Plasma etching apparatus
View Patent ↗According to one embodiment, a plasma etching apparatus includes an electrode to which a high-frequency voltage is applied, having an upper surface along which a processing target substrate is to be placed, and having an inclined side, and an electrode cover provided along the side of the electrode.
1. A plasma etching apparatus comprising:
an electrode to which a high-frequency voltage is applied, having an electrode upper surface along which a processing target substrate is to be placed and an electrode lower surface, and having an inclined side such that the electrode widens toward the electrode lower surface; and
an electrode cover provided along and covering the inclined side of the electrode, protecting the inclined side of the electrode from plasma, and having inclined upper and lower surfaces, wherein a thickness of the electrode cover between the inclined electrode cover upper and lower surfaces decreases in a direction from the electrode upper surface toward the electrode lower surface.
2. The apparatus according to claim 1 , wherein the electrode cover has a ring shape.
3. The apparatus according to claim 1 , wherein the electrode cover is formed of a dielectric material.
4. The apparatus according to claim 1 , wherein the electrode has a circular plane.
5. The apparatus according to claim 1 , wherein the electrode functions as a bottom electrode, and further comprising a top electrode parallel with the bottom electrode.
6. The apparatus according to claim 1 , wherein a clearance exists between the electrode and the processing target substrate.
7. The apparatus according to claim 1 , wherein the processing target substrate is a photomask.
8. The apparatus according to claim 1 , wherein the electrode cover has a substrate placement portion for placement thereon of the processing target substrate.