IP Library Granted Patent US 9,310,643
Granted Patent B2
US 9,310,643 · App. 12/420,706 · Granted Apr 12, 2016

Method and structure for fabricating smooth mirrors for liquid crystal on silicon devices

Inventors: Roger Lee (Shanghai, CN); Guoqing Chen (Shanghai, CN); Lee Chang (Shanghai, CN)
Assignees: Semiconductor Manufacturing International (Shanghai) Corporation; Semiconductor Manufacturing International (Beijing) Corporation
G02F1/133553G02F1/1368G02F1/136286G02F1/136277
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Quick Facts
Patent No.
US 9,310,643
App. No.
12/420,706
Granted
Apr 12, 2016
Kind
B2
Abstract

A liquid crystal on silicon (LCOS) device includes a semiconductor substrate, a metal-oxide semiconductor (MOS) device layer overlying the semiconductor substrate, a planarized interlayer dielectric layer overlying the MOS device layer, a plurality of recessed regions formed within a portion of the interlayer dielectric layer, a metal layer filling each of the recessed regions to form a plurality of respective electrode plates corresponding to each of the recessed regions. The LCOS device further includes a protective layer overlying a surface of each of the plurality of electrode plates, a liquid crystal film overlying the protective layer, and a mirror finish formed on each of the surface of the electrode plates for reflecting light. The mirror finish is substantially free from dishes and scratches from a chemical mechanical polishing process.

Claims (34)

1. A liquid crystal on silicon (LCOS) device, the device comprising:

a semiconductor substrate;

a metal-oxide semiconductor (MOS) device layer overlying the semiconductor substrate, the MOS device layer having a plurality of MOS devices;

a planarized interlayer dielectric layer overlying the MOS device layer;

a plurality of recessed regions formed within a portion of the planarized interlayer dielectric layer;

an aluminum layer filling each of the recessed regions to form a plurality of respective electrode plates corresponding to each of the recessed regions, the aluminum layer having a smooth surface free from any dimple, each of the electrode plates being coupled to each one of the MOS devices;

a protective layer of only an aluminum oxide layer directly overlying a surface of each of the plurality of electrode plates, the protective layer formed by exposing the electrode plates to an oxidizing fluid;

a liquid crystal film directly overlying the protective layer; and

a mirror finish formed on the surface of each of the electrode plates for reflecting light by a chemical mechanical polishing process, the mirror finish being substantially free from dishes and scratches.

2. The device of claim 1 wherein the mirror finish is characterized by a buffed surface region free from any residual aluminum bearing particles on the protective layer.

3. The device of claim 1 wherein the recessed regions are formed through respective openings in a sacrificial layer.

4. The device of claim 1 wherein the aluminum layer is provided by directionally sputtering.

5. The device of claim 1 wherein the chemical mechanical polishing process is a buffing process.

6. The device of claim 1 wherein the mirror finish is characterized by a reflectivity of 93% and greater.

7. The device of claim 1 wherein each of the recessed regions has a depth ranging from about 2000 Angstroms to about 4000 Angstroms.

8. The device of claim 1 wherein the planarized interlayer dielectric layer comprises Borophosphosilicate glass (BPSG).

9. The device of claim 1 wherein each of the electrode plates is characterized by a size of about eight by eight microns in dimension.

10. The device of claim 1 further comprising:

an overlying transparent electrode layer on the liquid crystal film; and

an overlying glass layer overlying the transparent electrode layer to form a liquid crystal on silicon display structure overlying the plurality of electrode plates.

11. The device of claim 10 wherein the transparent electrode layer comprises indium tin oxide.

12. A liquid crystal on silicon (LCOS) device, the device comprising:

a semiconductor substrate;

a metal-oxide semiconductor (MOS) device layer overlying the semiconductor substrate, the MOS device layer having a plurality of MOS devices;

a planarized interlayer dielectric layer overlying the MOS device layer;

a plurality of recessed regions within a portion of the planarized interlayer dielectric layer;

an aluminum layer to fill the plurality of recessed regions to form a plurality of respective electrode plates corresponding to each of the recessed regions, the electrode plates having a smooth surface free from any dimple, each of the electrode plates being respectively coupled to at least one of the MOS devices among the plurality of MOS devices;

a protective layer of only an aluminum oxide layer formed by treating a surface of the aluminum layer with an oxidizing fluid;

a liquid crystal film directly overlying the protective layer;

a mirror finish on the surface of each of the electrode plates.

13. The device of claim 12 further comprising:

an overlying transparent electrode layer on the liquid crystal film; and

a glass layer overlying the transparent electrode layer to form a liquid crystal on silicon display structure overlying the plurality of electrode plates.

14. The device of claim 13 wherein the transparent electrode layer comprises indium tin oxide.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2013
From: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
To: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION; SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
Reel/Frame 029625/0763 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 23, 2010
From: LEE, ROGER; CHEN, GUOQING; CHANG, LEE
To: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
Reel/Frame 024874/0547 →
Priority Claims (1)
CN 2004 1 0024969 · Jun 2, 2004 · national
Continuity (2)
Division 10927707 · Aug 26, 2004
Related Publication 20090200564A1 · Aug 13, 2009