Pattern image correcting apparatus, pattern inspection apparatus, and pattern image correcting method
View Patent ↗The present invention provides an apparatus and method for correcting an inspection reference pattern image in order to properly inspect a pattern image of a specimen. The pattern image correcting apparatus is characterized by including: a first pattern synthesizing unit for synthesizing an assist pattern image and a pattern image to be inspected, thereby generating a pattern image to be inspected with an assist pattern; an assist pattern shift processor; a second pattern synthesizing unit for synthesizing the shifted assist pattern image and the inspection reference pattern image, thereby generating an inspection reference pattern image with an assist pattern; a model generating unit for generating a position shift model by using the pattern image to be inspected with the assist pattern and the inspection reference pattern image with the assist pattern; and a correction pattern image computing unit for correcting the inspection reference pattern image.
1. A pattern image correcting apparatus for correcting an inspection reference pattern image in a pattern inspection, comprising:
a first pattern synthesizing unit for synthesizing an assist pattern image and a pattern image to be inspected, thereby generating a pattern image to be inspected with an assist pattern;
an assist pattern shift processing unit for shifting the assist pattern image on the basis of an amount of a relative positional deviation between the inspection reference pattern image and the pattern image to be inspected;
a second pattern synthesizing unit for synthesizing the shifted assist pattern image and the inspection reference pattern image, thereby generating an inspection reference pattern image with an assist pattern;
a model generating unit for generating a position shift model by using the pattern image to be inspected with the assist pattern and the inspection reference pattern image with the assist pattern; and
a correction pattern image computing unit for correcting the inspection reference pattern image on the basis of the position shift model.
2. The apparatus according to claim 1 , wherein the model generating unit comprises:
a simultaneous equation generating unit for generating simultaneous equations based on a prediction model by using the pattern image to be inspected with the assist pattern and the inspection reference pattern image with the assist pattern; and
a coefficient computing unit for computing a coefficient by which data of the inspection reference pattern image is multiplied by solving the simultaneous equations, and
the correction pattern image computing unit corrects the inspection reference pattern image by using the coefficient.
3. The apparatus according to claim 1 , wherein at least one assist pattern image is selected from a plurality of assist pattern images prepared in advance on the basis of the pattern image to be inspected.
4. The apparatus according to claim 2 , wherein at least one assist pattern image is selected from a plurality of assist pattern images prepared in advance on the basis of the pattern image to be inspected.
5. A pattern inspection apparatus, comprising the pattern image correcting apparatus according to claim 1 .
6. A pattern inspection apparatus, comprising the pattern image correcting apparatus according to claim 4 .
7. A pattern image correcting method of correcting an inspection reference pattern image in a pattern inspection, comprising:
a first pattern synthesizing step of synthesizing an assist pattern image and a pattern image to be inspected, thereby generating a pattern image to be inspected with an assist pattern;
an assist pattern shift processing step of shifting the assist pattern image on the basis of an amount of a relative positional deviation between the inspection reference pattern image and the pattern image to be inspected;
a second pattern synthesizing step of synthesizing the shifted assist pattern image and the inspection reference pattern image, thereby generating an inspection reference pattern image with an assist pattern;
a model generating step of generating a position shift model by using the pattern image to be inspected with the assist pattern and the inspection reference pattern image with the assist pattern; and
a correction pattern image computing step of correcting the inspection reference pattern image on the basis of the position shift model.
8. The method according to claim 7 , wherein the model generating step comprises:
a simultaneous equation generating step of generating simultaneous equations based on a prediction model by using the pattern image to be inspected with the assist pattern and the inspection reference pattern image with the assist pattern; and
a coefficient computing step of computing a coefficient by which data of the inspection reference pattern image is multiplied by solving the simultaneous equations, and
in the correction pattern image computing step, the inspection reference pattern image is corrected by using the coefficient.
9. The method according to claim 7 , further comprising a step of selecting at least one assist pattern image from a plurality of assist pattern images prepared in advance on the basis of the pattern image to be inspected.
10. The method according to claim 8 , further comprising a step of selecting at least one assist pattern image from a plurality of assist pattern images prepared in advance on the basis of the pattern image to be inspected.