IP Library Granted Patent US 8,749,074
Granted Patent B2
US 8,749,074 · App. 12/628,006 · Granted Jun 10, 2014

Package including an interposer having at least one topological feature

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Quick Facts
Patent No.
US 8,749,074
App. No.
12/628,006
Granted
Jun 10, 2014
Kind
B2
Abstract

Embodiments include but are not limited to apparatuses and systems including semiconductor packages, e.g. memory packages, having an interposer including at least one topological feature, such as a depression in a surface of the interposer, a die coupled to the surface of the interposer, and an encapsulant material formed over the die and the interposer, and disposed in the at least one depression to resist movement of the encapsulant material relative to the interposer. Other embodiments may be described and claimed.

Claims (50)

1. An apparatus comprising:

an interposer including

a top surface,

a first bond pad at the top surface,

a second bond pad at the top surface and separated from the first bond pad by a gap, and

at least one depression at the top surface and in the gap;

a die coupled to the top surface of the interposer; and

an encapsulant material formed over the die and the interposer, and disposed in the at least one depression to resist movement of the encapsulant material relative to the interposer,

wherein the at least depression comprises at least one opening in a soldermask layer of the interposer, and wherein the at least one depression extends from a surface of the soldermask to a metal layer of the interposer.

2. The apparatus of claim 1 , wherein the at least one depression has a circular shape.

3. The apparatus of claim 1 , wherein the at least one depression has an L shape.

4. The apparatus of claim 1 , wherein the at least one depression comprises a plurality of square-shaped depressions.

5. The apparatus of claim 1 , wherein the interposer further includes at least one other depression at the top surface of the interposer, and wherein the encapsulant material is disposed in the other depression.

6. An apparatus comprising:

an interposer including

a top surface,

a first bond pad at the top surface,

a second bond pad at the top surface and separated from the first bond pad by a gap, and

at least one depression at the top surface and in the gap:

a die coupled to the top surface of the interposer;

an encapsulant material formed over the die and the interposer, and disposed in the at least one depression to resist movement of the encapsulant material relative to the interposer; and

a plurality of bond wires coupling the first and second bond pads of the interposer to a lead frame, wherein

the interposer includes a corner, and

the gap includes a portion of the top surface at the corner.

7. The apparatus of claim 6 , wherein the at least one depression is at least one first depression, and wherein the apparatus further comprises:

a second depression in the gap and between the first depression and the first bond pad; and

a third depression in the gap and between the first depression and the second bondpad.

8. The apparatus of claim 6 , wherein the at least one depression has a circular shape.

9. The apparatus of claim 6 , wherein the at least one depression has an L shape.

10. The apparatus of claim 6 , wherein the at least one depression comprises a plurality of square-shaped depressions.

11. The apparatus of claim 6 , wherein the interposer further includes at least one other depression at the top surface of the interposer, and wherein the encapsulant material is disposed in the other depression.

12. A system comprising:

a flash memory device including an interposer including

at least one first depression at an edge of the interposer, wherein the first depression is in a side surface of the interposer, and wherein the side surface is adjacent a top surface of the interposer, and

at least one second depression between individual bond pads of the interposer;

a die coupled to the top surface of the interposer; and

an encapsulant material formed over the die and the interposer, and disposed in the first and second depressions to resist movement of the encapsulant material relative to the interposer;

a host logic device; and

a host logic device bus coupled with the phase change memory device and the host logic device.

13. The system of claim 12 , wherein the flash memory device comprises phase change memory device.

14. The system of claim 12 , wherein the host logic device includes a plurality of processor cores.

15. The system of claim 12 , wherein the system is a selected one of a set-top box, a digital reorder, a game console, a personal digital assistant, a mobile phone, a digital media player, or a digital camera.

16. An apparatus comprising:

an interposer having a surface, at least one corner, a first peripheral edge at the corner, and a second peripheral edge at the corner, the interposer including

a first bond pad adjacent the first peripheral edge,

a second bond pad adjacent the second peripheral edge and separated from the first bond pad by a portion of the surface between the first and second bond pads, and

at least one depression in the portion of the surface of the interposer;

a die attached to the surface of the interposer; and

an encapsulant material formed over the die and the interposer, and disposed in the at least one depression to resist movement of the encapsulant material relative to the interposer,

wherein the at least one depression comprises at least one opening in a soldermask layer of the interposer, and wherein the at least one depression extends from a surface of the soldermask to a metal layer of the interposer.

Assignments (10)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2012
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027620/0184 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027126/0176 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYANCE DOCUMENT BY INCLUDING THE SERIAL NUMBER OF APPLICATION ON THE FACE OF THE ASSIGNMENT PREVIOUSLY RECORDED ON REEL 024597 FRAME 0747. ASSIGNOR(S) HEREBY CONFIRMS THE INCLUSION OF SAID SERIAL NUMBER. Recorded Aug 17, 2010
From: ESKILDSEN, STEVEN; RAMAMOORTHY, ARAVIND
To: NUMONYX B.V.
Reel/Frame 024851/0593 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2010
From: ESKILDSEN, STEVEN; RAMAMOORTHY, ARAVIND
To: NUMONYX B.V.
Reel/Frame 024597/0747 →