IP Library Granted Patent US 7,952,069
Granted Patent B2
US 7,952,069 · App. 12/431,265 · Granted May 31, 2011

Mass spectrometer and mass spectrometry method

Assignee: Canon Anelva Corporation
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Quick Facts
Patent No.
US 7,952,069
App. No.
12/431,265
Granted
May 31, 2011
Kind
B2
Abstract

A mass spectrometer includes an ionization chamber, a temperature control unit which controls the temperature in the ionization chamber to vaporize a sample in at least one of solid and liquid state in the ionization chamber, an introduction unit which introduces the sample into the ionization chamber, an ion supply unit which supplies ions to the ionization chamber to ionize, in the ionization chamber, the sample vaporized in the ionization chamber, and a mass analyzer which measures the mass of the molecules of the ionized sample.

Claims (30)

1. A mass spectrometer comprising:

an ionization chamber;

a temperature control unit configured to control a temperature in the ionization chamber to vaporize a sample in at least one of a solid state and the liquid state in the ionization chamber;

an introduction unit configured to introduce the sample using gravitation in at least one of the solid state and the liquid state into the ionization chamber;

an ion supply unit configured to supply metal ions to the ionization chamber to ionize, in the ionization chamber, the sample vaporized in the ionization chamber; and

a mass analyzer configured to measure a mass of molecules of the ionized sample.

2. The spectrometer according to claim 1 , wherein the sample is vaporized and ionized in a vaporization region in the ionization chamber.

3. The spectrometer according to claim 2 , wherein the vaporization region is a central region of the ionization chamber.

4. The spectrometer according to claim 1 , wherein the sample in at least one of the solid state and the liquid state introduced into the ionization chamber has a particle size that is not less than 1 micrometer and not greater than 10 micro meter.

5. The spectrometer according to claim 1 , further comprising a first cell and a second cell which are evacuated by an exhaust unit,

wherein the second cell is connected to the first cell via an aperture, and

the ionization chamber is provided in the first cell, and the mass analyzer is provided in the second cell.

6. The spectrometer according to claim 1 , wherein the sample is introduced into the ionization chamber as fine particles.

7. The spectrometer according to claim 1 , wherein the sample is immobilized on a surface of a particulate carrier and introduced into the ionization chamber.

8. The spectrometer according to claim 1 , wherein the ionization chamber has an outlet.

9. The spectrometer according to claim 1 , wherein the temperature control unit includes a heater.

10. The spectrometer according to claim 1 , further comprising:

a holder which holds the sample;

a mechanism which drops the sample held by the holder; and

a focusing structure arranged between the holder and the ionization chamber,

wherein the focusing structure is configured to focus the sample to be supplied to the ionization chamber.

11. The spectrometer according to claim 10 , further comprising a vibrator configured to vibrate the holder.

12. The spectrometer according to claim 1 , wherein

the ion supply unit comprises an emitter configured to emit metal ions when heated, and

the molecules of the vaporized sample are ionized by the metal ions that enter the ionization chamber from the emitter and attach to the molecules.

13. A mass spectrometry method comprising the steps of:

controlling a temperature in an ionization chamber to vaporize a sample in at least one of a solid state and a liquid state in the ionization chamber;

introducing the sample into the ionization chamber using gravitation;

ionizing the sample with metal ions, in the ionization chamber, the sample being vaporized in the ionization chamber; and

measuring a mass of molecules of the ionized sample.

Assignments (2)
MERGER Recorded Apr 21, 2010
From: CANON ANELVA ENGINEERING CORPORATION; CANON ANELVA TECHNIX CORPORATION
To: CANON ANELVA CORPORATION
Reel/Frame 024264/0403 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 7, 2009
From: SHIOKAWA, YOSHIRO; NAKAMURA, MEGUMI; MARUYAMA, HARUMI; WADA, AIKO
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 022649/0931 →
Priority Claims (1)
JP 2008-119042 · Apr 30, 2008 · national
Continuity (1)
Related Publication 20090272894A1 · Nov 5, 2009