IP Library Granted Patent US 9,035,473
Granted Patent B2
US 9,035,473 · App. 12/568,487 · Granted May 19, 2015

Circuit device and method of manufacturing the same

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Quick Facts
Patent No.
US 9,035,473
App. No.
12/568,487
Granted
May 19, 2015
Kind
B2
Abstract

Provided are a thin circuit device with show-through of thin metal wires prevented and a method of manufacturing the circuit device. A circuit device mainly includes: a substrate including a first substrate and second substrates; pads formed respectively on upper surfaces of the second substrates; a semiconductor element fixed on an upper surface of the first substrate; thin metal wires each connecting the semiconductor elements and a corresponding one of the pads; and a sealing resin with which the semiconductor element and the thin metal wires are covered, and which thereby seals the circuit device with the semiconductor element and the thin metal wires disposed therein. Furthermore, filler particles located in the uppermost portion of the sealing resin are covered with a resin material constituting the sealing resin.

Claims (33)

1. A circuit device comprising:

a semiconductor element;

a conductive member which is connected to the semiconductor element via a thin metal wire; and

a sealing resin which comprises a resin material mixed with filler particles and which covers the semiconductor element and the thin metal wire, wherein the sealing resin includes a first portion and a second portion, the first portion of the sealing resin below a top portion of the thin metal wire, the second portion of the sealing resin between the top portion of the thin metal wire and a top surface of the sealing resin, and wherein the second portion has a first layer that includes filler particles and a second layer having no filler particles, a thickness of the second layer less than a thickness of the first layer, and

wherein a thickness of the second portion of the sealing resin is smaller than a maximum diameter of the filler particles and wherein the second portion is continuous with the first portion.

2. The circuit device according to claim 1 , wherein the thickness of the sealing resin above the top portion of the thin metal wire is not more than 40 μm.

3. The circuit device according to claim 2 , wherein the top surface of the sealing resin is textured.

4. The circuit device according to claim 3 , wherein each of the filler particles has a spherical shape.

5. The circuit device of claim 1 , wherein the second layer is substantially 8 μm thick.

6. The circuit device of claim 1 , wherein the conductive member is a conductive pattern formed on a principal surface of a substrate, and the sealing resin covers the principal surface of the substrate.

7. The circuit device according to claim 1 wherein an identification mark is engraved in the top surface of the sealing resin, and a depth of the identification mark is not more than 10 μm.

8. A method of manufacturing a circuit device, the method comprising the steps of:

connecting an electrode formed on an upper surface of a semiconductor element to a conductive member via a thin metal wire; and

covering the semiconductor element and the thin metal wire with a sealing resin by injection molding using a mold, the sealing resin including a first portion below a top portion of the thin metal wire, a second portion above the thin metal wire, and a third portion above the second portion, wherein the first portion includes resin material mixed with filler particles, the second portion includes at least some filler particles, and the third portion comprises additional resin material that does not include filler particles;

wherein a thickness from the top portion of the thin metal wire to a top surface of the sealing resin is smaller than a maximum diameter of the filler particles.

9. The method of manufacturing a circuit device according to claim 8 , wherein transfer molding is performed in the covering step, the transfer molding employing a thermosetting resin as the resin material.

10. The method of manufacturing a circuit device according to claim 9 , wherein an inner wall of the mold is covered with a release sheet made of the resin material.

11. The method of manufacturing a circuit device according to claim 10 , wherein a surface, facing inward, of the release sheet is a textured surface.

12. The method of manufacturing a circuit device according to claim 11 , further comprising the step of engraving an identification mark in a principal surface of the sealing resin by partially removing the sealing resin by laser irradiation, wherein a depth of the identification mark is not more than 10 μm.

13. The method of claim 8 , wherein covering the semiconductor element comprises covering the semiconductor element so that the third portion is substantially 8 μm thick.

14. A circuit device comprising:

a semiconductor element;

a conductive member which is connected to the semiconductor element via a thin metal wire; and

a sealing resin which comprises a resin material mixed with filler particles and seals the semiconductor element and the thin metal wire,

wherein a thickness of an uppermost portion of the sealing resin is smaller than a maximum diameter of the filler particles, the uppermost portion being defined as a portion of the sealing resin between a top portion of the thin metal wire and a top surface of the sealing resin,

the uppermost portion of the sealing resin is continuous with the rest of the sealing resin, and

the uppermost portion comprises a top layer having no filler particles and a bottom layer having filler particles, a thickness of the top layer being smaller than a thickness of the bottom layer.

15. The circuit device according to claim 14 , wherein the thickness of the uppermost portion of the sealing resin is not more than 40 μm.

16. The circuit device according to claim 15 , wherein the top surface of the sealing resin is textured.

17. The circuit device according to claim 16 , wherein each of the filler particles has a spherical shape.

18. The circuit device of claim 14 , wherein the top layer having no filler particles has a covering thickness of substantially 8 μm.

19. The circuit device of claim 14 , wherein the conductive member is a conductive pattern formed on a principal surface of a substrate, and the sealing resin covers the principal surface of the substrate.

20. The circuit device according to claim 14 , further comprising a cover layer on top of the sealing resin and having a different color than the sealing resin, wherein an identification mark is engraved in the cover layer to expose the sealing resin.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 22, 2014
From: SANYO SEMICONDUCTOR CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032022/0269 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: SANYO ELECTRIC CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 026594/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2009
From: NAKAZATO, ISAO; YOSHIBA, SHIGEHARU; SEKIBATA, TAKASHI
To: SANYO ELECTRIC CO., LTD.; SANYO SEMICONDUCTOR CO., LTD.
Reel/Frame 023407/0029 →