IP Library Granted Patent US 8,339,302
Granted Patent B2
US 8,339,302 · App. 12/846,589 · Granted Dec 25, 2012

Analog-to-digital converter having a comparator for a multi-stage sampling circuit and method therefor

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Quick Facts
Patent No.
US 8,339,302
App. No.
12/846,589
Granted
Dec 25, 2012
Kind
B2
Abstract

An analog to digital converter includes a first sample circuit that samples an analog input during a first phase of a clock. A second sample circuit samples the analog input during a second phase of the clock. A comparator compares a reference to the output of the first sample circuit during a non-overlapping time between an end of the first phase and beginning of the second phase and compares the reference to the output of the second sample circuit during a non-overlapping time between an end of the second phase and beginning of the first phase. The first sample circuit couples the sample of the analog input taken by the first sample circuit to the input of the comparator during the non-overlapping time between the end of the first phase and the beginning of the second phase and the second sample circuit couples the sample of the analog input taken by the second sample circuit to the input of the comparator during the non-overlapping time between the end of the second phase and the beginning of the first phase.

Claims (46)

1. An analog to digital converter, comprising:

a first sample circuit having an input coupled to an analog input that takes a sample of the analog input during a first phase of a clock;

a second sample circuit having an input coupled to the analog input that samples the analog input during a second phase of the clock; and

a comparator having an input coupled to the output of the first sample circuit and the output of the second sample circuit wherein the comparator compares a reference to the output of the first sample circuit during a non-overlapping time between an end of the first phase and beginning of the second phase and compares the reference to the output of the second sample circuit during a non-overlapping time between an end of the second phase and beginning of the first phase;

wherein the first sample circuit couples the sample of the analog input taken by the first sample circuit to the input of the comparator during the non-overlapping time between the end of the first phase and the beginning of the second phase and the second sample circuit couples the sample of the analog input taken by the second sample circuit to the input of the comparator during the non-overlapping time between the end of the second phase and the beginning of the first phase.

2. The analog to digital converter of claim 1 , wherein the analog input comprises a positive input signal and a minus input signal.

3. The analog to digital converter of claim 2 , wherein the reference comprises a positive reference voltage and negative reference voltage.

4. The analog to digital converter of claim 1 , wherein the comparator finishes comparing the reference to the output of the first sample circuit during the non-overlapping time between the end of the first phase and the beginning of the second phase.

5. The analog to digital converter of claim 4 , wherein the comparator finishes comparing the reference to the output of the second sample circuit during the non-overlapping time between the end of the second phase and the beginning of the first phase.

6. The analog to digital converter of claim 5 , wherein the comparator provides an output comprising a pair of differential signals.

7. The analog to digital converter of claim 6 , further comprising an output circuit coupled to the output of the comparator that provides a data output signal.

8. The analog to digital converter of claim 7 , wherein the output circuit comprises:

a latch having an input coupled to the output of the comparator and an output; and

a flip-flop having an input coupled to the output of the latch and an output for providing the data output signal.

9. The analog to digital converter of claim 8 , further comprising a reset circuit having an input coupled to the output of the comparator and an output coupled to the comparator.

10. The analog to digital converter of claim 9 , wherein the reset circuit resets the comparator after the latch has latched the output of the comparator.

11. A method of operating a circuit to perform an analog to digital conversion, comprising:

sampling an analog signal during a first phase of a clock;

after ending the first phase of the clock and before beginning a next instance of a second phase of the clock, providing, from a comparator, a digital output representative of the analog signal sampled during the first phase of the clock;

sampling the analog signal during the next instance of the second phase of the clock, wherein the second phase of the clock begins after providing the digital output representative of the analog signal sampled during the first phase of the clock; and

after ending the second phase of the clock, providing, from the comparator, a digital output representative of the analog signal sampled during the second phase of the clock.

12. The method of claim 11 further comprising latching the output of the comparator.

13. A method of operating a circuit to perform an analog to digital conversion, comprising:

sampling an analog signal during a first phase of a clock;

after ending the first phase of the clock, providing, from a comparator, a digital output representative of the analog signal sampled during the first phase of the clock;

resetting the comparator after providing the digital output representative of the analog signal sampled during the first phase of the clock;

sampling the analog signal during a second phase of the clock, wherein the second phase of the clock begins after providing the digital output representative of the analog signal sampled during the first phase of the clock; and

after ending the second phase of the clock, providing, from the comparator, a digital output representative of the analog signal sampled during the second phase of the clock.

14. The method of claim 13 , further comprising resetting the comparator after providing the digital output representative of the analog signal sampled during the second phase of the clock.

15. A method of operating a circuit to perform an analog to digital conversion, comprising:

generating pulses representative of times between the first and second phases of a clock;

providing the pulses to a comparator;

sampling an analog signal during the first phase of the clock;

after ending the first phase of the clock, providing, from the comparator, a digital output representative of the analog signal sampled during the first phase of the clock;

sampling the analog signal during the second phase of the clock, wherein the second phase of the clock begins after providing the digital output representative of the analog signal sampled during the first phase of the clock; and

after ending the second phase of the clock, providing, from the comparator, a digital output representative of the analog signal sampled during the second phase of the clock.

16. The method of claim 15 , wherein rising edges of the pulses time latching of the comparator and falling edges time the resetting of the comparator.

17. The method of claim 15 wherein the step of providing the digital output representative of the analog signal sampled during the first phase of the clock further comprises comparing the analog signal to a positive reference and a minus reference.

18. A method of operating a circuit to perform an analog to digital conversion, comprising:

providing a first analog signal to a comparator sampled during a first phase of a clock;

providing a digital output from the comparator representative of the first analog signal prior to a second phase of the clock;

resetting the comparator after providing the digital output from the comparator representative of the first analog signal;

providing a second analog signal to the comparator sampled during the second phase of the clock;

providing a digital output from the comparator representative of the second analog signal after the resetting the comparator.

19. The method of claim 18 , wherein the digital output from the comparator representative of the second analog signal is provided at a time between second and first phases of the clock.

20. The method of claim 19 , further comprising resetting the comparator after providing the digital output from the comparator representative of the second analog signal.

Assignments (16)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
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To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
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