IP Library › Granted Patent US 8,619,485
Granted Patent B2
US 8,619,485 · App. 12/367,216 · Granted Dec 31, 2013

Power management control and controlling memory refresh operations

Inventor: Dean A. Klein (Eagle, ID)
Assignee: Round Rock Research, LLC
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Quick Facts
Patent No.
US 8,619,485
App. No.
12/367,216
Granted
Dec 31, 2013
Kind
B2
Abstract

A memory device providing signals indicating when refresh operations are complete. The signals from a number of memory devices can be combined, such as by Oring, to provide a refresh complete signal to a power management controller. Dynamic factors can affect the refresh operation and the memory may be refreshed without restoring the entire system to a high power state. The time required to perform a refresh operation can be determined dynamically, allowing the system to be returned to a low power state as soon as refresh is complete. Ambient temperatures can be monitored to dynamically determine when to perform a refresh operation.

Claims (32)

1. A memory refresh circuit comprising:

a control circuit for monitoring memory devices and for indicating when a refresh operation on the memory devices is complete, based on the monitoring of the memory device; and

a power management circuit coupled to memory devices for controlling power provided to the memory devices.

2. The circuit of 1 , wherein the control conducts the refresh operation on the memory devices.

3. The circuit of claim 1 , wherein the memory circuit can perform a burst self-refresh operation.

4. The circuit of claim 3 , wherein the memory refresh circuit performs the burst self-refresh operation if the control circuit senses certain conditions.

5. The circuit of claim 1 , wherein the memory refresh circuit includes a refresh counter.

6. The circuit of claim 5 , wherein the control circuit controls the refresh counter.

7. The circuit of claim 5 , wherein the refresh counter provides a signal indicating when said refresh operation is complete.

8. A memory device comprising:

a memory array; and

a refresh circuit for monitoring the memory array for indicating when a refresh operation on the memory array is complete, based on the monitoring of the memory device; and

a power management circuit coupled to a memory device comprising the memory array for controlling power provided to the memory device.

9. The device of claim 8 , wherein the refresh circuit includes a control circuit.

10. The device of claim 9 , wherein the refresh circuit can perform a burst self-refresh operation.

11. The device of claim 10 , wherein the refresh circuit performs the burst self-refresh operation if the control circuit senses certain conditions.

12. The device of claim 9 , wherein the refresh circuit includes a refresh counter.

13. The device of claim 12 , wherein the control circuit controls the refresh counter.

14. The device of claim 12 , wherein the refresh counter provides a signal indicating when said refresh operation is complete.

15. The device of claim 8 , wherein the refresh circuit controls a memory refresh operation on the memory array.

16. A memory system, comprising:

a plurality of memory devices, each comprising:

a memory array; and

a refresh circuit for monitoring the memory array and for providing a refresh complete signal when a refresh operation on the memory array is complete, based on the monitoring of the memory device; and

a power management circuit coupled to memory devices for controlling power provided to the memory devices.

17. The memory system of claim 16 ,

further comprising a combining circuit for combining the refresh complete signals from the memory devices.

18. The memory system of claim 16 , wherein the refresh circuit includes a fresh counter.

19. The memory system of claim 16 , further comprising a temperature integration circuit for incorporating temperature into determining when a refresh operation should be performed.

20. The memory of claim 19 , wherein the temperature integration circuit is adapted to receive signals from a temperature sensor for measuring temperature.

21. The memory system of claim 20 , wherein the temperature sensor is located outside the memory system.

22. The memory system of claim 20 , wherein the temperature sensor is located inside the memory system.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2011
From: MICRON TECHNOLOGY, INC.
To: ROUND ROCK RESEARCH, LLC
Reel/Frame 026445/0017 →
Continuity (2)
Continuation 10796111 · Mar 10, 2004
Related Publication 20090147608A1 · Jun 11, 2009