IP Library Granted Patent US 8,059,482
Granted Patent B2
US 8,059,482 · App. 12/487,791 · Granted Nov 15, 2011

Memory using multiple supply voltages

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Quick Facts
Patent No.
US 8,059,482
App. No.
12/487,791
Granted
Nov 15, 2011
Kind
B2
Abstract

A memory has a method of operating that includes performing operations of a first type and a second type. A first voltage is coupled to a power supply node of a first memory cell of a memory array during a first operation of the first type. The first voltage is decoupled from the power supply node in response to terminating the first operation of the first type so as to allow the power supply node to drift. If the power supply node drifts to a second voltage, a power supply source is coupled to the power supply node. This is useful in reducing power in the circuit that produces the first voltage.

Claims (36)

1. A method of operating a memory for performing operations of a first type and a second type, comprising:

coupling a first voltage at a first level to a power supply node of a first memory cell of a memory array during a first operation of the first type;

decoupling the first voltage from the power supply node in response to terminating the first operation of the first type so as to allow the power supply node to drift; and

in response to detecting that the power supply node drifts to a voltage at a second level, wherein a power supply terminal has a voltage at the second level, coupling the power supply node to the power supply terminal to maintain the power supply node at the second level.

2. The method of claim 1 , further comprising:

if a second operation of the first type is initiated before the power supply node drifts to the second level, coupling the first voltage to the power supply node.

3. The method of claim 1 , further comprising:

generating the first voltage by charge pumping.

4. The method of claim 3 , further comprising performing a first operation of the second type with the power supply node at the second level.

5. The method of claim 4 , wherein the first operation of the first type is a first read operation, further comprising:

if a second read operation is initiated before the power supply node drifts to the second level, coupling the first voltage to the power supply node.

6. The method of claim 3 , wherein the step of generating is further characterized by the charge pumping using the voltage at the power supply terminal to generate the first voltage so that the first level is greater than the second level.

7. The method of claim 1 , further comprising:

coupling a voltage at a third level greater than the second level and less than the first level to the power supply node in response to initiating a first operation of the second type.

8. The method of claim 1 , wherein the memory comprises an integrated circuit and the voltage at the power supply terminal is supplied external to the integrated circuit.

9. The method of claim 1 , wherein the first type is a read, the second type is a write, and the first level is less than the second level.

10. The method of claim 1 , wherein, the step of coupling a power supply node to the power supply terminal results in a voltage at the power supply node such that data present in the first memory cell is retained and the power supply node is able to be charged to the first level so as to perform a read operation of the first memory cell.

11. The method of claim 1 wherein the memory has an array that is arranged in a plurality of columns of memory cells, wherein all memory cells of a first column of the plurality of columns, including the first memory cell, are coupled to the power supply node.

12. The method of claim 1 wherein the memory has an array that is arranged in a plurality of rows of memory cells, wherein all memory cells of a first row of the plurality of rows, including the first memory cell, are coupled to the power supply node.

13. The method of claim 1 wherein the memory has an array of memory cells including the first memory cell, wherein all memory cells of the array are coupled to the power supply node.

14. A memory formed on an integrated circuit, comprising:

a memory array having a plurality of memory cells including a first memory cell having a power supply node;

a first power supply generator, coupled to a power supply terminal, having an output terminal providing a voltage at a first level;

a first switching device that couples the power supply node to the output terminal during a first operation of a first type and decoupling the power supply node from the output terminal in response to a termination of the first operation of the first type; and

a second switching device that couples the power supply node to the power supply terminal in response to detecting that the power supply node has drifted to a voltage at a second level, wherein a voltage present at the power supply terminal has the second level.

15. The memory of claim 14 , wherein the first switching device comprises a first transistor having a control electrode for receiving a read signal, a first current electrode coupled to the power supply node, and a second current electrode coupled to the output terminal.

16. The memory of claim 15 , wherein the second switching device comprises a second transistor having a gate for receiving a power enable signal, a first current electrode coupled to the power supply terminal, and a second current electrode coupled to the power supply node.

17. The memory of claim 16 , further comprising a comparator having a first input coupled to the power supply terminal, a second input coupled to the power supply node, and an output coupled to the gate of the second switching device.

18. The memory of claim 17 , wherein the first type is a read.

19. A method of operating a memory, comprising:

coupling a read voltage to a power supply node of a first memory cell of a memory array during a first read operation, wherein the read voltage is at a first level;

decoupling the read voltage from the power supply node in response to terminating the first read operation to allow the power supply node to drift downward;

coupling a power supply source having a voltage at a second level to the power supply node in response to power supply node drifting to the second level; and

in response to initiating a second read operation, coupling the read voltage to the power supply node.

20. The memory of claim 19 , further comprising:

in response to initiating a write operation, coupling a write voltage having one of a group consisting of the second level and a third level, wherein the third level is different than the second level and less than the first level.

Assignments (20)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
RELEASE OF SECURITY INTEREST Recorded May 29, 2017
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP USA, INC. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 042610/0451 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2017
From: NXP USA, INC.
To: VLSI TECHNOLOGY LLC
Reel/Frame 042374/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0823 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Sep 23, 2009
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 023273/0099 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2009
From: RUSSELL, ANDREW C.; KENKARE, PRASHANT U.; ZHANG, SHAYAN
To: FREESCALE SEMICONDUCTOR, INC.
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