IP Library Granted Patent US 8,120,059
Granted Patent B2
US 8,120,059 · App. 12/585,109 · Granted Feb 21, 2012

Nitride semiconductor substrate and method of fabricating the same

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Quick Facts
Patent No.
US 8,120,059
App. No.
12/585,109
Granted
Feb 21, 2012
Kind
B2
Abstract

A nitride semiconductor substrate includes a front surface, a rear surface on an opposite side to the front surface, and a first edge portion including a chamfered edge on the front surface. A ratio of an average surface roughness of the front surface to an average surface roughness of the first edge portion is not more than 0.01.

Claims (20)

1. A nitride semiconductor substrate, comprising:

a front surface;

a rear surface on an opposite side to the front surface; and

a first edge portion comprising a chamfered edge on the front surface,

wherein a ratio of an average surface roughness of the front surface to an average surface roughness of the first edge portion is not more than 0.01.

2. The nitride semiconductor substrate according to claim 1 , further comprising:

a second edge portion comprising a chamfered edge on the rear surface,

wherein a ratio of an average surface roughness of the rear surface to an average surface roughness of the second edge portion is not more than 0.01.

3. The nitride semiconductor substrate according to claim 2 , wherein

the first edge portion has a visible light transmissivity not more than 0.2 times that of the front surface.

4. The nitride semiconductor substrate according to claim 3 , wherein

the second edge portion has a visible light transmissivity not more than 0.2 times that of the rear surface.

5. A method of fabricating a nitride semiconductor substrate, comprising:

mirror finishing a front surface of a substrate comprising a nitride semiconductor; and

forming a first edge portion by chamfering an edge of the front surface of the substrate,

wherein the first edge portion is formed such that a ratio of an average surface roughness of the front surface to an average surface roughness of the first edge portion is not more than 0.01, and the first edge portion has a visible light transmissivity not more than 0.2 times that of the front surface.

6. The method according to claim 5 , further comprising:

mirror finishing a rear surface on an opposite side to the front surface; and

forming a second edge portion by chamfering an edge of the rear surface of the substrate,

wherein the second edge portion is formed such that a ratio of an average surface roughness of the rear surface to an average surface roughness of the second edge portion is not more than 0.01, and the second edge portion has a visible light transmissivity not more than 0.2 times that of the rear surface.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 16, 2016
From: SCIOCS COMPANY LIMITED
To: SUMITOMO CHEMICAL COMPANY, LIMITED
Reel/Frame 037827/0453 →
COMPANY SPLIT Recorded Jul 24, 2015
From: HITACHI METALS, LTD.
To: SCIOCS COMPANY LIMITED
Reel/Frame 036181/0104 →
MERGER AND CHANGE OF NAME Recorded Dec 15, 2014
From: HITACHI CABLE, LTD.; HITACHI METALS, LTD.
To: HITACHI METALS, LTD.
Reel/Frame 034630/0897 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2009
From: WATANABE, KAZUTOSHI; YOSHIDA, TAKEHIRO
To: HITACHI CABLE, LTD.
Reel/Frame 023232/0922 →