IP Library Granted Patent US 8,278,614
Granted Patent B2
US 8,278,614 · App. 12/576,489 · Granted Oct 2, 2012

Image sensor and method for manufacturing the same

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Quick Facts
Patent No.
US 8,278,614
App. No.
12/576,489
Granted
Oct 2, 2012
Kind
B2
Abstract

An image sensor and a method of manufacturing an image sensor. An image sensor may include a readout circuitry having a metal line on and/or over a first substrate. An image sensor may include an image sensing part having a first conductive-type conductive layer and/or a second conductive-type conductive layer over a metal line. An image sensor may include a pixel division area formed on and/or over an image sensing part corresponding to a pixel boundary. An image sensor may include a ground contact on and/or over a pixel division area. An image sensor may include a contact plug connected with a sidewall of an image sensing part. A method of manufacturing an image sensor is disclosed.

Claims (37)

1. An apparatus comprising:

a readout circuitry including a metal line over a first substrate;

an image sensing part including a first conductive-type conductive layer and a second conductive-type conductive layer over said metal line;

a pixel division area over said image sensing part corresponding to a pixel boundary; and

a ground contact over said pixel division area.

2. The apparatus of claim 1 , wherein said pixel division area comprises an insulating layer over a first trench formed by removing said image sensing part corresponding to said pixel boundary.

3. The apparatus of claim 1 , wherein said ground contact comprises a metal layer over a second trench formed by removing a portion of said pixel division area to expose a lateral side of said second conductive-type conductive layer, wherein said ground contact contacts a lateral side of said second conductive-type conductive layer.

4. The apparatus of claim 1 , comprising a contact plug over a third trench formed by removing a portion of said image sensing part to expose said metal line.

5. The apparatus of claim 4 , wherein said contact plug contacts said first conductive-type conductive layer.

6. An apparatus comprising:

a readout circuitry including a metal line over a first substrate;

an image sensing part including a first conductive-type conductive layer and a second conductive-type conductive layer over said metal line; and

a contact plug connected with a sidewall of said image sensing part.

7. The apparatus claim 6 , wherein said contact plug is connected to at least two sidewalls of said image sensing part.

8. The apparatus of claim 6 , wherein said contact plug is connected to said first conductive-type conductive layer.

9. The apparatus of claim 6 , wherein said metal line comprises a horizontal width wider than a horizontal width of said image sensing part.

10. The apparatus of claim 6 , comprising a ground contact over a pixel division area of said image sensing part.

11. The apparatus of claim 10 , wherein said ground contact contacts a lateral side of said second conductive-type conductive layer.

12. A method comprising:

forming a readout circuitry including a metal line over a first substrate;

forming an image sensing part including a first conductive-type conductive layer and a second conductive-type conductive layer over said metal line; and

forming a contact plug connected to a sidewall of said image sensing part.

13. The method of claim 12 , wherein said contact plug is connected to at least two sidewalls of said image sensing part.

14. The method of claim 12 , wherein said contact plug is connected to said first conductive-type conductive layer.

15. The method of claim 12 , wherein forming said contact plug comprises:

forming a first trench to expose said metal line by removing a portion of a pixel boundary of said image sensing part;

forming a metal layer over said first trench; and

etching a portion of said metal layer to form said contact plug at said sidewall.

16. The method of claim 15 , wherein etching said portion of said metal layer comprises an etch-back process performed with respect to said metal layer such that said contact plug is formed at said sidewall of said image sensing part.

17. The method of claim 12 , wherein said metal line comprises a horizontal width wider than a horizontal width of said image sensing part.

18. The method of claim 12 , comprising forming a ground contact over a pixel division area of said image sensing part.

19. The method of claim 18 , wherein forming said ground contact comprises:

removing a portion of said pixel division area to expose a lateral side of said second conductive-type conductive layer; and

forming said ground contact contacting said lateral side of said second conductive-type conductive layer.

20. The method of claim 18 , wherein forming said ground contact comprises:

forming a second trench by removing a portion of said pixel division area to expose a lateral side of said second conductive-type conductive layer; and

filling a metal layer over said second trench such that said ground contact contacts said lateral side of said second conductive-type conductive layer.

Assignments (4)
CHANGE OF NAME Recorded Nov 3, 2021
From: CONVERSANT INTELLECTUAL PROPERTY INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 058793/0785 →
RELEASE OF SECURITY INTEREST Recorded Nov 11, 2020
From: CPPIB CREDIT INVESTMENTS INC.
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 054385/0435 →
AMENDED AND RESTATED U.S. PATENT SECURITY AGREEMENT (FOR NON-U.S. GRANTORS) Recorded Aug 22, 2018
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: CPPIB CREDIT INVESTMENTS, INC.
Reel/Frame 046900/0136 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 11, 2017
From: DONGBU HITEK CO. LTD.; DONGBU ELECTRONICS CO., LTD.
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 041330/0143 →