Fabricating bipolar junction select transistors for semiconductor memories
View Patent ↗A bipolar junction transistor may act as a select device for a semiconductor memory. The bipolar junction transistor may be formed of a stack of base and collector layers. Sets of parallel trenches are formed in a first direction down to the base and in a second direction down to the collector. The trenches may be used to form local enhancement implants into the exposed portion of the base and collector in each trench. As a result of the local enhancement implants, in some embodiments, leakage current may be reduced, active current capability may be higher, gain may be higher, base resistance may be reduced, breakdown voltage may be increased, and parasitic effects with adjacent junctions may be reduced.
1. A method comprising:
forming stacked base and collector layers;
forming first trenches in a first direction to provide local enhancement implants for one of the base and collector layers; and
forming second trenches in a second direction, different than said first direction, to form local enhancement implants into the other of said base and collector layers.
2. The method of claim 1 including forming said first trenches to the lowermost of said stacked base and collector layers and forming the trenches in the second direction to the uppermost of said stacked base and collector layers.
3. The method of claim 1 including forming said first trenches into the collector.
4. The method of claim 3 including forming said second trenches into the base.
5. The method of claim 1 including filling said trenches in said first direction before forming said trenches in said second direction.
6. The method of claim 1 including forming said base of a first conductivity type and performing local enhancement implants for said base of said first conductivity type.
7. The method of claim 6 including forming said collector of a second conductivity type and performing said local enhancement implant for said collector of said second conductivity type.
8. The method of claim 1 including forming said first and second trenches to different depths.
9. The method of claim 1 including forming emitters and base contacts in regions between said trenches.
10. The method of claim 1 including forming said first trenches by forming a stack of base and collector layers covered by an insulator over said stack.