IP Library Granted Patent US 8,129,226
Granted Patent B2
US 8,129,226 · App. 12/599,625 · Granted Mar 6, 2012

Power lead-on-chip ball grid array package

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,129,226
App. No.
12/599,625
Granted
Mar 6, 2012
Kind
B2
Abstract

A packaging assembly ( 30 ), such as a ball grid array package, is formed which distributes power across an interior region of an integrated circuit die ( 52 ) by using an encapsulated patterned leadframe conductor ( 59 ) that is disposed over the die ( 52 ) and bonded to a plurality of bonding pads ( 45 ) formed in a BGA carrier substrate ( 42 ) and in the interior die region, thereby electrically coupling the interior die region to an externally provided reference voltage.

Claims (44)

1. A method for making a package assembly comprising:

providing a carrier substrate having a plurality of reference voltage terminal package landing pads and a plurality of signal line package landing pads formed on a first surface of the carrier substrate;

attaching an integrated circuit die to the first surface of the carrier substrate where the integrated circuit die comprises an active surface having a plurality of die level reference voltage supply terminals and a plurality of die level signal terminals;

affixing a conductive structure of a first leadframe power conductor to at least two of the reference voltage terminal package landing pads so that the conductive structure of the first leadframe power conductor is electrically connected to the reference voltage terminal package landing pads and disposed over an interior region of the integrated circuit die;

electrically connecting the conductive structure of the first leadframe power conductor to the plurality of die level reference voltage supply terminals in the interior region of the integrated circuit die;

encapsulating the integrated circuit die and first leadframe power conductor to completely enclose the first leadframe power conductor;

wherein electrically connecting the conductive structure of the first leadframe power conductor to the plurality of die level reference voltage supply terminals comprises wirebonding the plurality of die level reference voltage supply terminals to the conductive structure of the first leadframe power conductor with a plurality of wirebond conductors prior to encapsulating the integrated circuit die.

2. The method of claim 1 , where attaching the integrated circuit die to the first surface of the carrier substrate comprises attaching the integrated circuit die so that the active surface of the integrated circuit die faces away from the first surface of the carrier substrate.

3. The method of claim 1 , further comprising wirebonding the plurality of signal line package landing pads to the plurality of die level signal terminals on the integrated circuit die prior to encapsulating the integrated circuit die.

4. The method of claim 1 , further comprising affixing a second leadframe power conductor to at least two different reference voltage terminal package landing pads so that the second leadframe power conductor is electrically connected to the at least two different reference voltage terminal package landing pads and disposed over the interior region of the integrated circuit die.

5. The method of claim 4 , where the conductive structure of the first leadframe power conductor is electrically connected to a first reference voltage and the second leadframe power conductor is electrically connected to a second reference voltage.

6. The method of claim 4 , where affixing the second leadframe power conductor comprises stacking the second leadframe power conductor over the first leadframe power conductor.

7. The method of claim 4 , where affixing the second leadframe power conductor comprises affixing the second leadframe power conductor in an open area defined by the first leadframe power conductor.

8. The method of claim 1 , where electrically connecting the conductive structure of the first leadframe power conductor comprises electrically connecting the first leadframe power conductor to a plurality of die level ground supply terminals in the interior region of the integrated circuit die.

9. The method of claim 1 , where electrically connecting the conductive structure of the first leadframe power conductor comprises electrically connecting the conductive structure of the first leadframe power conductor to a plurality of die level V DD supply terminals in the interior region of the integrated circuit die.

10. The method of claim 1 , where electrically connecting the conductive structure of the first leadframe power conductor comprises electrically connecting the conductive structure of the first leadframe power conductor to a plurality of die level V ss supply terminals in the interior region of the integrated circuit die.

11. A packaging assembly-comprising:

a carrier substrate comprising a first surface and a plurality of conductive bonding pads located at the first surface for supplying a reference voltage;

an integrated circuit comprising an active surface with a plurality of signal bonding pads and a plurality of reference voltage bonding pads distributed across the active surface;

a patterned leadframe conductor disposed over the active surface of the integrated circuit and electrically connected to the plurality of reference voltage bonding pads and the plurality of conductive bonding pads thereby electrically coupling the integrated circuit to the carrier substrate; and

an insulating package body affixed to the carrier substrate so that the patterned leadframe conductor is completely encapsulated in the packaging assembly;

wherein the patterned leadframe conductor includes a conductive structure of a contiguous conductive material disposed over the active surface of the integrated circuit and extending outward from the integrated circuit and downward towards the carrier substrate and electrically connected to a first plurality of conductive bonding pads;

a plurality of wire bonds, each electrically connected and attached to a reference voltage bonding pad of a first plurality of reference voltage bonding pads and to the conductive structure of the patterned leadframe conductor.

12. The packaging assembly of claim 11 , where the patterned leadframe conductor comprises:

a first patterned leadframe conductor disposed over the active surface of the integrated circuit and electrically connected to a first plurality of reference voltage bonding pads and a first plurality of conductive bonding pads, and

a second patterned leadframe conductor disposed over the active surface of the integrated circuit and electrically connected to a second plurality of reference voltage bonding pads and a second plurality of conductive bonding pads.

13. The packaging assembly of claim 12 , where the second patterned leadframe conductor is positioned to overlap at least in part the first patterned leadframe conductor.

14. A packaging assembly-comprising:

a carrier substrate comprising a first surface and a plurality of conductive bonding pads located at the first surface for supplying a reference voltage;

an integrated circuit comprising an active surface with a plurality of signal bonding pads and a plurality of reference voltage bonding pads distributed across the active surface;

a patterned leadframe conductor disposed over the active surface of the integrated circuit and electrically connected to the plurality of reference voltage bonding pads and the plurality of conductive bonding pads thereby electrically coupling the integrated circuit to the carrier substrate; and

an insulating package body affixed to the carrier substrate so that the patterned leadframe conductor is completely encapsulated in the packaging assembly;

where the patterned leadframe conductor comprises:

a first patterned leadframe conductor disposed over the active surface of the integrated circuit and electrically connected to a first plurality of reference voltage bonding pads and a first plurality of conductive bonding pads, and

a second patterned leadframe conductor disposed over the active surface of the integrated circuit and electrically connected to a second plurality of reference voltage bonding pads and a second plurality of conductive bonding pads;

where the second patterned leadframe conductor is positioned adjacent to the first patterned leadframe conductor so that there is no overlap between the first and second patterned leadframe conductors.

15. A packaging assembly-comprising:

a carrier substrate comprising a first surface and a plurality of conductive bonding pads located at the first surface for supplying a reference voltage;

an integrated circuit comprising an active surface with a plurality of signal bonding pads and a plurality of reference voltage bonding pads distributed across the active surface;

a patterned leadframe conductor disposed over the active surface of the integrated circuit and electrically connected to the plurality of reference voltage bonding pads and the plurality of conductive bonding pads thereby electrically coupling the integrated circuit to the carrier substrate; and

an insulating package body affixed to the carrier substrate so that the patterned leadframe conductor is completely encapsulated in the packaging assembly;

where the patterned leadframe conductor comprises a two-layer composite structure having a dielectric layer and two conductive layers formed together so as to position the dielectric layer between the two conductive layers, whereby each of the conductive layers is a patterned leadframe conductor.

16. The packaging assembly of claim 11 , where the active surface of the integrated circuit is opposite the first surface of the carrier substrate.

17. The packaging assembly of claim 11 , further comprising a plurality of wirebond connectors for electrically connecting a plurality of signal line package landing pads formed on the first surface of the carrier substrate to the plurality of signal bonding pads formed on the active surface of the integrated circuit.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037355/0723 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Mar 15, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 024085/0001 →
SECURITY AGREEMENT Recorded Mar 15, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 024079/0082 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2009
From: JOHNSTON, JAMES P.; LEE, CHU-CHUNG; TRAN, TU-ANH N.; MILLER, JAMES W.; HESS, KEVIN J.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 023496/0909 →