IP Library Granted Patent US 8,580,044
Granted Patent B2
US 8,580,044 · App. 12/806,464 · Granted Nov 12, 2013

Apparatus for agitating and evacuating byproduct dust from a semiconductor processing chamber

Inventors: Eric McCormick (Round Rock, TX); Rolando Mendez (Austin, TX); Bradley May (Austin, TX)
Assignees: Samsung Austin Semiconductor, L.P.; Samsung Electronics Co., Ltd.
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Quick Facts
Patent No.
US 8,580,044
App. No.
12/806,464
Granted
Nov 12, 2013
Kind
B2
Abstract

A system and method for semiconductor processing chamber includes a housing that can cover an annular gap of a pedestal well of the semiconductor processing chamber. A cleaning nozzle is removably coupled to a compressed dry air (CDA) supply. The cleaning nozzle can inject the CDA into the pedestal well while the housing can contain a byproduct dust agitated by the injected CDA. The byproduct dust is evacuated by at least one vacuum port that is removably coupled to a vacuum source.

Claims (31)

1. An apparatus for cleaning a semiconductor processing chamber, the apparatus comprising:

a housing configured to cover an annular gap of a pedestal well of the semiconductor processing chamber;

at least one cleaning nozzle configured to inject a gas into the pedestal well, such that the injected gas agitates a byproduct disposed on at least one surface within the housing, the at least one cleaning nozzle comprising a fan configured to deliver the gas to a specified portion of the pedestal well;

at least one vacuum port configured to evacuate the agitated byproduct.

2. The apparatus of claim 1 , wherein the at least one cleaning nozzle comprises a polywhip line configured to randomly distribute the gas.

3. The apparatus of claim 1 , wherein the fan is a ninety-degree fan configured to deliver the gas at an angle substantially perpendicular to a wall of the pedestal well.

4. The apparatus of claim 1 , wherein the at least one cleaning nozzle comprises a selector switch configured to select one of: a polywhip line; a ninety-degree fan, and closed position, wherein the closed position inhibits a flow of the gas into the pedestal well.

5. The apparatus of claim 1 , wherein the housing comprises an O-ring configured to inhibit flow of the byproduct from the pedestal well.

6. The apparatus of claim 1 , wherein the housing comprises at least one view port configured to enable an operator to view at least one of: the agitation of the byproduct and the evacuation of the byproduct.

7. The apparatus of claim 1 , wherein the housing does not cover a center portion of a pedestal in the pedestal well of the semiconductor processing chamber.

8. A system for cleaning a semiconductor processing chamber, the system comprising:

a housing configured to cover an annular gap of a pedestal well of the semiconductor processing chamber;

at least one cleaning nozzle removably coupled to a compressed dry air (CDA) supply and configured to inject CDA into the pedestal well, such that the injected CDA agitates a byproduct disposed on at least one surface within the housing, the at least one cleaning nozzle comprises a fan configured to deliver the CDA to a bottom portion of a pedestal within the pedestal well;

at least one vacuum port removably coupled to a vacuum source and configured to evacuate the agitated byproduct.

9. The system of claim 8 , wherein the at least one cleaning nozzle comprises a polywhip line configured to randomly distribute the CDA.

10. The system of claim 8 , wherein the fan is a ninety-degree fan configured to deliver the CDA at an angle substantially perpendicular to a wall of the pedestal well.

11. The system of claim 8 , wherein the at least one cleaning nozzle comprises a selector switch configured to select one of: a polywhip line; a ninety-degree fan, and closed position, wherein the closed position inhibits a flow of the CDA into the pedestal well.

12. The system of claim 8 , wherein the housing comprises an O-ring configured to form a seal at the junction between the housing and the semiconductor processing chamber in order to inhibit flow of the byproduct from the pedestal well.

13. The system of claim 8 , wherein the housing comprises at least one view port configured to enable an operator to view at least one of: the agitation of the byproduct and the evacuation of the byproduct.

14. The system of claim 8 , wherein the housing does not cover a center portion of a pedestal in the pedestal well of the semiconductor processing chamber.

15. The system of claim 8 , further comprising the semiconductor processing chamber.

16. A method for cleaning a semiconductor processing chamber, the method comprising:

covering, by a housing, an annular gap of a pedestal well of the semiconductor processing chamber;

injecting, by at least one cleaning nozzle, a gas into the pedestal well;

delivering, by a fan, the injected gas to a specified portion of the pedestal well;

agitating, by the injected gas, a byproduct disposed on at least one surface within the housing;

evacuating, by at least one vacuum port, the agitated byproduct.

17. The method of claim 16 , wherein injecting comprises randomly distributing the gas by a polywhip line.

18. The method claim 16 , wherein injecting comprises delivering the gas at an angle substantially perpendicular to a wall of the pedestal well.

19. The method of claim 16 , wherein injecting comprises setting a cleaning nozzle to one of: a polywhip line; a ninety-degree fan, and closed position, wherein the closed position inhibits a flow of the gas into the pedestal well.

20. The method of claim 16 , wherein containing comprises inhibiting, by an O-ring, a flow of the byproduct from the pedestal well.

Assignments (2)
CHANGE OF NAME Recorded Aug 31, 2018
From: SAMSUNG AUSTIN SEMICONDUCTOR, L.P.
To: SAMSUNG AUSTIN SEMICONDUCTOR, LLC
Reel/Frame 047006/0105 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 13, 2010
From: MCCORMICK, ERIC; MENDEZ, ROLANDO; MAY, BRADLEY
To: SAMSUNG AUSTIN SEMICONDUCTOR, L.P.
Reel/Frame 024890/0066 →
Continuity (1)
Related Publication 20120037188A1 · Feb 16, 2012