IP Library Granted Patent US 8,426,944
Granted Patent B2
US 8,426,944 · App. 12/732,685 · Granted Apr 23, 2013

Insulated gate bipolar transistor

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Quick Facts
Patent No.
US 8,426,944
App. No.
12/732,685
Granted
Apr 23, 2013
Kind
B2
Abstract

In some embodiments, an insulated gate bipolar transistor includes a drift layer, insulation gates formed at a principle surface portion of the drift layer, base regions formed in a between-gate region, an emitter region formed in the base region so as to be adjacent to the insulation gate, an emitter electrode connected to the emitter region, a collector layer formed at the other side of the principle surface portion of the drift layer, and a collector electrode connected to the collector layer. The conductive type base regions are separated with each other by the drift layers, and the drift layer and the emitter electrode are insulated by an interlayer insulation film.

Claims (18)

1. An insulated gate bipolar transistor comprising:

a first conductive type drift layer;

a plurality of gate electrodes formed at a principle surface portion of the drift layer so as to extend in a first direction and arranged in parallel with each other in a second direction perpendicular to the first direction;

a plurality of second conductive type base regions each formed in a between-gate region sandwiched by and between a pair of adjacent gate electrodes;

a first conductive type emitter region formed in the base region so as to be adjacent to the gate electrodes;

an emitter electrode connected to the emitter region;

a second conductive type collector layer formed at the other side of the principle surface portion of the drift layer;

a collector electrode connected to the collector layer,

an interlayer insulation film which is located over and covers the gate electrode; and

a hole discharge control region formed only on a side surface of the base region in the second direction,

wherein the plurality of second conductive type base regions are separated with each other in the first direction by the drift layer, and

wherein the drift layer and the emitter electrode are insulated by the interlayer insulation film.

2. The insulated gate bipolar transistor as recited in claim 1 , wherein the gate electrodes is formed in a trench that is formed from the principle surface portion of the drift layer so as to be deeper than the base region.

3. The insulated gate bipolar transistor as recited in claim 1 , wherein the emitter region and the drift layer are separated by the base region.

4. The insulated gate bipolar transistor as recited in claim 1 , wherein in the adjacent between-gate regions, the base regions are arranged in a shifted manner in the second direction.

5. The insulated gate bipolar transistor as recited in claim 1 , further comprising:

a body region which separates the emitter region into two emitter regions.

6. The insulated gate bipolar transistor as recited in claim 1 , wherein the interlayer insulation film is located directly over the gate electrode and extends beyond the gate electrode.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR NAME PREVIOUSLY RECORDED AT REEL: 033813 FRAME: 0420. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jan 21, 2015
From: SYSTEM SOLUTIONS CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 034816/0510 →
CHANGE OF NAME Recorded Dec 3, 2014
From: SANYO SEMICONDUCTOR CO., LTD
To: SYSTEM SOLUTIONS CO., LTD.
Reel/Frame 034537/0044 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 24, 2014
From: SANYO SEMICONDUCTOR CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 033813/0420 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →