Patent Assignment
Reel/Frame 026445/0017
Assignment of Assignor's Interest
Recorded: 2011-06-14
Pages: 13
Assignor
MICRON TECHNOLOGY, INC.
Executed: 2011-05-20
Assignee
ROUND ROCK RESEARCH, LLC
26 DEER CREEK LANE, MOUNT KISCO, NEW YORK, 10549
Covered Properties
(48)
Memory System Having Non-Volatile Data Storage Structure for Memory Control Parameters and Method
Patent:
5,627,784 →
Application:
08/508,923 →
Memory System Having Non-Volatile Data Storage Structure for Memory Control Parameters and Method
Patent:
5,880,996 →
Application:
08/850,582 →
Phase Detector for Reducing Noise
Arbitration System and Method for Memory Responses in a Hub-Based Memory System
Voltage Translator for Multiple Voltage Operations
Memory Device Having Strobe Terminals with Multiple Functions
Generation of Memory Test Patterns for Dll Calibration
Providing Memory Test Patterns for Dll Calibration
Power Management Control and Controlling Memory Refresh Operations
Memory Device and Method Having Banks of Different Sizes
Techniques for Implementing Accurate Operating Current Values Stored in a Database
Memory Hub and Method for Memory Sequencing
Reconstruction of Signal Timing in Integrated Circuits
Reducing Dq Pin Capacitance in a Memory Device
Memory Device and Method Having Banks of Different Sizes
Memory Device and Method Having Banks of Different Sizes
Phase Detector for Reducing Noise
Phase Detector for Reducing Noise
Memory Device and Method Having Multiple Address, Data and Command Buses
Techniques for Implementing Accurate Operating Current Values Stored in a Database
Voltage Translator for Multiple Voltage Operations
Arbitration System and Method for Memory Responses in a Hub-Based Memory System
Reducing Dq Pin Capacitance in a Memory Device
Techniques for Implementing Accurate Operating Current Values Stored in a Database
Reducing Dq Pin Capacitance in a Memory Device
Arbitration system and method for memory responses in a hub-based memory system
Application:
11/499,232 →
Publication:
US 2006/0271746
Variable Quantization Adc for Image Sensors
Phase Detector for Reducing Noise
Interleaved Input Signal Path for Multiplexed Input
Memory Hub and Method for Memory Sequencing
Reconstruction of Signal Timing in Integrated Circuits
Interleaved Memory Program and Verify Method, Device and System
Increased Nand Flash Memory Read Throughput
Reconstruction of Signal Timing in Integrated Circuits
Memory Device and Method Having Banks of Different Sizes
Memory Device and Method Having Multiple Address, Data and Command Buses
Techniques for Implementing Accurate Device Parameters Stored in a Database
Memory Hub and Method for Memory Sequencing
Phase Detector for Reducing Noise
Interleaved Input Signal Path for Multiplexed Input
Power Management Control and Controlling Memory Refresh Operations
Memory Device Having Strobe Terminals with Multiple Functions
Increased Nand Flash Memory Read Throughput
Interleaved Memory Program and Verify Method, Device and System
Techniques for Implementing Accurate Device Parameters Stored in a Database
Memory Device Having Strobe Terminals with Multiple Functions
Interleaved Memory Program and Verify Method, Device and System
Increased Nand Flash Memory Read Throughput
Related Assignments
(14)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 27, 1995
From: HARRIS, FRANK W.; COLE, KENNETH A.
To: STAODYN, INC.
Reel/Frame 007601/0323 →
Assignment of Assignor's Interest
Apr 8, 1996
From: ROOHPARVAR, FRANKIE F.
To: MICRON QUANTUM DEVICES, INC.
Reel/Frame 007885/0737 →
Assignment of Assignor's Interest
Jul 21, 2003
From: LIN, FENG
To: MICRON TECHNOLOGY, INC.
Reel/Frame 014322/0096 →
Assignment of Assignor's Interest
Oct 20, 2003
From: MEYER, JAMES W.; KANSKI, CORY
To: MICRON TECHNOLOGY, INC.
Reel/Frame 014645/0265 →
Assignment of Assignor's Interest
Dec 12, 2003
From: CORDOBA, MICHAEL V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 014809/0153 →
Assignment of Assignor's Interest
Jan 22, 2004
From: CHOI, JOO S; MANNING, TROY A.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 014933/0993 →
Assignment of Assignor's Interest
Jan 28, 2004
From: SWANSON, TRAVIS; ROONEY, JEFF
To: MICRON TECHNOLOGY, INC.
Reel/Frame 015058/0014 →
Assignment of Assignor's Interest
Mar 10, 2004
From: KLEIN, DEAN A.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 015087/0653 →
Assignment of Assignor's Interest
Mar 18, 2004
From: SKIDMORE, BETH E.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 015120/0557 →
Assignment of Assignor's Interest
Apr 1, 2004
From: JANZEN, JEFFERY W.; SCHAEFER, SCOTT; FARRELL, TODD D.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 015181/0595 →
Assignment of Assignor's Interest
May 14, 2004
From: JEDDELOH, JOSEPH M.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 015342/0156 →
Assignment of Assignor's Interest
May 20, 2004
From: SWANSON, TRAVIS; GREEFF, ROY
To: MICRON TECHNOLOGY, INC.
Reel/Frame 015344/0364 →
Assignment of Assignor's Interest
Aug 19, 2004
From: IVANOV, IVAN I.
To: MICRON TECHNOLOGY INC.
Reel/Frame 015716/0473 →
Assignment of Assignor's Interest
Dec 10, 2004
From: BA, BEN
To: MICRON TECHNOLOGY, INC.
Reel/Frame 016085/0232 →