IP Library Granted Patent US 8,228,109
Granted Patent B2
US 8,228,109 · App. 12/824,991 · Granted Jul 24, 2012

Transmission gate circuitry for high voltage terminal

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Quick Facts
Patent No.
US 8,228,109
App. No.
12/824,991
Granted
Jul 24, 2012
Kind
B2
Abstract

A transmission gate circuit includes a first transmission gate, having a first switching device, coupled in series with a second transmission gate, having a second switching device, and control circuitry which places the first transmission gate and the second transmission gate into a conductive state to provide a conductive path through the first transmission gate and the second transmission gate. When the voltage of the first terminal is above a first voltage level and outside a safe operating voltage area of at least one of the first and second switching device, the first switching device remains within its safe operating voltage area and the second switching device remains within its safe operating voltage area.

Claims (67)

1. A transmission gate circuit, the transmission gate circuit comprising:

a first transmission gate comprising a first switching device having a first current electrode, a second current electrode, and a control electrode;

a second transmission gate comprising a second switching device having a first current electrode, a second current electrode, and a control electrode, and wherein the first current electrode of the second switching device is coupled to the second current electrode of the first switching device;

a first terminal coupled to the first current electrode of the first switching device;

a second terminal coupled to the second current electrode of the second switching device; and

control circuitry coupled to the first transmission gate and the second transmission gate, wherein in a first mode, the control circuitry places the first transmission gate and the second transmission gate into a conductive state to provide a conductive path between the first terminal and the second terminal through the first transmission gate and the second transmission gate, and when the control circuitry is in a second mode, the control circuitry places the first transmission gate and the second transmission gate into a non-conductive state, wherein when the control circuitry is in the second mode and a voltage of the first terminal is outside a safe operating voltage area of at least one of the first switching device and the second switching device, the first switching device remains within its safe operating voltage area and the second switching device remains within its safe operating voltage area;

wherein the first switching device is further characterized as a first PMOS transistor, and wherein the second switching device is further characterized as a second PMOS transistor, wherein the first transmission gate comprises a first NMOS transistor coupled in parallel with the first switching device and the second transmission gate comprises a second NMOS transistor coupled in parallel with the second switching device.

2. The transmission gate circuit of claim 1 wherein a control electrode of the first NMOS transistor is coupled to a terminal of a first bias voltage, and wherein the control electrode of the second NMOS transistor is coupled to a terminal of a second bias voltage.

3. The transmission gate circuit of claim 2 , wherein the first bias voltage is the greater voltage of a group consisting of approximately half the voltage of the first terminal and the second bias voltage.

4. The transmission gate circuit of claim 1 wherein the control circuitry comprises:

a third PMOS transistor having a first current electrode coupled to the first current electrode of the first switching device, a second current electrode coupled to a control electrode of the first PMOS transistor, and a control electrode coupled to a terminal of a first bias voltage.

5. A transmission gate circuit, the transmission gate circuit comprising:

a first transmission gate comprising a first switching device having a first current electrode, a second current electrode, and a control electrode;

a second transmission gate comprising a second switching device having a first current electrode, a second current electrode, and a control electrode, and wherein the first current electrode of the second switching device is coupled to the second current electrode of the first switching device;

a first terminal coupled to the first current electrode of the first switching device;

a second terminal coupled to the second current electrode of the second switching device; and

control circuitry coupled to the first transmission gate and the second transmission gate, wherein in a first mode, the control circuitry places the first transmission gate and the second transmission gate into a conductive state to provide a conductive path between the first terminal and the second terminal through the first transmission gate and the second transmission gate, and when the control circuitry is in a second mode, the control circuitry places the first transmission gate and the second transmission gate into a non-conductive state, wherein when the control circuitry is in the second mode and a voltage of the first terminal is outside a safe operating voltage area of at least one of the first switching device and the second switching device, the first switching device remains within its safe operating voltage area and the second switching device remains within its safe operating voltage area;

wherein the first switching device is further characterized as a first PMOS transistor, and wherein the second switching device is further characterized as a second PMOS transistor, wherein the control circuitry comprises:

a third PMOS transistor having a first current electrode coupled to the first current electrode of the first switching device, a second current electrode coupled to a control electrode of the first PMOS transistor, and a control electrode coupled to a terminal of a first bias voltage.

6. The transmission gate circuit of claim 5 , wherein the first transmission gate comprises a first NMOS transistor coupled in parallel with the first switching device and the second transmission gate comprises a second NMOS transistor coupled in parallel with the second switching device.

7. The transmission gate circuit of claim 5 , wherein the control circuitry further comprises:

a first NMOS transistor having a first current electrode coupled to the control electrode of the first PMOS transistor, a second current electrode, and a control electrode coupled to the terminal of the first bias voltage; and

a second NMOS transistor having a first current electrode coupled to the second current electrode of the first NMOS transistor, a second current electrode coupled to a ground terminal, and a control electrode coupled to receive an enable signal.

8. The transmission gate circuit of claim 7 , wherein when the voltage of the first terminal is at or below the first bias voltage, the enable signal is asserted, and, in response to the enable signal being asserted, the first PMOS transistor becomes conductive.

9. The transmission gate circuit of claim 7 , wherein when the voltage of the first terminal is above the first bias voltage, the enable signal is deasserted, and, in response to the enable signal being deasserted, the first PMOS transistor becomes non-conductive.

10. The transmission gate circuit of claim 7 , wherein the control circuitry further comprises:

a fourth PMOS transistor having a first current electrode coupled to receive the first bias voltage, a control electrode coupled to the first terminal, and a second current electrode;

a fifth PMOS transistor having a first current electrode coupled to the second current electrode of the fourth PMOS transistor, a control electrode coupled to the second current electrode of the first switching device, and a second current electrode; and

a third MNOS transistor having a first current electrode coupled to the second current electrode of the fifth PMOS transistor and to the control electrode of the second NMOS transistor, a control electrode coupled to the second current electrode of the first NMOS transistor, and a second current electrode coupled to the ground terminal.

11. The transmission gate circuit of claim 7 , wherein the control electrode of the second PMOS transistor is coupled to the second current electrode of the first NMOS transistor.

12. In an integrated circuit comprising a first terminal, transmission gate circuitry coupled to the first terminal, first circuitry coupled to the transmission gate circuitry, a method comprising:

when a voltage of the first terminal is at or below a first voltage, placing the transmission gate circuitry into a conductive state to provide a conductive path between the first terminal and the first circuitry through the transmission gate circuitry;

when the voltage of the first terminal is above the first voltage, the method further comprises:

placing the transmission gate circuitry into a non-conductive state wherein the first circuitry is isolated from the first terminal; and

when the voltage of the first terminal is outside a safe operating voltage of at least one transistor within the transmission gate circuitry, maintaining each transistor within the transmission gate circuitry within its safe operating voltage area;

wherein the integrated circuit further comprises a memory coupled to the first terminal, the method further comprising:

providing a supply voltage to the first terminal for use by the memory, wherein the supply voltage is above the first voltage and outside the safe operating voltage of at least one transistor within the transmission gate circuitry; and

transmitting an I/O signal between the first terminal and the first circuitry via the transmission gate circuitry, wherein a voltage of the I/O signal at the first terminal is less than or equal to the first voltage.

13. The method of claim 12 , wherein when a voltage of the first terminal is at or below the first voltage, an analog signal is transmitted between the first terminal and the first circuitry.

14. The method of claim 12 , wherein the transmission gate circuitry comprises a first transmission gate coupled in series with a second transmission gate, wherein each of the first transmission gate and the second transmission gate comprises an NMOS transistor and a PMOS transistor coupled in parallel, and wherein the method further comprises:

placing the PMOS transistors in a conductive state when transmitting the I/O signal between the first terminal and the first circuitry.

15. The method of claim 14 , further comprising:

using the voltage of the first terminal and the voltage of a circuit node between the first transmission gate and the second transmission gate to place the PMOS transistors in a non-conductive state when applying a programming voltage to the first terminal for programming the memory.

16. A transmission gate circuit, comprising:

a first transmission gate having a first terminal and a second terminal, and comprising a first NMOS transistor and a first PMOS transistor, the first NMOS transistor being coupled in parallel with the first PMOS transistor, wherein a control electrode of the first NMOS transistor is coupled to a terminal of a first bias voltage;

a second transmission gate having a third terminal and a fourth terminal and comprising a second NMOS transistor and a second PMOS transistor, the second NMOS transistor being coupled in parallel with the second PMOS transistor, and wherein the third terminal is coupled to the second terminal;

a third PMOS transistor having a first current electrode coupled to the first terminal, a second current electrode coupled to a control electrode of the first PMOS transistor, and having a control electrode coupled to the terminal of the first bias voltage;

a third NMOS transistor having a first current electrode coupled to the second current electrode of the third PMOS transistor, a second current electrode, and a control electrode coupled to the terminal of the first bias voltage; and

a fourth NMOS transistor having a first current electrode coupled to the second current electrode of the third NMOS transistor, a second current electrode, and a control electrode coupled to receive an enable signal, wherein when the enable signal is asserted, each of the first transmission gate and the second transmission gate is placed in a conductive state to provide a conductive path between the first terminal and the fourth terminal through the first transmission gate and the second transmission gate and when the enable signal is deasserted, each of the first transmission gate and the second transmission gate is placed in a non-conductive state.

17. The transmission gate circuit of claim 16 , further comprising:

a fourth PMOS transistor comprising a first current electrode coupled to the control electrode of the third PMOS transistor, a control electrode coupled to the first terminal, and a second current electrode;

a fifth PMOS transistor comprising a first current electrode coupled to the second current electrode of the fourth PMOS transistor, a control electrode coupled to the second terminal, and a second current electrode coupled to the control electrode of the fourth NMOS transistor; and

a fifth NMOS transistor comprising a first current electrode coupled to the second current electrode of the fifth PMOS transistor, a control electrode coupled to the first current electrode of the fourth NMOS transistor, and a second current electrode.

18. The transmission gate circuit of claim 16 , wherein a body terminal of each of the first PMOS transistor and the third PMOS transistor is coupled to a terminal of a third bias voltage, wherein the first bias voltage is the greater voltage selected from approximately half a voltage of the first terminal and a second bias voltage, and the third bias voltage is the greater voltage selected from the first bias voltage and the voltage of the first terminal.

19. The transmission gate circuit of claim 18 , further comprising:

a fourth PMOS transistor having a first current electrode coupled to receive approximately half the voltage of the first terminal, a control electrode coupled to the terminal of the second bias voltage, and a second current electrode coupled to the terminal of the first bias voltage to provide the first bias voltage;

a fifth PMOS transistor having a first current electrode coupled to the terminal of the second bias voltage, a control electrode coupled to the first current electrode of the fourth PMOS transistor, and a second current electrode coupled to the second current electrode of the fourth PMOS transistor;

a sixth PMOS transistor having a first current electrode coupled to the second current electrode of the fifth PMOS transistor, a control electrode coupled to the first terminal, and a second current electrode coupled to the terminal of the third bias voltage to provide the third bias voltage; and

a seventh PMOS transistor having a first current electrode coupled to the control electrode of the sixth PMOS transistor, a control electrode coupled to the first current electrode of the sixth PMOS transistor, and a second current electrode coupled to the second current electrode of the sixth PMOS transistor.

20. The transmission gate circuit of claim 16 , further comprising:

a fourth PMOS transistor comprising a first current electrode coupled to the third terminal, a control electrode coupled to the terminal of a second bias voltage, and a second current electrode coupled to the control electrode of the second PMOS transistor; and

a fifth NMOS transistor comprising a first current electrode coupled to the second current electrode of the fourth PMOS transistor, a second current electrode coupled to the second current electrode of the fourth NMOS transistor, and a control electrode coupled to receive the enable signal;

wherein a control electrode of the second NMOS transistor is coupled to a terminal of the second bias voltage.

21. The transmission gate circuit of claim 16 , wherein the first NMOS transistor and the third NMOS transistor are characterized as isolated NMOS transistors each having an isolating N-well region coupled to a terminal of a third bias voltage, the third bias voltage is the greater voltage of a group consisting of the voltage of the first terminal and a second bias voltage.

22. The transmission gate circuit of claim 16 , wherein:

the control electrode of the second PMOS transistor is coupled to the second current electrode of the third NMOS transistor;

wherein the control electrode of the second NMOS transistor is coupled to receive the enable signal.

Assignments (21)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0285 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0387 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2010
From: STOCKINGER, MICHAEL A.; CAMARENA, JOSE A.; ZHANG, WENZHONG
To: FREESCALE SEMICONDUCTOR, INC.
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