IP Library Granted Patent US 8,169,833
Granted Patent B2
US 8,169,833 · App. 12/572,182 · Granted May 1, 2012

Partitioning process to improve memory cell retention

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Quick Facts
Patent No.
US 8,169,833
App. No.
12/572,182
Granted
May 1, 2012
Kind
B2
Abstract

Subject matter disclosed herein relates to improving memory cell retention for non-volatile flash memory.

Claims (28)

1. A method comprising:

partitioning a non-volatile memory device into a first memory portion and a second memory portion, wherein said first memory portion includes a plurality of memory cells, wherein said plurality of memory cells include tunnel oxide layers;

operating said first memory portion in a standby mode while operating said second memory portion in a read/write mode; and

applying a healing polarization to said first memory portion in said standby mode to redistribute electrical oxide charges in said tunnel oxide layers of said plurality of memory cells of said first memory portion of said non-volatile memory device.

2. The method of claim 1 , wherein said healing polarization is applied to said first memory portion for substantially one second or more.

3. The method of claim 1 , wherein said first memory portion comprises a block of memory cells of said non-volatile memory device.

4. The method of claim 1 , further comprising returning said first memory portion to operate in said read/write mode.

5. The method of claim 4 , further comprising:

subsequent to returning said first memory portion to operate in said read/write mode, applying said healing polarization to said second memory portion; and

returning said second memory portion to operate in said read/write mode.

6. The method of claim 1 , further comprising:

applying said healing polarization process to said first memory portion in response to detecting one or more bit errors from said first memory portion.

7. The method of claim 1 , wherein said applying said healing polarization comprises applying a substantially constant electric field to a control gate of said memory cells of said first memory portion during said standby mode.

8. The method of claim 1 , wherein said healing polarization comprises a pulsed polarization to generate a pulsed electric field between a floating gate and a substrate of said memory cells of said first memory portion during said standby mode.

9. A non-volatile memory device comprising:

a memory cell array including a first memory portion and a second memory portion, wherein said first memory portion includes a plurality of memory cells, wherein said plurality of memory cells include tunnel oxide layers; and

a controller adapted to apply a healing polarization to said first memory portion while said first memory portion operates in a standby mode and while said second memory portion operates in a read/write mode, wherein said healing polarization comprises redistributing electrical oxide charges in said tunnel oxide layers of said plurality of memory cells of said first memory portion of said non-volatile memory device.

10. The non-volatile memory device of claim 9 , wherein said controller is further adapted to apply said healing polarization to said first memory portion for substantially one second or more.

11. The non-volatile memory device of claim 9 , wherein said first memory portion comprises a block of memory cells of said non-volatile memory device.

12. The non-volatile memory device of claim 9 , wherein said healing polarization comprises a substantially constant electric field applied to a control gate of said memory cells of said first memory portion during said standby mode.

13. The non-volatile memory device of claim 9 , wherein said healing polarization comprises a pulsed polarization to generate a pulsed electric field between a floating gate and a substrate of said memory cells of said first memory portion during said standby mode.

14. A system comprising:

a processor to execute one or more applications stored in a memory cell array of a non-volatile memory device, wherein said memory cell array includes a first memory portion and a second memory portion, wherein said first memory portion includes a plurality of memory cells, wherein said plurality of memory cells include tunnel oxide layers; and

a controller to apply a healing polarization to said first memory portion of said memory cell array while said first memory portion operates in a standby mode and while said second memory portion of said memory cell array operates in a read/write mode, wherein said healing polarization comprises redistributing electrical oxide charges in said tunnel oxide layers of said plurality of memory cells of said first memory portion of said non-volatile memory device.

15. The system of claim 14 , wherein said controller is further adapted to apply said healing polarization to said first memory portion for substantially one second or more.

16. The system of claim 14 , wherein said first memory portion comprises a block of memory cells of said non-volatile memory device.

17. The system of claim 14 , wherein said healing polarization comprises a substantially constant electric field applied to a control gate of said memory cells of said first memory portion during said standby mode.

18. The system of claim 14 , wherein said healing polarization comprises a pulsed polarization to generate a pulsed electric field between a floating gate and a substrate of said memory cells of said first memory portion during said standby mode.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027126/0176 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 29, 2010
From: HALABI, SHAUL; SASSON, YANIV; AMIR, NURIEL
To: NUMONYX B.V.
Reel/Frame 024759/0761 →