Method and system for equivalence checking
View Patent ↗As part of the design process it is required to design circuits in order to reduce their power consumption. This is typically done by enabling or disabling flip-flops (FFs), however, such change in the circuit requires certain verification. As sequential clock gating changes the state function it is necessary to perform a sequential equivalence checking (SEC) verification. Applying a full SEC may be runtime consuming and is not scalable for large designs. Methods to reduce the problem of verifying sequential clock gating by reducing the sequential problem into much smaller problem that can be easily solved is therefore shown.
1. A method for performing circuit equivalence check comprising:
receiving a design of a circuit;
identifying flip-flops (FFs) of the design which are candidates FFs for observability don't care (ODC) modeling;
performing ODC modeling and ODC cuts on the identified FF for ODC modeling;
identifying FFs of the design which are candidates FFs for stability condition (STC) analysis;
performing STC analysis and STC cuts on the identified FF for STC analysis;
performing equivalence checks on at least one of the circuits resulting from the ODC cuts and the circuits resulting from the STC cuts; and
reporting circuit equivalence.
2. The method of claim 1 , wherein said ODC modeling comprises:
computing ODC conditions for each identified FF for ODC modeling; and
identifying for each identified FF if backward retiming can be achieved and enabling backward retiming for FFs in which backward retiming can be achieved.
3. The method of claim 1 , wherein said STC analysis comprises:
identifying the enable signals in the fan-in of each identified FF for STC analysis; and
identifying for each identified FF if its respective enable signal stabilizes in an immediately preceding cycle and enabling clock-gating for the FF using the respective enable signal if the enable signal for the identified FF stabilizes in an immediately preceding cycle.
4. The method of claim 1 , wherein the design system is a computer aided design (CAD) system.
5. The method of claim 1 , wherein the reporting is one of: printing a report, displaying a report.
6. A computer program product embodied on tangible media readable by a computing system and on which a plurality of instructions are embedded, wherein the instructions when executed on the computing system perform circuit equivalence check comprising the steps of:
receiving a design of a circuit;
identifying flip-flops (FFs) of the design which are candidates FFs for observability don't care (ODC) modeling;
performing ODC modeling and ODC cuts on the identified FF for ODC modeling;
identifying FFs of the design which are candidates FFs for stability condition (STC) analysis;
performing STC analysis and STC cuts on the identified FF for STC analysis;
performing equivalence checks on at least one of the circuits resulting from the ODC cuts and the circuits resulting from the STC cuts; and
reporting circuit equivalence.
7. The computer program product of claim 6 , wherein said ODC modeling comprises:
computing ODC conditions for each identified FF for ODC modeling; and
identifying for each identified FF if backward retiming can be achieved and enabling backward retiming for FFs in which backward retiming can be achieved.
8. The computer program product of claim 6 , wherein said STC analysis comprises:
identifying the enable signals in the fain-in of each identified FF for STC analysis; and
identifying for each identified FF if its respective enable signal stabilizes in an immediately preceding cycle and enabling clock-gating for the FF using the respective enable signal if the enable signal for the identified FF stabilizes in an immediately preceding cycle.
9. The computer program product of claim 6 , wherein the design system is a computer aided design (CAD) system.
10. The computer program product of claim 6 , wherein the reporting is one of: printing a report, displaying a report.
11. A design system for performing circuit equivalence check comprising:
a storage;
a processing unit coupled to the storage; and
at least one of a display or printing unit coupled to processing unit;
the storage containing a plurality of instructions that when executed on the processing unit perform the tasks of: receiving a design of a circuit;
identifying flip-flops (FFs) of the design which are candidates FFs for observability don't care (ODC) modeling;
performing ODC modeling and ODC cuts on the identified FF for ODC modeling;
identifying FFs of the design which are candidates FFs for stability condition (STC) analysis;
performing STC analysis and STC cuts on the identified FF for STC analysis;
performing equivalence checks on at least one of the circuits resulting from the ODC cuts and the circuits resulting from the STC cuts; and
reporting circuit equivalence.
12. The system of claim 11 , wherein the display is used to display a report of the equivalence check.
13. The system of claim 11 , wherein said ODC modeling comprises:
computing ODC conditions for each identified FF for ODC modeling; and
identifying for each identified FF if backward retiming can be achieved and enabling backward retiming for FFs in which backward retiming can be achieved.
14. The system of claim 11 , wherein said STC analysis comprises:
identifying the enable signals in the fan-in of each identified FF for STC analysis; and
identifying for each identified FF if its respective enable signal stabilizes in an immediately preceding cycle and enabling clock-gating for the FF using the respective enable signal if the enable signal for the identified FF stabilizes in an immediately preceding cycle.
15. The system of claim 11 , wherein the system is a computer aided design (CAD) system.