IP Library › Assignment 024264/0403
Patent Assignment
Reel/Frame 024264/0403

Merger

Recorded: 2010-04-21 Pages: 9
Assignors
CANON ANELVA TECHNIX CORPORATION
Executed: 2010-02-01
Assignee
CANON ANELVA CORPORATION
2-5-1 KURIGI, ASAO-KU, KAWASAKI-SHI, 215-8550, JAPAN
Covered Properties (17)
Cooling Trap Unit
Application: 12/254,424 →
Publication: US 2009/0107154
Electrostatic Capacitance Diaphragm Type Pressure Sensor
Application: 12/260,055 →
Publication: US 2009/0114029
Cryopump Apparatus and Operation Method Therefor
Application: 12/260,439 →
Publication: US 2009/0126374
Cooling Apparatus and Vacuum Cooling Apparatus
Patent: 7,984,618 →
Application: 12/339,760 →
Publication: US 2009/0165465
Cryopump, Cryopump Unit, Vacuum Processing Apparatus Including Cryopump Unit, and Cryopump Regeneration Method
Application: 12/339,808 →
Publication: US 2009/0165470
Substrate Heating Apparatus, Heating Method, and Semiconductor Device Manufacturing Method
Patent: 7,897,523 →
Application: 12/360,378 →
Publication: US 2009/0191724
Heating Apparatus, Heating Method, and Semiconductor Device Manufcaturing Method
Patent: 8,032,015 →
Application: 12/368,525 →
Publication: US 2009/0202231
Substrate Heating Apparatus, Semiconductor Device Manufacturing Method, and Semiconductor Device
Application: 12/391,345 →
Publication: US 2009/0218579
Electrostatic Capacitance Diaphragm Vacuum Gauge and Vacuum Processing Apparatus
Patent: 7,841,239 →
Application: 12/404,720 →
Publication: US 2009/0235752
Internal Standard Material, Resin Composition, and Measurement Method
Patent: 8,164,051 →
Application: 12/423,462 →
Publication: US 2009/0266981
Ion Attachment Mass Spectrometer and Ion Attachment Mass Spectrometry Method Thereof
Application: 12/427,000 →
Publication: US 2009/0266979
Mass Spectrometer and Mass Spectrometry Method
Patent: 7,952,069 →
Application: 12/431,265 →
Publication: US 2009/0272894
Cryotrap and Vacuum Processing Device with Cryotrap
Application: 12/446,675 →
Publication: US 2010/0011783
Substrate Processing Apparatus, Substrate Annealing Method, and Semiconductor Device Manufacturing Method
Patent: 8,426,323 →
Application: 12/636,928 →
Publication: US 2010/0151695
Capacitance Diaphragm Gauge and Vaccum Apparatus
Application: 12/645,586 →
Publication: US 2010/0154552
Mass Spectrometer System and Mass Spectrometry Method
Patent: 8,049,166 →
Application: 12/645,610 →
Publication: US 2010/0163723
Exhaust system
Application: 12/709,813 →
Publication: US 2010/0186427
Related Assignments (19)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 20, 2008
From: HORIUCHI, HISASHI
To: CANON ANEL VA TECHNIX CORPORATION
Reel/Frame 021734/0160 →
Assignment of Assignor's Interest Oct 29, 2008
From: IDE, YOSUKE
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 021758/0207 →
Assignment of Assignor's Interest Oct 29, 2008
From: ARAI, TOKUMITSU; AOKI, KAZUTOSHI; MOCHIZUKI, ISAO
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 021786/0190 →
Assignment of Assignor's Interest Dec 14, 2008
From: AOKI, KAZUTOSHI; OKADA, TAKAHIRO
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 022033/0011 →
Assignment of Assignor's Interest Dec 19, 2008
From: KUDO, KENJI
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 022050/0050 →
Assignment of Assignor's Interest Jan 30, 2009
From: SHIBAGAKI, MASAMI; DOI, HIROSHI; EGAMI, AKIHIRO; SASAKI, TOSHIAKI
To: CANON ANELVA ENGINEERING CORPORATION; CANON ANELVA CORPORATION
Reel/Frame 022213/0769 →
Assignment of Assignor's Interest Feb 10, 2009
From: SHIBAGAKI, MASAMI; DOI, HIROSHI
To: CANON ANELVA ENGINEERING CORPORATION; CANON ANELVA CORPORATION
Reel/Frame 022233/0770 →
Assignment of Assignor's Interest Feb 24, 2009
From: SHIBAGAKI, MASAMI
To: CANON ANELVA ENGINEERING CORPORATION
Reel/Frame 022300/0857 →
Assignment of Assignor's Interest Apr 15, 2009
From: SHIOKAWA, YOSHIRO; MARUYAMA, HARUMI; NAKAMURA, MEGUMI
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 022547/0731 →
Assignment of Assignor's Interest Apr 28, 2009
From: NAKAMURA, MEGUMI; SHIOKAWA, YOSHIRO; TANEDA, YASUYUKI
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 022602/0867 →
Assignment of Assignor's Interest May 7, 2009
From: SHIOKAWA, YOSHIRO; NAKAMURA, MEGUMI; MARUYAMA, HARUMI; WADA, AIKO
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 022649/0931 →
Assignment of Assignor's Interest May 13, 2009
From: MIYASHITA, HARUZO
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 022705/0589 →
Assignment of Assignor's Interest May 21, 2009
From: AOKI, KAZUTOSHI; OKADA, TAKAHIRO; KOMAI, HISAYOSHI; MOCHIZUKI, ISAO
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 022716/0063 →
Assignment of Assignor's Interest Dec 29, 2009
From: MIYASHITA, HARUZO
To: CANON ANELVA CORPORATION
Reel/Frame 023711/0744 →
Assignment of Assignor's Interest Feb 4, 2010
From: MASAKI, NOBUYUKI; SASUGA, YUICHI; SHIBAGAKI, MASAMI; DOI, HIROSHI
To: CANON ANELVA CORPORATION; CANON ANELVA ENGINEERING CORPORATION
Reel/Frame 023895/0493 →
Assignment of Assignor's Interest Feb 8, 2010
From: SHIOKAWA, YOSHIRO; NAKAMAURA, MEGUMI; MARUYAMA, HARUMI
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 023910/0289 →
Assignment of Assignor's Interest Feb 23, 2010
From: OKADA, TAKAHIRO; ARAI, TOKUMITSU; AOKI, KAZUTOSHI
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 023999/0876 →
Corrective Assignment to Correct the Surname of the Second Inventor from --Nakamaura-- to --Nakamura-- as Previously Recorded on Reel 023910 Frame 0289. Assignor(S) Hereby Confirms the Corrective Assignment. Mar 19, 2010
From: SHIOKAWA, YOSHIRO; NAKAMURA, MEGUMI; MARUYAMA, HARUMI
To: CANON ANELVA TECHNIX CORPORATION
Reel/Frame 024106/0463 →
Security Interest Sep 13, 2011
From: APTIV DIGITAL, INC., A DELAWARE CORPORATION; GEMSTAR DEVELOPMENT CORPORATION, A CALIFORNIA CORPORATION; INDEX SYSTEMS INC, A BRITISH VIRGIN ISLANDS COMPANY; ROVI CORPORATION, A DELAWARE CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027039/0168 →