization target voltage for said integrated circuit;

determining whether said integrated circuit needs voltage scaling to achieve said performance objectives at said optimization target voltage and, if so, whether said integrated circuit is to employ static voltage scaling or adaptive voltage scaling;

using said optimization target voltage to synthesize a layout from said functional integrated circuit design that meets said performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof, wherein said using includes employing said optimization target voltage to synthesize a netlist from said functional integrated circuit design that meets said performance objectives; and

performing a timing signoff of said layout at said optimization target voltage.

15. A computer program product, comprising a non-transitory computer usable medium having a computer readable program code embodied therein, said computer readable program code adapted to be executed to implement a method of designing an integrated circuit, said method comprising: generating a functional design for said integrated circuit;

determining performance objectives for said integrated circuit, said performance objectives including one selected from the group consisting of:

a target power consumption, a target area, and a target speed;

determining an optimization target voltage for said integrated circuit;

determining whether said integrated circuit needs voltage scaling to achieve said performance objectives at said optimization target voltage and, if so, whether said integrated circuit is to employ static voltage scaling or adaptive voltage scaling;

using said optimization target voltage to synthesize a netlist from said functional integrated circuit design that meets said performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof;

synthesizing a clock tree for said integrated circuit;

determining a routing at said optimization target voltage;

generating a layout of said integrated circuit from said netlist; and

performing a timing signoff of said layout at said optimization target voltage.

Assignments (10)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 059720/0223 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044887/0109 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: AGERE SYSTEMS LLC
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035365/0634 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
CERTIFICATE OF CONVERSION Recorded Aug 23, 2012
From: AGERE SYSTEMS INC.
To: AGERE SYSTEMS LLC
Reel/Frame 028840/0405 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2009
From: JAMANN, JOSEPH J.; PARKER, JAMES C.; RAO, VISHWAS M.
To: AGERE SYSTEMS INC.
Reel/Frame 022199/0614 →