Package-level integrated circuit connection without top metal pads or bonding wire
View Patent ↗An integrated circuit apparatus is provided with package-level connectivity, between internal electronic circuitry thereof and contact points on a package substrate thereof, without requiring top metal pads or bonding wires.
1. An integrated circuit apparatus, comprising:
electronic circuitry;
an edge produced by separation of said integrated circuit apparatus from a wafer that contains other integrated circuit apparatus; and
a plurality of conductors connected to said electronic circuitry and physically accessible on said edge, said conductors formed before passivation and positioned to be exposed on said edge upon occurrence of said separation.
2. The integrated circuit apparatus of claim 1 , including a plurality of different metal layers, and wherein one of said conductors is provided in one of said metal layers and another of said conductors is provided in another of said metal layers.
3. The integrated circuit apparatus of claim 2 , wherein one of said conductors has a different cross-sectional area than another of said conductors.
4. The integrated circuit apparatus of claim 1 , wherein one of said conductors has a different cross-sectional area than another of said conductors.
5. The integrated circuit apparatus of claim 1 , including a package substrate having a plurality of conductive contacts, and including a plurality of conductive connection structures, each said connection structure connecting a respective one of said contacts to a respective one of said conductors.
6. The integrated circuit apparatus of claim 5 , wherein said connection structures are physically deposited on said edge.
7. The integrated circuit apparatus of claim 5 , wherein said connection structures are vias spaced apart from said edge.
8. An electronic circuit apparatus, comprising:
a first electronic circuitry portion;
an integrated circuit apparatus including a second electronic circuitry portion, an edge produced by separation of said integrated circuit apparatus from a wafer that contains other integrated circuit apparatus, and a plurality of conductors connected to said second electronic circuitry portion and physically accessible on said edge, said conductors formed before passivation and positioned to be exposed on said edge upon occurrence of said separation; and
a conductive connection structure connected to said first electronic circuitry portion and physically attached to said conductors on said edge.
9. The apparatus of claim 8 , wherein said first electronic circuitry portion is provided in a further integrated circuit apparatus that includes a further edge produced by a further separation of said further integrated circuit apparatus from a wafer that contains other integrated circuit apparatus,
said further integrated circuit apparatus including a plurality of further conductors connected to said first electronic circuitry portion,
said further conductors positioned to be exposed on said further edge upon occurrence of said further separation,
wherein said further integrated circuit apparatus is packaged together with said integrated circuit apparatus on a common package substrate, and
wherein said connection structure is physically attached to said further conductors on said further edge.
10. The apparatus of claim 8 , wherein said integrated circuit apparatus includes a plurality of different metal layers, and wherein one of said conductors is provided in one of said metal layers and another of said conductors is provided in another of said metal layers.
11. The apparatus of claim 10 , wherein one of said conductors has a different cross-sectional area than another of said conductors.
12. The apparatus of claim 8 , wherein one of said conductors has a different cross-sectional area than another of said conductors.