IP Library Granted Patent US 7,935,555
Granted Patent B2
US 7,935,555 · App. 12/628,024 · Granted May 3, 2011

Method and system for sealing a substrate

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Quick Facts
Patent No.
US 7,935,555
App. No.
12/628,024
Granted
May 3, 2011
Kind
B2
Abstract

A method of sealing a microelectromechanical system (MEMS) device from ambient conditions is described. The MEMS device is formed on a substrate and a substantially hermetic seal is formed as part of the MEMS device manufacturing process. The method may include forming a metal seal on the substrate proximate to a perimeter of the MEMS device using a method such as photolithography. The metal seal is formed on the substrate while the MEMS device retains a sacrificial layer between conductive members of MEMS elements, and the sacrificial layer is removed after formation of the seal and prior to attachment of a backplane.

Claims (20)

1. An electronic device comprising a micro-electromechanical systems (MEMS) device, a metal layer, a mask, a metal seal layer, and a backplane prepared by a process comprising:

providing a MEMS device on a substrate;

depositing a metal layer on the substrate;

forming a mask with one or more perimeter cavities over the metal layer;

depositing one or more metal seal layers in the one or more perimeter cavities, thereby forming a seal proximate to the perimeter cavities of the MEMS device; and

joining a backplane to the seal.

2. The electronic device of claim 1 , wherein the MEMS device comprises an interferometric modulator.

3. The electronic device of claim 1 further prepared by a process comprising removing the mask, and the metal layer, at areas not covered by the one or more metal seal layers, thereby forming a sealant wall.

4. The electronic device of claim 3 further prepared by a process comprising removing a sacrificial layer from the MEMS device.

5. The electronic device of claim 1 further prepared by a process comprising applying a desiccant between the MEMS device and the backplane.

6. The electronic device of claim 5 , wherein the desiccant is selected from the group consisting of zeolites, molecular sieves, surface adsorbents, bulk adsorbents and chemical reactants.

7. The electronic device of claim 1 , wherein the desiccant comprises a powder.

8. The electronic device of claim 1 , wherein the seal proximate to the perimeter of the MEMS device comprises a non-hermetic seal.

9. The electronic device of claim 8 , wherein the non-hermetic seal is selected from the group consisting of conventional epoxy-based adhesive, polyisobutylene, butyl rubber, o-rings, polyurethane, thin film metal weld, liquid spin-on glass, solder, polymers and plastic.

10. The electronic device of claim 1 , wherein the seal proximate to the perimeter of the MEMS device comprises a substantially hermetic seal.

11. The electronic device of claim 10 , wherein the substantially hermetic seal comprises metal.

12. The electronic device of claim 1 further prepared by depositing an insulator layer on the substrate before depositing the metal layer.

13. The electronic device of claim 12 , wherein the depositing the insulator layer comprises depositing the insulator layer to contact the substrate.

14. The electronic device of claim 12 , wherein the depositing the insulator layer comprises depositing the insulator layer on at least one layer in contact with the substrate.

15. The electronic device of claim 14 , wherein the at least one layer comprises a conductive material.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2016
From: QUALCOMM MEMS TECHNOLOGIES, INC.
To: SNAPTRACK, INC.
Reel/Frame 039891/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2011
From: IDC, LLC
To: QUALCOMM MEMS TECHNOLOGIES, INC.
Reel/Frame 025939/0968 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 8, 2010
From: FLOYD, PHILIP D.
To: IDC, LLC
Reel/Frame 024504/0911 →