IP Library Granted Patent US 8,467,237
Granted Patent B2
US 8,467,237 · App. 12/905,754 · Granted Jun 18, 2013

Read distribution management for phase change memory

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Quick Facts
Patent No.
US 8,467,237
App. No.
12/905,754
Granted
Jun 18, 2013
Kind
B2
Abstract

Subject matter disclosed herein relates to a memory device, and more particularly to write performance of a phase change memory.

Claims (54)

1. A method comprising:

applying a bias pulse to a phase change memory (PCM) cell to produce a memory cell current;

adjusting said memory cell current by a current delta to produce an adjusted memory cell current said current delta being based on a change in a reference cell current over time and reflecting a state distribution drift of said PCM cell; and

determining a state of said PCM cell based, at least in part, on said adjusted memory cell current.

2. The method of claim 1 , wherein said reference cell current delta comprises a current to compensate for a physical change of said PCM cell during a time span prior to initiating a read operation for determining said state of said PCM cell.

3. The method of claim 1 , wherein said applying said bias pulse to said PCM cell and said determining said state of said PCM cell are performed in response to an error correction code (ECC) overflow event.

4. The method of claim 1 , further comprising:

comparing a reference cell current of a reference cell at a particular time with a reference cell current of said reference cell at an earlier time; and

storing results of said comparing.

5. The method of claim 1 , further comprising:

sequentially stepping through multiple values of said memory cell current; and

determining whether to modify said memory cell current for individual steps of said multiple values of said memory cell current.

6. The method of claim 3 , further comprising:

populating a look-up table based, at least in part, on said determination.

7. The method of claim 1 , wherein said PCM cell comprises a multi-level memory cell.

8. The method of claim 1 , further comprising:

programming at least one reference cell and said PCM cell at the same time.

9. An apparatus comprising:

a controller to:

apply a bias pulse to a memory cell of a phase change memory (PCM) array to produce a memory cell current;

adjust said memory cell current by a current delta to produce an adjusted memory cell current, said current delta being based on a change in a reference cell current over time and reflecting a state distribution drift of said PCM cell; and

determine a state of said PCM cell based, at least in part, on said adjusted memory cell current.

10. The apparatus of claim 9 , wherein said reference cell current delta comprises a current to compensate for a physical change of said PCM cell during a time span prior to initiating a read operation for determining said state of said PCM cell.

11. The apparatus of claim 9 , said controller to:

compare a reference cell current of a reference cell among said reference portion of said PCM array at a particular time with a reference cell current of said reference cell at an earlier time;

store results of said comparing; and

modify said cell current based, at least in part, on said stored results.

12. The apparatus of claim 9 , said controller to:

sequentially step through multiple values of said memory cell current; and

determine whether to modify said memory cell current for individual steps of said multiple values of said memory cell current.

13. The apparatus of claim 12 , said controller to:

populate a look-up table based, at least in part, on said determination.

14. The apparatus of claim 9 , wherein said PCM array comprises a multi-level memory.

15. The apparatus of claim 9 , said controller to:

program said reference portion of said PCM array and said cell of said PCM array at the same time.

16. The apparatus of claim 15 , said controller to:

program said reference portion of said PCM array and a page buffer at the same time.

17. A system comprising:

a memory device comprising a phase change memory (PCM) array including a reference portion to store one or more particular reference states, said memory device further comprising a memory controller to:

apply a bias pulse to a cell of said PCM array to produce a memory cell current for a read operation;

adjust said memory cell current by a current delta to produce an adjusted memory cell current said current delta being based on a change in a reference cell current over time and reflecting a state distribution drift of said PCM cell; and

determine a state of said PCM cell based, at least in part, on said adjusted memory cell current; and

a processor to host one or more applications and to initiate said read operation to said memory controller to provide access to said PCM array.

18. The system of claim 17 , wherein said reference cell current delta comprises a current to compensate for a physical change of said PCM cell during a time span prior to initiating said read operation for determining said state of said PCM cell.

19. The system of claim 17 , said controller to:

compare a reference cell current of a reference cell among said reference portion of said PCM array at a particular time with a reference cell current of said reference cell at an earlier time;

store results of said comparing; and

modify said cell current based, at least in part, on said stored results.

20. The system of claim 17 , said controller to:

sequentially step through multiple values of said memory cell current; and

determine whether to modify said memory cell current for individual steps of said multiple values of said memory cell current.

21. The system of claim 19 , said controller to:

populate a look-up table based, at least in part, on said determination.

22. The system of claim 17 , wherein said PCM array comprises a multi-level memory.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027126/0176 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 15, 2010
From: BEDESCHI, FEDINANDO; GASTALDI, ROBERTO
To: NUMONYX B.V.
Reel/Frame 025147/0148 →