Apparatus and method for producing purified hydrogen gas by a pressure swing adsorption processes
The invention relates to a method and an apparatus for producing purified hydrogen gas by a pressure swing adsorption process. Further the invention relates to detecting an operating life of adsorbents in a adsorption tower. The method and the apparatus have a gas supply unit for adding an inert gas to an unpurified hydrogen gas and a detector for measuring an inert gas in a purified hydrogen gas discharged from the adsorption tower.
1. A method for producing purified hydrogen gas by a pressure swing adsorption processes, comprising:
adding an inert gas to an unpurified hydrogen gas;
feeding the unpurified hydrogen gas into an adsorption tower and purifying by pressure swing adsorption; and
detecting the inert gas in the purified hydrogen gas discharged from the adsorption tower.
2. The method according to claim 1 , wherein the inert gas is Ar gas.
3. The method according to claim 2 , wherein Ar gas is detected in the range of about 0.15 to 0.35 wt %.
4. The method according to claim 2 , wherein Ar gas is detected under an adsorption tower pressure range of about 0.59 to 0.76 MPaG.
5. A method for producing polycrystalline silicon, which purifies hydrogen gas discharged from a reaction of depositing polycrystalline silicon and feeds the hydrogen gas back to the reaction, comprising:
depositing polycrystalline silicon on silicon seed rods by reacting trichlorosilane with hydrogen gas in a reactor;
separating an unpurified hydrogen gas by condensing a discharged gas from the reactor;
adding an inert gas to the unpurified hydrogen gas;
feeding the unpurified hydrogen gas into an adsorption tower and purifying by pressure swing adsorption; and
detecting the inert gas in the purified hydrogen gas discharged from the adsorption tower.
6. The method of claim 5 , further comprising returning some of the discharged purified hydrogen gas back to the adsorption tower for regenerating the adsorption tower.
7. The method according to claim 5 , wherein the inert gas is Ar gas.
8. The method according to claim 7 , wherein Ar gas is detected in the range of about 0.15 to 0.35 wt %.
9. The method according to claim 7 , wherein Ar gas is detected under an adsorption tower pressure range of about 0.59 to 0.76 MPaG.