Integrated circuits with edge-adjacent devices having reactance values
View Patent ↗An integrated circuit has a plurality of terminals for making electrical connection to the integrated circuit. At least one device is formed adjacent an outer edge of the integrated circuit. The device includes at least one metal conductor for forming an edge seal for protecting the integrated circuit during die singulation. The device is coupled to one or more functional circuits within the integrated circuit by routing the at least one metal conductor to the one or more functional circuits, the at least one device providing a reactance value to the one or more functional circuits for non-test operational use. The device may be formed as one or more capacitors or as one or more inductors. Various structures may be used for the capacitor and the inductor.
1. An integrated circuit comprising:
at least one device adjacent an outer edge of the integrated circuit, wherein the at least one device comprises a plurality of capacitors that includes:
a continuous outer metal conductor around the outer edge of the integrated circuit for forming an edge seal for protecting the integrated circuit during die singulation and for functioning as a common first electrode, and
a plurality of second electrodes, the plurality of second electrodes comprising an electrically discontinuous inner metal conductor located between the plurality of pads and the first electrode; and
a functional circuit within the integrated circuit having a first terminal connected to a first portion of the at least one device and having a second terminal connected to a second portion of the at least one device, the at least one device providing a reactance value to the functional circuit for non-test operational use by the functional circuit.
2. The integrated circuit of claim 1 wherein the plurality of capacitors each couple capacitance to the functional circuit during non-testing operation of the integrated circuit.
3. An integrated circuit comprising:
a functional circuit having a first terminal and a second terminal; and
a capacitor adjacent an outer edge of the integrated circuit, the capacitor providing a reactance value to the functional circuit for non-test operational use by the functional circuit, and the capacitor including:
a first metal electrode encircling the outer edge of the integrated circuit and having at least one opening, the first metal electrode connected to the functional circuit at the first terminal, the first metal electrode having an opening therein within a portion that encircles the outer edge of the integrated circuit, the first metal electrode forming a first electrode of the capacitor that is connected to the functional circuit, and
a second metal electrode encircling the outer edge of the integrated circuit between the outer edge and the first metal electrode, the second metal electrode forming an edge seal for protecting the integrated circuit during die singulation, and extending through the opening of the first metal electrode and connecting to the functional circuit to function as a second electrode of the capacitor.
4. The integrated circuit of claim 3 wherein the opening within the first metal electrode is formed only through an underlying portion of the first metal electrode.
5. An integrated circuit comprising:
a plurality of terminals for making electrical connection to the integrated circuit;
at least one device adjacent an outer edge of the integrated circuit, the at least one device comprising at least one metal conductor and a plurality of capacitors, wherein the at least one metal conductor is for forming an edge seal for protecting the integrated circuit during die singulation, and the plurality of capacitors comprises a common first electrode and a plurality of second electrodes, the common first electrode comprising a continuous outer metal conductor around the outer edge of the integrated circuit, and the plurality of second electrodes comprising an electrically discontinuous inner metal conductor located between the plurality of terminals and the first electrode; and
one or more functional circuits within the integrated circuit, wherein the one or more functional circuits are coupled to the at least one device with the at least one metal conductor, and wherein the at least one device provides a reactance value to the one or more functional circuits for non-test operational use.
6. The integrated circuit of claim 5 wherein the at least one device further comprises:
an inductor that couples inductance to the one or more functional circuits during a non-testing operation of the integrated circuit.
7. The integrated circuit of claim 6 wherein the inductor comprises:
a continuous metal conductor having a first end electrically connected to a first terminal of a predetermined one of the one or more functional circuits and a second end electrically connected to a second terminal of the predetermined one of the one or more functional circuits, the inductor looping at least once around the integrated circuit between the outer edge and the plurality of terminals.
8. The integrated circuit of claim 5 , wherein each of the plurality of capacitors couples a capacitance to any of the one or more functional circuits during non-testing operation of the integrated circuit.
9. The integrated circuit of claim 5 wherein the at least one device is formed between an outer edge of the integrated circuit and the plurality of terminals.
10. The integrated circuit of claim 5 , wherein the common first electrode is coupled to a first power supply pad, and one of the plurality of second electrodes is coupled to a second power supply pad.
11. An integrated circuit comprising:
a plurality of terminals for making electrical connection to the integrated circuit;
at least one device adjacent a periphery of the integrated circuit, wherein the at least one device comprises a first metal conductor and a plurality of capacitors, wherein the first metal conductor extends entirely around the integrated circuit to form an edge seal for protecting the integrated circuit during die singulation, and the plurality of capacitors comprises a common first electrode and a plurality of second electrodes, wherein the common first electrode comprises a continuous outer metal conductor around the periphery of the integrated circuit, and the plurality of second electrodes comprises an electrically discontinuous metal conductor located between the plurality of terminals and the first electrode; and
a functional circuit within the integrated circuit coupled to the at least one device by routing between the first metal conductor and the functional circuit, the functional circuit implementing non-test functions within the integrated circuit by using the at least one device.
12. The integrated circuit of claim 11 wherein the at least one device is formed between an outer edge of the integrated circuit and the plurality of terminals.
13. The integrated circuit of claim 11 wherein the at least one device further comprises:
an inductor.
14. The integrated circuit of claim 13 wherein the inductor comprises:
a continuous metal conductor having a first end electrically connected to a first terminal of the functional circuit and a second end electrically connected to a second terminal of the functional circuit, the inductor looping around the periphery of the integrated circuit at least once.
15. The integrated circuit of claim 13 wherein the inductor couples inductance to the one or more functional circuits during a non-testing operation of the integrated circuit.
16. The integrated circuit of claim 11 , wherein the common first electrode is coupled to a first power supply pad, and one of the plurality of second electrodes is coupled to a second power supply pad.