IP Library Granted Patent US 8,374,830
Granted Patent B2
US 8,374,830 · App. 12/777,034 · Granted Feb 12, 2013

Grid transparency and grid hole pattern control for ion beam uniformity

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Quick Facts
Patent No.
US 8,374,830
App. No.
12/777,034
Granted
Feb 12, 2013
Kind
B2
Abstract

A design process for varying hole locations or sizes or both in an ion beam grid includes identifying a control grid to be modified; obtaining a change factor for the grid pattern; and using the change factor to generate a new grid pattern. The change factor is one or both of a hole location change factor or a hole diameter change factor. Also included is an ion beam grid having the characteristic of hole locations or sizes or both defined by a change factor modification of control grid hole locations or sizes or both.

Claims (32)

1. A beam grid comprising:

a pattern of beam grid holes with a region having a grid hole density that continuously varies with distance from a reference on the beam grid.

2. The beam grid of claim 1 , wherein the pattern of beam grid holes is derived from an initial pattern of beam grid holes using a change factor.

3. The beam grid of claim 2 , wherein the change factor is applied iteratively to the initial pattern of beam grid holes to obtain the pattern of beam grid holes.

4. The beam grid of claim 1 , wherein the reference is a point within a radial coordinate system and the grid hole density of the region varies radially from the point.

5. The beam grid of claim 1 , wherein the reference is at a center point of the beam grid.

6. The beam grid of claim 1 , wherein the beam grid is generally circular.

7. The beam grid of claim 1 , wherein the region having a continuously varying grid hole density includes all of the pattern of beam grid holes.

8. The beam grid of claim 1 , wherein the pattern of beam grid holes has no discrete regions with different grid hole densities.

9. The beam grid of claim 1 , further comprising:

a pattern of mounting holes arranged about a perimeter of the beam grid for mounting the beam grid to an ion source.

10. The beam grid of claim 1 , wherein the region has a constant beam grid hole size.

11. The beam grid of claim 1 , wherein the pattern of beam grid holes is derived from an initial pattern of beam grid holes.

12. The beam grid of claim 1 , wherein the reference is a point within a Cartesian coordinate system and the grid hole density of the region varies linearly from the point.

13. The beam grid of claim 1 , wherein the region has a continuously varying transparency.

14. A beam grid comprising:

a pattern of beam grid holes with region having a grid hole density and grid hole size that continuously varies with distance from a reference on the beam grid.

15. The beam grid of claim 14 , wherein the pattern of beam grid holes is derived from an initial pattern of beam grid holes using a change factor.

16. The beam grid of claim 15 , wherein the change factor is applied iteratively to the initial pattern of beam grid holes to obtain the pattern of beam grid holes.

17. The beam grid of claim 14 , wherein the reference is a point within a radial coordinate system and one or both of the grid hole density and the grid hole size of the region varies radially from the point.

18. The beam grid of claim 14 , wherein the reference is a center point of the beam grid.

19. The beam grid of claim 14 , wherein the beam grid is generally circular.

20. The beam grid of claim 14 , wherein the region having a continuously varying grid hole density and grid hole size includes all of the pattern of beam grid holes.

21. The beam grid of claim 14 , wherein the pattern of beam grid holes has no discrete regions with different grid hole sizes.

22. The beam grid of claim 14 , wherein the pattern of beam grid holes has no discrete regions with different grid hole densities.

23. The beam grid of claim 14 , further comprising:

a pattern of mounting holes arranged about a perimeter of the beam grid for mounting the beam grid to an ion source.

24. The beam grid of claim 14 , wherein the pattern of beam grid holes is derived from an initial pattern of beam grid holes.

25. The beam grid of claim 14 , wherein the reference is a point within a Cartesian coordinate system and one or both of the grid hole density and the grid hole size of the region varies linearly from the point.

26. The beam grid of claim 14 , wherein the region has a continuously varying transparency.

27. A beam grid comprising:

a modified pattern of beam grid holes with a region having a grid hole density that continuously varies with radial distance from a reference point on the beam grid and a constant grid hole size, wherein the modified pattern of holes is derived from an initial patterns of holes.

Assignments (3)
SECURITY INTEREST Recorded Jun 16, 2025
From: VEECO INSTRUMENTS INC.
To: HSBC BANK USA, NATIONAL ASSOCIATION
Reel/Frame 071649/0225 →
PATENT SECURITY AGREEMENT Recorded Dec 16, 2021
From: VEECO INSTRUMENTS INC.
To: HSBC BANK USA, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 058533/0321 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2011
From: KAMEYAMA, IKUYA; SIEGFRIED, DANIEL E.
To: VEECO INSTRUMENTS, INC.
Reel/Frame 027162/0792 →