Alignment of trench for MOS
View Patent ↗Manufacturing a power transistor by forming a gate structure on a first layer, forming a trench in the first layer, self aligned with the gate structure, and forming part of the transistor in the trench. By forming a spacer next to the gate, the spacer and gate can be used as a mask when forming the trench, to allow space for a source region next to the gate. The self-aligning rather than forming the gate after the trench means the alignment is more accurate, allowing size reduction. Another aspect involves forming a trench in a first layer, filling the trench, forming a second layer on either side of the trench with lateral overgrowth over the trench, and forming a source region in the second layer to overlap the trench. This overlap can enable the chip area to be reduced.
1. A transistor comprising a trench in a first layer, filled with a material, a second layer formed on either side of the trench with lateral overgrowth over the trench, and a main electrode region formed in the second layer so as to overlap the trench.
2. The transistor of claim 1 , comprising a drift region in the first layer.
3. The transistor of claim 1 , comprising a vertical MOS device having a buried drain or source below the first layer.
4. The transistor of claim 1 , comprising a discrete component wherein a drain electrode is connected at the backside of the component.
5. The transistor of claim 1 , comprising a power transistor having multiple cells, each cell having a trench.